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Determination of leakage inductances of three-winding transformer for HF-PSA resonant circuitŠklovski, Jevgeni; Janson, Kuno; Niilo, Helar11th International Symposium "Topical Problems in the Field of Electrical and Power Engineering." Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 16-21, 20122012 / p. 113-116 : ill

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27

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A dual-buck-boost DC–DC/AC universal converterOng, Yao Rong; Cao, Shuyu; Lee, Sze Sing; Lim, Chee Shen; Chen, Max M.; Vosoughi Kurdkandi, Naser; Barzegarkhoo, Reza; Siwakoti, Yam P.Electronics (Switzerland)2022 / art. 1973 https://doi.org/10.3390/electronics11131973 Journal metrics at scopus Article at Scopus Journal metrics at WOS Article at WOS

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28

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Electrical and control engineeringKalm, Evald1990 https://www.ester.ee/record=b1233571*est

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29

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Electrical engineering and automaticsKull, Arvo; Kiitam, Andres; Bachverk, Aleksander; Kängsep, Eiko; Jõers, Rein; Peterson, Jaak; Toomet, Madis1989 https://www.ester.ee/record=b1212924*est

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30

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Elektrist, energiast ja füüsikast üldiseltKalda, JaanElektriala2019 / lk. 26-27 : ill http://www.ester.ee/record=b1240496*est

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31

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Evaluation of dual-active bridge converter for DC energy buildingsCarvalho da Silva, Edivan Laercio; Blinov, Andrei; Sidorova, Aleksandra; Chub, Andrii; Vinnikov, Dmitri2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)2023 / 6 p https://doi.org/10.1109/CPE-POWERENG58103.2023.10227460

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32

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Evaluation of equivalent cirquit diagrams and transfer functions for modeling of lithium-ion batteriesRahmoun, Ahmad; Biechl, Helmuth; Rosin, ArgoScientific Journal of Riga Technical University. Electrical, control and communication engineering2013 / p. 34-39 : ill

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33

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Exact static compaction of independent test sequencesRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesBEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 315-318 : ill

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34

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Fast static compaction of tests composed of independent sequences : basic properties and comparison of methodsRaik, Jaan; Jutman, Artur; Ubar, Raimund-JohannesThe 9th IEEE International Conference on Electronics, Circuits and Systems : ICECS 2002 : September 15-18, 2002, Dubrovnik, Croatia. Volume II2002 / p. 445-448 : ill http://dx.doi.org/10.1109/ICECS.2002.1046190 https://ieeexplore.ieee.org/document/1046190

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35

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Fast test pattern generation for sequential circuits using decision diagram representationsRaik, Jaan; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications (JETTA)2000 / 3, p. 213-226 : ill https://link.springer.com/article/10.1023/A:1008335130158

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Fault oriented test pattern generation for sequential circuits using genetic algorithmsIvask, Eero; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 319-320

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37

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Fourier' rida : metoodiline juhend raadiotehiliste ahelate ja signaalide laboratoorse töö sooritamiseks1984 https://www.ester.ee/record=b1245512*est

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38

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Fractional order model identification of receptor-ligand complexes formation by equivalent electrical circuit modelingAtes, Abdullah; Alagoz, Baris Baykant; Tepljakov, Aleksei; Petlenkov, Eduard2019 International Artificial Intelligence and Data Processing Symposium (IDAP)2019 / 5 p. : ill https://doi.org/10.1109/IDAP.2019.8875913

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Greedy alternative for the static compaction of sequential circuit test sequencesRaik, JaanThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 133-136 : ill

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Heartwork analysis using bioimpedance methodGordon, RaunoTelekommunikatsioon 2002 : IX rahvusvahelise telekommunikatsioonipäeva materjalid2002 / lk. 8-14 : ill

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41

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Hierarchical defect-oriented fault simulation for digital circuitsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE European Test Workshop2000 / p. 151-156 https://ieeexplore.ieee.org/document/873781

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42

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Hierarchical physical defect reasoning in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Brik, MarinaEstonian journal of engineering2011 / 3, p. 185-200

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43

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Hierarchical test generation for combinational circuits with real defects coverageCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesMicroelectronics reliability2002 / p. 1141-1149 : ill https://www.sciencedirect.com/science/article/pii/S002627140200080X

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44

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Hierarchical timing-critical paths analysis in sequential circuitsJürimägi, Lembit; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan; Devadze, Sergei; Kostin, Sergei2018 IEEE 28th International Symposium on Power and Timing Modeling, Optimization and Simulation (PATMOS 2018) : 2 – 4 July 2018, Spain2018 / 6 p. : ill https://doi.org/10.1109/PATMOS.2018.8464176

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45

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High voltage circuit breaker charging motor’s condition monitoring - importance, possibilities, and challengesAsad, Bilal; Sardar, Muhammad Usman; Vaimann, Toomas; Kallaste, Ants; Asefi, Sajjad; Kilter, Jako2024 International Conference on Diagnostics in Electrical Engineering (Diagnostika)2024 / 7 p https://doi.org/10.1109/Diagnostika61830.2024.10693906

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46

book article

Homological modelling of the electric circuitsPaal, Eugen; Umbleja, MärtModuli Operads Dynamics II2014

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47

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How to prove that a circuit is fault-free?Ubar, Raimund-Johannes; Kostin, Sergei; Raik, JaanProceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey2012 / p. 427-430 : ill https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free

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Identifying NBTI-critical paths in nanoscale logicUbar, Raimund-Johannes; Vargas, Fabian; Jenihhin, Maksim; Raik, Jaan; Kostin, Sergei; Bolzani Poehls, Leticia16th Euromicro Conference series on Digital System Design : DSD 2013 : proceedings : 4-6 September 2013, Santander, Spain2013 / p. 136-141 : ill

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Impedance network impact on the controller design of the QZSI for PV applicationsLiu, Wenjie; Yang, Yongheng; Kerekes, Tamas; Liivik, Elizaveta; Blaabjerg, Frede2020 IEEE 21st Workshop on Control and Modeling for Power Electronics (COMPEL), Aalborg, Denmark, November 9-12, 20202020 / 6 p https://doi.org/10.1109/COMPEL49091.2020.9265708

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Improved fractional open circuit voltage MPPT methods for PV systemsBaimel, Dmitry; Tapuchi, Saad; Levron, Yoash; Belikov, JuriElectronics2019 / art. 321 https://doi.org/10.3390/electronics8030321 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

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