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1701
book article
Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG
Palermo, N.
;
Tihhomirov, Valentin
;
Copetti, Thiago
;
Jenihhin, Maksim
;
Raik, Jaan
;
Kostin, Sergei
2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015
2015
/
[6] p. : ill
http://dx.doi.org/10.1109/LATW.2015.7102405
book article
1702
book article
Relation learning with bar charts
Lints, Taivo
IA'09 : IEEE Symposium on Intelligent Agents : Nashville, Tennessee, US, March 30-April 2, 2009
2009
/
p. 77-83
https://ieeexplore.ieee.org/document/4927503
book article
1703
book article EST
/
book article ENG
Relations between modules associated to input-output nonlinear equations with delays and their realizations
Bartosiewicz, Zbigniew
;
Kaldmäe, Arvo
;
Kotta, Ülle
;
Wyrwas, Malgorzata
62nd IEEE Conference on Decision and Control, CDC 2023, Singapore, 13-15 December 2023
2023
/
p. 644-650
https://doi.org/10.1109/CDC49753.2023.10383927
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
1704
book article
Reliability analysis and energy yield of string-inverter considering monofacial and bifacial photovoltaic panels
Bouguerra, Sara
;
Yaiche, Mohamed Redha
;
Sangwongwanich, Ariya
;
Blaabjerg, Frede
;
Liivik, Elizaveta
2020 IEEE 11th International Symposium on Power Electronics for Distributed Generation Systems (PEDG), 28 Sept.-1 Oct. 2020, Dubrovnik, Croatia
2020
/
p. 199-204
https://doi.org/10.1109/PEDG48541.2020.9244425
book article
1705
book article
Reliability analysis of micro-inverters considering PV module variations and degradation rates
Liivik, Elizaveta
;
Sangwongwanich, Ariya
;
Blaabjerg, Frede
2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) : Riga, Latvia, 17-21 September 2018
2018
/
p. 1475-1482 : ill
https://ieeexplore.ieee.org/document/8515325
book article
1706
book article
Reliability assessment of photovoltaic Buck-Boost microconverter for Estonian climate conditions
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Vinnikov, Dmitri
2023 IEEE 17th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG)
2023
/
6 p
https://doi.org/10.1109/CPE-POWERENG58103.2023.10227505
book article
1707
book article EST
/
book article ENG
Reliability evaluation of an impedance-source PV microconverter
Shen, Yanfeng
;
Liivik, Elizaveta
;
Blaabjerg, Frede
;
Vinnikov, Dmitri
;
Wang, Huai
;
Chub, Andrii
2018 IEEE Applied Power Electronics Conference and Exposition (APEC 2018), San Antonio, Texas, USA, 4-8 March 2018
2018
/
p. 1104–1108 : ill
https://doi.org/10.1109/APEC.2018.8341154
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
1708
journal article EST
/
journal article ENG
Reliability evaluation of isolated buck-boost DC-DC series resonant converter
Bakeer, Abualkasim Ahmed Ali
;
Chub, Andrii
;
Shen, Yanfeng
IEEE open journal of power electronics
2022
/
p. 131-141
https://doi.org/10.1109/OJPEL.2022.3157200
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Fault-tolerant galvanically isolated DC‑DC converters with zero redundancy = Null-liiasusega veatolerantsed galvaanilise isolatsiooniga alalispingemuundurid
1709
book article
Reliability improvements for multiprocessor systems by health-aware task scheduling
Schmidt, Robert
;
Massoud, Rehab
;
Raik, Jaan
;
Garcia-Ortiz, Alberto
;
Drechsler, Rolf
2018 IEEE 24th International Symposium on On-Line Testing and Robust System Design (IOLTS 2018) : 2 - 4 July 2018, Spain
2018
/
p. 247-250 : ill
http://dx.doi.org/10.1109/IOLTS.2018.8474101
book article
1710
book article
Reliability of DC-link capacitors in two-stage micro-inverters under different PV module sizes
Sangwongwanich, Ariya
;
Shen, Yanfeng
;
Chub, Andrii
;
Liivik, Elizaveta
;
Vinnikov, Dmitri
;
Wang, Huai
;
Blaabjerg, Frede
ICPE 2019 - ECCE Asia : 10th International Conference on Power Electronics - ECCE Asia : "Green World with Power Electronics" : May 27-30, 2019 BEXCO, Busan, Korea
2019
/
p. 1867-1872 : ill
https://ieeexplore.ieee.org/xpl/conhome/8786807/proceeding
book article
1711
book article EST
/
book article ENG
Reliability of electroencephalogram-based individual markers - case study
Uudeberg, Tuuli
;
Päeske, Laura
;
Hinrikus, Hiie
;
Lass, Jaanus
;
Bachmann, Maie
2020 42nd Annual International Conference of the IEEE Engineering in Medicine & Biology Society (EMBC)
2020
/
p. 276 - 279
https://doi.org/10.1109/EMBC44109.2020.9175274
Conference Proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
1712
book article EST
/
book article ENG
Reliability study of input side capacitors in impedance-source PV microconverters
Liivik, Elizaveta
;
Vinnikov, Dmitri
;
Chub, Andrii
;
Shen, Yanfeng
IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society : proceedings
2019
/
p. 5026–5032 : ill
https://doi.org/10.1109/IECON.2019.8927173
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
1713
journal article
Reliability-critical computation offloading in UAV swarms
Rahbari, Dadmehr
;
Ahmed, Foisal
;
Jenihhin, Maksim
;
Alam, Muhammad Mahtab
;
Le Moullec, Yannick
IEEE Systems Journal
2024
/
12 p
https://doi.org/10.1109/JSYST.2024.3432449
journal article
1714
book article
Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687
Jutman, Artur
;
Shibin, Konstantin
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 240-249 : ill
https://doi.org/10.1109/AUTEST.2016.7589605
book article
1715
book article
Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
Azad, Siavoosh Payandeh
;
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings
2018
/
p. 21-26 : ill
https://doi.org/10.1109/DDECS.2018.00011
book article
1716
book article
Representing gate-level SET faults by multiple SEU faults on RT-level
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Sauer, Christian
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
2020
/
art. 19889351, 6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159715
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
1717
book article
Requirements to data acquisition and signal analysis for electrical grid condition monitoring
Anijärv, Toomas Erik
;
Shabbir, Noman
;
Kütt, Lauri
;
Iqbal, Muhammad Naveed
2020 IEEE 61st International Scientific Conference on Power and Electrical Engineering of Riga Technical University (RTUCON), Riga, Latvia, Nov. 5-7, 2020 : conference proceedings
2020
https://doi.org/10.1109/RTUCON51174.2020.9316487
book article
1718
book article
RESCUE : cross-sectoral PhD training concept for interdependent reliability, security and quality
Vierhaus, Heinrich Theodor
;
Jenihhin, Maksim
;
Sonza Reorda, Matteo
2018 12th European Workshop on Microelectronics Education (EWME) : September 24–26, 2018
2018
/
p. 45-50 : ill
https://doi.org/10.1109/EWME.2018.8629465
book article
1719
book article
Research and training environment for digital design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
34th ASEE/IEEE Frontiers in Education Conference : October 20-23, 2004, Savannah, GA
2004
/
p. S3F-18-S3F-23 : ill
http://dx.doi.org/10.1109/FIE.2004.1408779
book article
1720
book article
Research of voltage stability in 10 kV distribution networks during integrating the 2 MW solar power plant
Keshuov, S.A.
;
Shokolakova, S.
;
Tokhtibakiev, K.K.
;
Šuvalova, Jelena
2nd International Conference on Smart Grid and Smart Cities : (ICSGSC 2018), August 12-14, 2018, Kuala Lumpur, Malaysia
2018
/
p. 91-94 : ill
https://doi.org/10.1109/ICSGSC.2018.8541303
book article
1721
book article
Reseeding using compaction of pre-generated LFSR sub-sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta
2008
/
p. 1290-1295 : ill
http://dx.doi.org/10.1109/ICECS.2008.4675096
book article
1722
book article
Residental load harmonics in distribution grid
Niitsoo, Jaan
;
Palu, Ivo
;
Kilter, Jako
;
Taklaja, Paul
;
Vaimann, Toomas
The 3rd International Conference on Electric Power and Energy Conversion Systems (EPECS 2013) : [proceedings]
2013
/
p. 1-6 : ill
book article
1723
book article
Residential DC load forecasting using long short-term memory network (LSTM)
Shabbir, Noman
;
Ahmadiahangar, Roya
;
Rosin, Argo
;
Husev, Oleksandr
;
Jalakas, Tanel
;
Martins, Joao
2023 IEEE 11th International Conference on Smart Energy Grid Engineering (SEGE)
2023
/
p. 131-136
https://doi.org/10.1109/SEGE59172.2023.10274596
book article
1724
book article
Residential load forecasting for flexibility prediction using machine learning-based regression model
Ahmadiahangar, Roya
;
Häring, Tobias
;
Rosin, Argo
;
Korõtko, Tarmo
;
Martins, Joao
2019 IEEE International Conference on Environment and Electrical Engineering and 2019 IEEE Industrial and Commercial Power Systems Europe (EEEIC / I&CPS Europe)
2019
/
4 p. : ill
https://doi.org/10.1109/EEEIC.2019.8783634
book article
1725
book article
Residential load forecasting using recurrent neural networks
Shabbir, Noman
;
Ahmadiahangar, Roya
;
Raja, Hadi Ashraf
;
Kütt, Lauri
;
Rosin, Argo
2020 IEEE 14th International Conference on Compatibility, Power Electronics and Power Engineering (CPE-POWERENG) : proceedings
2020
/
p. 478-481 : ill
https://doi.org/10.1109/CPE-POWERENG48600.2020.9161565
book article
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