Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
testimine (subject term)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publication
..
year
year of publication
Loading..
author
Loading..
TTÜ department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
582
Look more..
(2/2)
Export
export all inquiry results
(582)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
376
book article
Requirements-driven model-based testing of the IP Multimedia Subsystem
Ernits, Juhan-Peep
;
Kääramees, Marko
;
Raiend, Kullo
;
Kull, Andres
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 203-206
book article
377
book article
RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systems
Jenihhin, Maksim
;
Raik, Jaan
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings
2020
/
art. 19690741 , 6 p
https://doi.org/10.23919/DATE48585.2020.9116558
book article
378
book article
Research and training environment for digital design and test
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
34th ASEE/IEEE Frontiers in Education Conference : October 20-23, 2004, Savannah, GA
2004
/
p. S3F-18-S3F-23 : ill
http://dx.doi.org/10.1109/FIE.2004.1408779
book article
379
journal article
Research in digital design and test at Tallinn University of Technology
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Jutman, Artur
;
Raik, Jaan
;
Ellervee, Peeter
;
Kruus, Margus
Radioelectronics & informatics
2008
/
p. 4-12 : ill
http://www.ewdtest.com/ri/%E2%84%96-1-40-january-march-2008/
journal article
380
book article
Reseeding using compaction of pre-generated LFSR sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : 31st August to 3rd September 2008, Malta : conference guide
2008
/
p. 215
book article
381
book article
Reseeding using compaction of pre-generated LFSR sub-sequences
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
;
Ubar, Raimund-Johannes
ICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta
2008
/
p. 1290-1295 : ill
http://dx.doi.org/10.1109/ICECS.2008.4675096
book article
382
newspaper article
Robot reducing mining industry's environmental impact tested in Estonia
news.err.ee
2023
Robot reducing mining industry's environmental impact tested in Estonia
newspaper article
383
journal article
Role of experimental damage mechanics for the circular economy implementation in cotton industries
Hussein, Abrar
;
Abbas, Muhammad Mujtaba
Journal of Modern Nanotechnology
2021
/
9 p
https://doi.org/10.53964/jmn.2021004
journal article
384
book article
RT-level identification of potentially testable initialization faults
Raik, Jaan
;
Fujiwara, Hideo
;
Krivenko, Anna
The Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan
2008
/
[6] p
https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults
book article
385
book article
RT-level test point insertion for sequential circuits
Raik, Jaan
;
Govind, Vineeth
;
Ubar, Raimund-Johannes
IWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings
2004
/
p. 34-40 : ill
https://ieeexplore.ieee.org/document/1428412
book article
386
book article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings
2016
/
p. 385-392 : ill
https://doi.org/10.1109/AUTEST.2016.7589627
book article
387
journal article
Run-time reconfigurable instruments for advanced board-level testing
Aleksejev, Igor
;
Jutman, Artur
;
Devadze, Sergei
IEEE instrumentation & measurement magazine
2017
/
p. 23-30 : ill
https://doi.org/10.1109/MIM.2017.8006390
journal article
388
journal article EST
/
journal article ENG
Safeguarding female reproductive health against endocrine disrupting chemicals-The FREIA project
Duursen, Majorie B.M. van
;
Boberg, Julie
;
Christiansen, Sofie
;
Jääger, Kersti
;
Salumets, Andres
;
Velthut-Meikas, Agne
International journal of molecular sciences
2020
/
art. 3215
https://doi.org/10.3390/ijms21093215
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
389
dissertation
Scenario oriented model-based testing = Stsenaariumjuhitud mudelipõhine testimine
Halling, Evelin
2019
https://digi.lib.ttu.ee/i/?11943
dissertation
390
book article
Scenario-based Validation for Autonomous Vehicles with Different Fidelity Levels
Malayjerdi, Mohsen
;
Kaljavesi, Gemb
;
Diermeyer, Frank
;
Sell, Raivo
2023 IEEE Conference on Intelligent Transportation Systems (ITSC 2023)
2023
/
6 p
https://doi.org/10.1109/ITSC57777.2023.10422403
book article
391
dissertation
Scenario-based validation of safety and performance of an autonomous vehicle by a software in loop simulation method = Autonoomse sõiduki ohutuse ja jõudluse stsenaariumipõhine valideerimine tsüklisimulatsiooni meetodi abil
Malayjerdi, Mohsen
2023
https://doi.org/10.23658/taltech.43/2023
https://digikogu.taltech.ee/et/Item/5d3435ba-8ce1-4da6-8d16-4b279e88c861
https://www.ester.ee/record=b5574240*est
dissertation
Seotud publikatsioonid
5
Development of a validation regime for an autonomous campus shuttle
Autonomous vehicle safety evaluation through a high-fidelity simulation approach
Combined safety and cybersecurity testing methodology for autonomous driving algorithms
A Two-layered approach for the validation of an operational autonomous shuttle
Virtual simulations environment development for autonomous vehicles interaction
392
journal article
Second IEEE East-West Design and Test Workshop
Hahanov, Vladimir
;
Ubar, Raimund-Johannes
IEEE journal of design & test of computers
2004
/
p. 594
journal article
393
dissertation
Selected issues of modeling, verification and testing of digital systems
Jutman, Artur
2004
https://www.ester.ee/record=b1989760*est
dissertation
394
dissertation
Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemid
Kostin, Sergei
2012
https://www.ester.ee/record=b2757857*est
dissertation
395
newspaper article
Self-driving bus to be tested in Mustamäe this summer [online resource]
news.err.ee
2021
"Self-driving bus to be tested in Mustamäe this summer "
newspaper article
396
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
397
book article
Sequential circuits BIST with status bit control
Raik, Jaan
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Proceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 2004
2004
/
p. 507-510 : ill
https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf
book article
398
book article
Sequential test set compaction in LFSR reseeding
Jutman, Artur
;
Aleksejev, Igor
;
Raik, Jaan
Design and test technology for dependable systems-on-chip
2011
/
p. 476-493 : ill
https://ieeexplore.ieee.org/document/4738292
book article
399
book article
Shift register based TPG for at-speed interconnect BIST
Jutman, Artur
MIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 2
2004
/
p. 751-754 : ill
https://ieeexplore.ieee.org/document/1314941?signout=success
book article
400
journal article EST
/
journal article ENG
Single-stage buck–boost inverters: a state-of-the-art survey
Azizi, Mohammadreza
;
Husev, Oleksandr
;
Vinnikov, Dmitri
Energies
2022
/
art. 1622
https://doi.org/10.3390/en15051622
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Number of records 582, displaying
376 - 400
previous
12
13
14
15
16
17
18
19
20
21
next
subject term
1
1.
testimine
keyword
1
1.
testimine
×
vaste
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TTÜ department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TTÜ department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT