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testimine (subject term)
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426
book
System assurances : modeling and management
2022
https://doi.org/10.1016/C2020-0-03092-6
book
427
dissertation
System modeling for processor-centric test automation = Süsteemide modelleerimine protsessorikesksete testprogrammide sünteesi automatiseerimiseks
Tšertov, Anton
2012
https://www.ester.ee/record=b2751131*est
dissertation
428
dissertation
A system of test patterns to check and validate the semantic hierarchies of wordnet-type dictionaries = Testmustrite süsteem wordnet-tüüpi sõnastike semantiliste hierarhiate kontrollimiseks ja valideerimiseks
Lohk, Ahti
2015
http://www.ester.ee/record=b4495412*est
dissertation
429
journal article EST
/
journal article ENG
A systematic approach on modeling refinement and regression testing of real-time distributed systems
Pal, Deepak
;
Vain, Jüri
IFAC-PapersOnLine
2019
/
p. 1091-1096
https://doi.org/10.1016/j.ifacol.2019.11.341
Conference proceedings at Scopus
Article at Scopus
Article at WOS
journal article EST
/
journal article ENG
430
book article
zamiaCAD : understand, develop and debug hardware designs
Jenihhin, Maksim
;
Tihhomirov, Valentin
;
Saif Abrar, Syed
;
Raik, Jaan
;
Bartsch, Günter
DUHDe : 1st Workshop on Design Automation for Understanding Hardware Designs : March 28, 2014 : Friday Workshop at DATE 2014, Dresden, Germany
2014
/
p. 1-6
book article
431
newspaper article
Tallinna kooli õpilased lõid Baltikumi esimese keskkonnasõbralike filtritega õhupuhasti
Õigus, Birgit
moodnekodu.delfi.ee
2023
Tallinna kooli õpilased lõid Baltikumi esimese keskkonnasõbralike filtritega õhupuhasti
newspaper article
432
newspaper article
Tallinnas avati NATO DIANA piirkondlik keskus
Eesti Elu : [Kanada ajaleht]
2024
/
lk. 2
newspaper article
433
newspaper article
TalTech käivitab 5G testvõrgud. Eesti firmad saavad arendada teenuseid välisturgudele
Kald, Indrek
ituudised.ee
2023
TalTech käivitab 5G testvõrgud. Eesti firmad saavad arendada teenuseid välisturgudele
newspaper article
434
newspaper article
TalTechis hakatakse testima 6G võrku. Margus Rohtla: „Oleks vaid minu õpingute ajal sellised võimalused olnud!“
Lindpere, Elle Isabel
forte.delfi.ee
2023
TalTechis hakatakse testima 6G võrku. Margus Rohtla: „Oleks vaid minu õpingute ajal sellised võimalused olnud!“
newspaper article
435
journal article
Tarkvara omaduste parandamine kasutatavuse testimise kaudu
Eessaar, Erki
A & A
1999
/
2, lk. 26-31
journal article
436
journal article
Tarkvara testimisest ja testijatest Eestis
Markvardt, Maili
A & A
2010
/
3, lk. 62-65
journal article
437
book article
Teaching advanced test issues in digital electronics
Ubar, Raimund-Johannes
;
Orasson, Elmet
;
Raik, Jaan
;
Wuttke, Heinz-Dietrich
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
2005
/
p. S2B-1 - S2B-6 : ill
http://dx.doi.org/10.1109/ITHET.2005.1560318
book article
438
book article
Teaching digital system test
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Kruus, Margus
The 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble
2017
/
[6] p
book article
439
book article
Teaching digital test with BIST analyzer
Jutman, Artur
;
Tšertov, Anton
;
Tšepurov, Anton
;
Aleksejev, Igor
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
19th EAEEIE Annual Conference : June 29-July 2, 2008, Tallinn, Estonia : formal proceedings
2008
/
p. 123-128 : ill
http://dx.doi.org/10.1109/EAEEIE.2008.4610171
book article
440
journal article
Tehnikaülikoolis on uus katseseade, mis võib välja panna Abramsi tanki kaalu
Ehitaja
2023
/
lk. 35 : fot
https://www.ester.ee/record=b1072123*est
https://artiklid.elnet.ee/record=b2904596*est
journal article
441
book article
Temporally extended high-level decision diagrams for PSL assertions simulation
Jenihhin, Maksim
;
Raik, Jaan
;
Tšepurov, Anton
;
Ubar, Raimund-Johannes
Proceedings : Thirteenth IEEE European Test Symposium : ETS 2008 : 25-29 May 2008, Verbania, Italy
2008
/
p. 61-68 : ill
https://ieeexplore.ieee.org/document/4556029
book article
442
book article
Tension stiffening model based on test data of RC beams
Idnurm, Siim
;
Bacinskas, Darius
;
Gribniak, Viktor
;
Sokolov, Aleksandr
;
Kaklauskas, Gintaris
The 10th International Conference "Modern Building Materials, Structures and Techniques" : May 19-21, 2010, Lithuania : selected papers
2010
/
p. 810-814 : ill
https://www.researchgate.net/publication/265635200_Tension-stiffening_model_based_on_test_data_of_RC_beams
book article
443
journal article
10th IEEE European Test Symposium
Ubar, Raimund-Johannes
;
Prinetto, Paolo
;
Raik, Jaan
IEEE journal of design & test of computers
2005
/
p. 480-481 : phot
http://dx.doi.org/10.1109/MDT.2005.106
journal article
444
book article
"Tervis ruudus", ehk, Tippkeskuse CEBE lugu
Ubar, Raimund-Johannes
Teadusmõte Eestis (X). Tehnikateadused. 3 : [artiklikogumik]
2019
/
lk. 200-215 : ill., fot
https://www.ester.ee/record=b5208765*est
book article
445
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
https://ieeexplore.ieee.org/abstract/document/887168
book article
446
book article
Test development and deployment tool-set for mixed-signal and digital devices
Mellik, Andres
;
Raik, Jaan
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 163-166 : ill
book article
447
book article
Test driven domain modelling
Piho, Gunnar
;
Tepandi, Jaak
;
Parman, Marko
;
Puusep, Viljam
;
Roost, Mart
MIPRO 2011 : 34th International Convention on Information and Communication Technology, Electronics and Microelectronics : May 23-27, 2011, Opatija, Croatia : proceedings
2011
/
p. 576-581
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=5967121
book article
448
book article
Test generation for digital systems
Ubar, Raimund-Johannes
Digest of papers - FTCS 13th Annual International Symposium on Fault-Tolerant Computing, June 28 - 30, 1983, Milano, Italy
1983
/
p. 374-377
book article
449
book article
Test generation for digital systems at functional level
Ubar, Raimund-Johannes
;
Kuchcinski, Ktzysztof
;
Peng, Z.
Research report LiTH-IDA-R-90-06, Linköping University, Sweden
1990
/
p. 1-21
book article
450
book article
Test generation for microprocessor control mechanisms
Lohuaru, Tõnu
;
Ubar, Raimund-Johannes
FTSD-10 : Deseta Mezdunarodnaja Konferencija "Nadezdnost i Diagnostika na ECM. Mikrokompjutri i Sistemi", Varna, Bulgaria, 1987 = 10th International Conference on Fault-Tolerant Systems and Diagnostics (1987)
1987
/
p. 305-311
book article
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