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testimine (subject term)
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401
journal article
Sisseehitatud isetestimine digitaalsüsteemides
Kruus, Helena
A & A
2011
/
lk. 32-37 : ill
https://artiklid.elnet.ee/record=b2472216*est
journal article
402
book article
Smooth coordination and management of impact of EstLink 2 transmission testing on electricity markets, power system operations and system technical performance
Rauhala, T.
;
Laasonen, M.
;
Kilter, Jako
CIGRE Session 2016 : 21-26 August 2016, Paris, France
2016
/
p. 1-11
book article
403
book article
SoC and board modeling for processor-centric board testing
Tšertov, Anton
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Devadze, Sergei
14th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2011 : 31 August - 2 September 2011, Oulu, Finland : proceedings
2011
/
p. 575-582 : ill
https://ieeexplore.ieee.org/document/6037463
book article
404
book article
Soft-sensor approach in characterization of VRLA batteries
Tenno, Ander
;
Tenno, Robert
;
Suntio, Teuvo
Proc. INTELEC 2001
2001
/
p. 554-562
https://ieeexplore.ieee.org/document/988617/similar#similar
book article
405
book article
Software environment for synthesis of testable FSM through decomposition
Devadze, Sergei
;
Sudnitsõn, Aleksander
2008 26th International Conference on Microelectronics (MIEL 2008) : proceedings
2008
/
p. 433-436
https://ieeexplore.ieee.org/document/4559314
book article
406
dissertation
Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjal
Jasnetski, Artjom
2018
https://digi.lib.ttu.ee/i/?10629
https://www.ester.ee/record=b5151486*est
dissertation
407
book article
Software-based self-test generation for microprocessors with high-level decision diagrams
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Jasnetski, Artjom
;
Brik, Marina
LATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 2014
2014
/
[6] p. : ill
book article
408
journal article
Software-based self-test generation for microprocessors with high-level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
;
Brik, Marina
Proceedings of the Estonian Academy of Sciences
2014
/
p. 48-61 : ill
https://artiklid.elnet.ee/record=b2665215*est
journal article
409
book
Software-based self-test with decision diagrams for microprocessors
Ubar, Raimund-Johannes
;
Jasnetski, Artjom
;
Tšertov, Anton
;
Oyeniran, Adeboye Stephen
2018
book
410
newspaper article
Solaride lõpetas testsõidu maastikupõlengu tõttu
Hansar, Helina
postimees.ee
2023
Solaride lõpetas testsõidu maastikupõlengu tõttu
newspaper article
411
book article
Some aspects of testing speaking skills in UK
Putrova, M.
;
Gridneva, I.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 74-76
book article
412
book article EST
/
book article ENG
Special session: approximation and fault resiliency of DNN accelerators
Ahmadilivani, Mohammad Hasan
;
Barbareschi, Mario
;
Barone, Salvatore
;
Bosio, Alberto
;
Daneshtalab, Masoud
;
Torca, Salvatore Della
;
Gavarini, Gabriele
;
Jenihhin, Maksim
;
Raik, Jaan
;
Taheri, Mahdi
Proceedings 2023 IEEE 41st VLSI Test Symposium (VTS)
2023
/
10 p. : ill
https://doi.org/10.1109/VTS56346.2023.10140043
Conference proceeding at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
413
book article
Statistical strength of brittle materials : test methods and weibull modulus
Preis, Irina
Proceedings of the 3rd International Conference Industrial Engineering - New Challenges to SME : 25-27 April 2002, Tallinn, Estonia
2002
/
p. 205-208 : ill
book article
414
book article
Step-wise approximated multi-cycle sine wave for dynamic tests of AD converters
Land, Raul
XVI IMEKO World Congress : IMEKO2000 : proceedings of the 5th Workshop on ADC Modelling and Testing (EWADC'2000) : Vienna, Austria, Sept. 25-28, 2000
2000
/
p. 217-220
book article
415
book article
Structural fault collapsing by superposition of BDDs for test generation in digital circuits
Ubar, Raimund-Johannes
;
Mironov, Dmitri
;
Raik, Jaan
;
Jutman, Artur
Proceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA
2010
/
p. 250-257 : ill
https://ieeexplore.ieee.org/document/5450451
book article
416
newspaper article
Studioosus testis liiklust : [marsruudil TTÜ peahoone - Viru keskus]
Nassar, Bia
;
Käger, Maarja
Studioosus
2008
/
märts, lk. 10
newspaper article
417
book article
Study of effects of modulated microwaves by method of face masking
Rodina, Anastasia
;
Lass, Jaanus
;
Bachmann, T.
;
Hinrikus, Hiie
Proceedings of the 25th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Vol. 25, A New Beginning for Human Health : volume 4 of 4 : 17-21 September 2003, Cancun, Mexico
2003
/
p. 3249-3252
https://ieeexplore.ieee.org/document/1280836
book article
418
book article
Subsurface of Cr3C2-Ni cermets modified by wear [Electronic resource]
Antonov, Maksim
;
Hussainova, Irina
Proceedings of the 10th International Conference of the European Ceramic Society
2008
/
? p. [CD-ROM]
https://www.academia.edu/24587100/Subsurface_of_Cr_3_C_2_Ni_Cermets_Modified_by_Wear
book article
419
book article
A suite of IEEE 1687 benchmark networks
Tšertov, Anton
;
Jutman, Artur
;
Devadze, Sergei
2016 IEEE International Test Conference (ITC) : proceedings
2016
/
art. 6.1, p. 1-10 : ill
https://doi.org/10.1109/TEST.2016.7805840
book article
420
dissertation
A symbolic approach to model-based online testing = Mudelipõhine online-testimine kasutades sümbolarvutust
Kääramees, Marko
2012
http://www.ester.ee/record=b2890159*est
dissertation
421
dissertation
Symbolic test generation for hierarchically modeled digital systems
Zaugarov, Viktor
1993
https://www.ester.ee/record=b2090336*est
dissertation
422
book article
Synthesis of high-level decision diagrams for functional test pattern generation
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Karputkin, Anton
;
Tombak, Mati
Proceedings of the 16th International Conference Mixed Design of Integrated Circuits and Systems MIXDES 2009 : Lodz, Poland, 25-27 June, 2009
2009
/
p. 519-524 : ill
book article
423
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
424
book article
Synthesis of on-line planning tester for non-deterministic EFSM models
Kääramees, Marko
;
Vain, Jüri
;
Raiend, Kullo
Testing - Practice and Research Techniques : 5th International Academic and Industrial Conference TAIC PART 2010 : Windsor, UK, September 3-5, 2010 : proceedings
2010
/
p. 147-154
https://link.springer.com/chapter/10.1007/978-3-642-15585-7_14
book article
425
book article
Synthesis of test purpose directed reactive planning tester for nondeterministic systems
Vain, Jüri
;
Raiend, Kullo
;
Kull, Andres
;
Ernits, Juhan-Peep
22nd IEEE/ACM International Conference on Automated Software Engineering (ASE 2007) : November 5-9, 2007, Atlanta, Georgia, USA
2007
/
p. 363-372
https://www.researchgate.net/publication/220883693_Synthesis_of_test_purpose_directed_reactive_planning_tester_for_nondeterministic_systems
book article
Number of records 582, displaying
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