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testimine (subject term)
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301
book article
Modelling and testing of the properties of recovered composite material
Kers, Jaan
;
Goljandin, Dmitri
;
Tall, Kaspar
;
Aruniit, Aare
;
Adoberg, Eron
;
Saarna, Mart
;
Majak, Jüri
Proceedings of the Tenth International Conference on Computational Structures Technology : Valencia, Spain, 14-17 September 2010
2010
/
Paper 81
https://www.researchgate.net/publication/269140253_Modelling_and_Testing_of_the_Properties_of_Recovered_Composite_Material
book article
302
journal article EST
/
journal article ENG
Moisture dry-out capability of steel-faced mineral wool insulated sandwich panels
Kalbe, Kristo
;
Piikov, Hubert
;
Kalamees, Targo
Sustainability
2021
/
18 p. : ill
https://doi.org/10.3390/su12219020
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
303
book article
Motion control system for ship model towing test tank control system using synchronous servo drives
Liyanage, Dhanushka Chamara
;
Hiiemaa, Maido
;
Tamre, Mart
Proceedings of the 11th International Conference of DAAAM Baltic Industrial Engineering : 20-22th April 2016, Tallinn, Estonia
2016
/
p. 151-156 : ill
http://innomet.ttu.ee/daaam/
book article
304
journal article
Motor Mode Analysis of Exterior-Rotor PM Machine with Gramme's Winding
Nukki,Rene
;
Kilk, Aleksander
;
Saarts, Samo
;
Tiimus, Kristjan
Elektronika ir elektrotechnika = Electronics and electrical engineering
2017
/
p. 21-25 : ill
http://dx.doi.org/10.5755/j01.eie.23.1.17579
journal article
305
book article
Mudelipõhine testimine
Kull, Andres
Tallinna Tehnikaülikooli aastaraamat 2010
2011
/
lk. 115-118
book article
306
journal article
Mudelipõhine testimine : kas teoreetikute näpuharjutus või testimise homne päev?
Markvardt, Maili
A & A
2010
/
3, lk. 48-56
https://artiklid.elnet.ee/record=b2183739*est
journal article
307
book article
Multi-fragment Markov model guided online test generation for MPSoC
Vain, Jüri
;
Tsiopoulos, Leonidas
;
Kharchenko, Vyacheslav
;
Apneet Kaur
;
Jenihhin, Maksim
;
Raik, Jaan
ICTERI 2017 : ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer : proceedings of the 13th International Conference on ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer, Kyiv, Ukraine, May 15-18, 2017
2017
/
p. 594-607 : ill
http://www.scopus.com/inward/record.uri?eid=2-s2.0-85020540459&partnerID=40&md5=af226e25c344c52689f23bf5c39cc267
http://ceur-ws.org/Vol-1844/10000594.pdf
book article
308
book article
Multi-level test generation and fault diagnosis for finite state machines
Ubar, Raimund-Johannes
;
Brik, Marina
Dependable computing : proceedings / EDCC-2, Second European Dependable Computing Conference, Taormina, Italy, October 2-4, 1996
1996
/
p. 264-281: ill
book article
309
book
Multi-level test generation and fault diagnosis in digital systems
Ubar, Raimund-Johannes
1992
book
310
book article
Multi-level test generation for digital systems at system, circuit and defect levels
Ubar, Raimund-Johannes
Proceedings of the 7th International Scientific Conference "Theory and Technique of Information Transmission, Reception and Processing" : Tuapse, October 1-4, 2001
2001
/
p. 286-288
book article
311
book article
Multiple control fault testing in digital systems with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/AQTR.2016.7501287
book article
312
book article
Multiple fault analyses in logic circuits
Ubar, Raimund-Johannes
IFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 77
1977
/
p. [?]
book article
313
book article
Multiple stuck-at-fault detection theorem
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 236-241 : ill
book article
314
book article
Multiple-objective backtrace for solving test generation constraints
Mekler, A.
;
Raik, Jaan
International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings
2003
/
p. 123-126 : ill
https://ieeexplore.ieee.org/document/1267732
book article
315
book article
Multiscale memristive properties of skin induced by memory effects of cyclic stress-relaxation loadings : data fusion from ground truth nonlinear acousto-mechanical testing
Dos Santos, Serge
;
Masood, Ali
;
Lints, Martin
;
Salupere, Andrus
;
Kozena, Colette
;
Kus, Vaclav
ICSV 2018: 25th International Congress on Sound and Vibration (ICSV25), Hiroshima, Japan, 8-12 July, 2018 : proceedings. Vol. 1
2018
/
p. 1965-1972 : ill
http://toc.proceedings.com/40638webtoc.pdf
https://www.researchgate.net/publication/326668548_MULTISCALE_MEMRISTIVE_PROPERTIES_OF_SKIN_INDUCED_BY_MEMORY_EFFECTS_OF_CYCLIC_STRESS-RELAXATION_LOADINGS_DATA_FUSION_FROM_GROUND_TRUTH_NONLINEAR_ACOUSTO-MECHANICAL_TESTING
book article
316
book article
Multi-view modeling for MPSoC design aspects [Online resource]
Vain, Jüri
;
Apneet Kaur
;
Tsiopoulos, Leonidas
;
Raik, Jaan
;
Jenihhin, Maksim
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600986
book article
317
book article
Mutation analysis for systemC designs at TLM
Guarnieri, Valerio
;
Bombieri, Nicola
;
Pravadelli, Graziano
;
Fummi, Franco
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
12th IEEE Latin American Test Workshop (LATW) : Porto de Galinhas, Brasil, 27-30 March 2011
2011
/
[6] p
https://ieeexplore.ieee.org/document/5985925
book article
318
book article
Mutations for testing hardware and correcting design errors
Hantson, Hanno
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK viienda aastakonverentsi artiklite kogumik : 25.-26. novembril 2011, Nelijärve
2011
/
p. 105-108 : ill
book article
319
journal article
Nanoindentation testing and modeling of chromium carbide based composites
Hussainova, Irina
;
Hamed, Elham
;
Jasiuk, Iwona
Mechanics of composite materials
2011
/
p. 667-678 : ill
journal article
320
book article
Nanomaterials Al-Al4-C3 studied by "In-situ Tensile Test in SEM"
Besterci, Michal
;
Velgosova, Oksana
;
Ivan, Jozef
;
Hvizdoš, Pavol
;
Kvackaj, Tibor
;
Kulu, Priit
18th International Baltic Conference : Engineering Materials & Tribology : BALTMATTRIB-2009 : October 22-23, 2009, Tallinn, Estonia : abstracts
2009
/
p. 73
book article
321
book article
Narkotestri arendamine narkootikumide tuvastamiseks süljes
Saar-Reismaa, Piret
;
Erme, E.
;
Kulp, Maria
;
Gorbatšova, Jelena
;
Kaljurand, Mihkel
;
Vaher, Merike
;
Mazina-Šinkar, Jekaterina
XXXIV Eesti keemiapäevad : 100. aastapäeva teaduskonverentsi teesid
2019
/
lk. 27
https://www.ester.ee/record=b5208044*est
book article
322
journal article
Natural apeaking and how to assess it
Pajupuu, Hille
;
Kerge, Krista
;
Meister, Lya
;
Asu, Eva Liina
;
Alp, Pilvi
Trames
2010
/
2, p. 120-140 : ill
https://www.researchgate.net/publication/238451077_Natural_speaking_and_how_to_assess_it
journal article
323
book article
New fault models and self-test generation for microprocessors using High-Level Decision Diagrams
Jasnetski, Artjom
;
Raik, Jaan
;
Tšertov, Anton
;
Ubar, Raimund-Johannes
2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings
2015
/
p. 251-254 : ill
book article
324
book article
New foreign language text-books as objects of testing
Rapoport, I.
;
Petrova, N.
V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries
1991
/
p. 77
book article
325
book article
New method of testability calculation to guide RT-level test generation
Raik, Jaan
;
Nõmmeots, Tanel
;
Ubar, Raimund-Johannes
4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 2003
2003
/
p. 46-51 : ill
https://link.springer.com/article/10.1007/s10836-005-5288-5
book article
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