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testimine (subject term)
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276
book article
Off-line testing of crosstalk induced glitch faults in NoC Interconnects
Bengtsson, Tomas
;
Kumar, Shashi
;
Jutman, Artur
;
Ubar, Raimund-Johannes
Proceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 2006
2006
/
p. 221-225 : ill
http://dx.doi.org/10.1109/NORCHP.2006.329215
book article
277
book article
Off-line testing of delay faults in NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Peng, Zebo
;
Ubar, Raimund-Johannes
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 677-680 : ill
http://dx.doi.org/10.1109/DSD.2006.72
book article
278
book article
On automatic software-based self-test program generation based on high-Level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 177
http://dx.doi.org/10.1109/LATW.2016.7483357
book article
279
book article
On coverage of timing related faults at board level
Jutman, Artur
;
Aleksejev, Igor
;
Devadze, Sergei
2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings
2016
/
[2] p. : ill
https://doi.org/10.1109/ETS.2016.7519295
book article
280
book article
On mutating UPPAAL timed automata to assess robustness of web services
Siavashi, Faezeh
;
Truscan, Dragos
;
Vain, Jüri
Proceedings of the 11th International Joint Conference on Software Technologies (ICSOFT 2016). Vol. 1, ICSOFT-EA
2016
/
p. 15-26 : ill
http://dx.doi.org/10.5220/0005970800150026
book article
281
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja
2008
/
p. 43-46 : ill
book article
282
book article
On reusability of verification assertions for testing
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Tšepurov, Anton
BEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia
2008
/
p. 151-154 : ill
book article
283
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
284
book article EST
/
book article ENG
On testing microservice systems
Koschel, Arne
;
Astrova, Irina
;
Bartels, Mirco
;
Helmers, Mark
;
Lyko, Marcel
Proceedings of the Future Technologies Conference (FTC) 2020 ; vol. 3
2021
/
p. 597–609
https://doi.org/10.1007/978-3-030-63092-8_40
Conference Proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
285
book article
On the combined use of HLDDs and EFSMs for functional ATPG
Di Guglielmo, Giuseppe
;
Fummi, Franco
;
Jenihhin, Maksim
;
Pravadelli, Graziano
;
Raik, Jaan
;
Ubar, Raimund-Johannes
5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia
2007
/
p. 503-508 : ill
book article
286
book article
On using genetic algorithm for test generation
Brik, Marina
;
Raik, Jaan
;
Ubar, Raimund-Johannes
;
Ivask, Eero
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
2004
/
p. 233-236 : ill
book article
287
dissertation
Optical detection methods for droplet microfluidic applications = Optilised tuvastusmeetodid tilkade mikrofluidiliste rakenduste jaoks
Pärnamets, Kaiser
2023
https://doi.org/10.23658/taltech.31/2023
https://digikogu.taltech.ee/et/Item/ffb85150-fb85-4a7c-b130-0d7f2c3b7fb5
https://www.ester.ee/record=b5569973*est
dissertation
Seotud publikatsioonid
3
Optical detection methods for high-throughput fluorescent droplet microflow cytometry
Open source hardware cost-effective imaging sensors for high-throughput droplet microfluidic systems
Compact empirical model for droplet generation in a Lab-on-Chip cytometry system
288
book article
Optimierte Steuerung der Fehlersuche auf digitalen Leiterplatten
Thomä, E.
;
Ubar, Raimund-Johannes
Proceedings of the 27th International Conference, Technical University of Ilmenau, October, 1982
1982
/
p. 65-68
book article
289
dissertation
Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemides
Kruus, Helena
2011
dissertation
290
book article
Optimization of memory-constrained hybrid BIST for testing core-based systems
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Ubar, Raimund-Johannes
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum
2007
/
lk. 133-136 : ill
book article
291
book article
Optimization of the store-and-generate based built-in self-test
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Kruus, Helena
;
Orasson, Elmet
;
Aleksejev, Igor
BEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference
2006
/
p. 199-202 : ill
book article
292
journal article EST
/
journal article ENG
Out-of-step protection based on discrete angle derivatives
Tealane, Marko
;
Kilter, Jako
;
Bagleybter, Oleg
;
Heimisson, Birkir
;
Popov, Marjan
IEEE Access
2022
/
p. 78290-78305
https://doi.org/10.1109/ACCESS.2022.3193390
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Seotud publikatsioonid
1
Future power system out-of-step protection concept utilizing synchronized phasor measurements = Tuleviku elektrisüsteemi faasimõõtmistel põhinev sünkronismikaotuskaitse kontseptsioon
293
journal article
Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systems
Ubar, Raimund-Johannes
Facta Universitatis [Niš]. Series electronics and energetics
2011
/
p. 303-324 : ill
http://dx.doi.org/10.2298/FUEE1103303U
journal article
294
book article
Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systems
Ubar, Raimund-Johannes
Proceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland
2011
/
p. 1-10 : ill
book article
295
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
Microelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 2004
2004
/
p. 253-258 : ill
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
296
book article
Overview of e-learning environment for web-based study of testing and diagnostics of digital systems
Jutman, Artur
;
Ubar, Raimund-Johannes
;
Wuttke, Heinz-Dietrich
5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 2004
2004
/
p. 173-176
https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41
book article
297
book article
Parallel critical path tracing fault simulation in sequential circuits
Kõusaar, Jaak
;
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Devadze, Sergei
;
Raik, Jaan
Proceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 2018
2018
/
p. 305-310 : ill
https://doi.org/10.23919/MIXDES.2018.8436880
book article
298
book article
Parallel exact critical path tracing fault simulation with reduced memory requirements
Devadze, Sergei
;
Ubar, Raimund-Johannes
;
Raik, Jaan
;
Jutman, Artur
4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009
2009
/
p. 155-160 : ill
https://ieeexplore.ieee.org/document/4938046
book article
299
book article EST
/
book article ENG
Parallel pseudo-exhaustive testing of array multipliers with data-controlled segmentation
Oyeniran, Adeboye Stephen
;
Azad, Siavoosh Payandeh
;
Ubar, Raimund-Johannes
2018 IEEE International Symposium on Circuits and Systems (ISCAS) : 27-30 May 2018, Florence, Italy : proceedings
2018
/
5 p.: ill
https://doi.org/10.1109/ISCAS.2018.8350936
Conference proceedings at Scopus
Article at Scopus
Article at WOS
book article EST
/
book article ENG
300
book article
Performance estimation of embedded applications on microcontrollers
Ruberg, Priit
;
Lass, Keijo
;
Liiv, Elvar
;
Ellervee, Peeter
2017 IEEE Nordic Circuits and Systems Conference (NORCAS 2017): NORCHIP and International Symposium of System-on-Chip (SoC 2017) : Linkoping, Sweden, 23-25 October, 2017
2017
/
p. 170-175 : ill
http://dx.doi.org/10.1109/NORCHIP.2017.8124964
book article
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