prindi

Hierarchical concurrent test generation for synchronous sequential circuits

autor
Ubar, Raimund-Johannes
Brik, Marina
vastutusandmed
R.Ubar, M.Brik
allikas
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
ilmumiskoht
[S. l.]
ilmumisaasta
2000
leheküljed
p. 533-538 : ill
ISBN
83-87202-37-1
märkused
Bibliogr.: 6 ref
Ubar, R., Brik, M. Hierarchical concurrent test generation for synchronous sequential circuits // Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000. [S. l.], 2000. p. 533-538 : ill.