Ubar, R., Brik, M. - TalTech teadusportaal

Hierarchical concurrent test generation for synchronous sequential circuits

autor

Ubar, Raimund-Johannes

Brik, Marina

vastutusandmed

R.Ubar, M.Brik

allikas

Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000

ilmumiskoht

[S. l.]

ilmumisaasta

2000

leheküljed

p. 533-538 : ill

ISBN

83-87202-37-1

märkused

Bibliogr.: 6 ref

Ubar, R., Brik, M. Hierarchical concurrent test generation for synchronous sequential circuits // Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000. [S. l.], 2000. p. 533-538 : ill.