Negative Bias Temperature Instability (NBTI) (võtmesõna)

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  • artikkel kogumikus
    Accurate NBTI-induced gate delay modeling based on intensive SPICE simulationsKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimMEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia2015 / p. 21-26 : ill
    artikkel kogumikus
  • artikkel kogumikus
    SPICE-inspired fast gate-level computation of NBTI-induced delays in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, Maksim2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 223-228 : ill
    artikkel kogumikus
Kirjeid leitud 2, kuvan 1 - 2