Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells
vastutusandmed
Siavoosh Payandeh Azad, Adeboye Stephen Oyeniran, Raimund Ubar
ilmumiskoht
Piscataway
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 21-26 : ill
konverentsi nimetus, aeg
2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 25-27 April, 2018
konverentsi toimumispaik
Budapest, Hungary
ISSN
2473-2117
ISBN
978-1-5386-5754-6
märkused
Bibliogr.: 21 ref
TTÜ struktuuriüksus
keel
inglise
vormimärksõna
võtmesõna
two-dimensional array testing
multiplier test
data-controlled circuit partition
test replication
Azad, S.P., Oyeniran, A.S., Ubar, R. Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cells // 21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings. Piscataway : IEEE, 2018. p. 21-26 : ill.