prindi

RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design

autor
Gürsoy, Cemil Cem
Cardoso Medeiros, Guilherme
Chen, Juanho
Balakrishnan, Aneesh
Lai, Xinhui
Bagbaba, Ahmet Cagri
Raik, Jaan
Jenihhin, Maksim
vastutusandmed
C.C. Gürsoy, G. Medeiros, J. Chen, N. George, J.E. Rodriguez Condia, T.Lange, A. Damljanovic, A. Balakrishnan, R. Segabinazzi Ferreira, X. Lai, S. Masoumian, D. Petryk, T. Koylu, F. da Silva, A. Bagbaba, S. Hamdioui, M. Taouil, M. Krstic, P. Langendörfer, Z. Dyka, M. Huebner, J. Nolte , G. Squillero, L. Sterpone, J. Raik, D. Alexandrescu, M. Glorieux, G. Selimis, G.J. Schrijen, A. Klotz, C. Sauer, M. Jenihhin
allikas
DATE 2019
ilmumiskoht
[S.l.]
ilmumisaasta
2019
leheküljed
1 p. : ill
konverentsi nimetus, aeg
2019 Design Automation and Test in Europe Conference (UB DATE), 25-29 March, 2019
konverentsi toimumispaik
Florence, Italy
leitav
https://doi.org/10.5281/zenodo.3362529
https://past.date-conference.com/
märksõna
nanoelektroonika
töökindlus
turvalisus
võtmesõna
reliability
security
verification
test
fault tolerance
EDA tools
nanoelectronic systems design
H2020 MSCA ITN
TTÜ struktuuriüksus
arvutisüsteemide instituut
keel
inglise
Gürsoy, C. C., Medeiros, G., Chen, J., Balakrishnan, A., Lai, X., Bagbaba, A. C. Raik, J., Jenihhin, M. et al. RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design // DATE 2019. [S.l.], 2019. 1 p. : ill. https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/