täiskirje prindi

RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design

autor
vastutusandmed
C.C. Gürsoy, G. Medeiros, J. Chen, N. George, J.E. Rodriguez Condia, T.Lange, A. Damljanovic, A. Balakrishnan, R. Segabinazzi Ferreira, X. Lai, S. Masoumian, D. Petryk, T. Koylu, F. da Silva, A. Bagbaba, S. Hamdioui, M. Taouil, M. Krstic, P. Langendörfer, Z. Dyka, M. Huebner, J. Nolte , G. Squillero, L. Sterpone, J. Raik, D. Alexandrescu, M. Glorieux, G. Selimis, G.J. Schrijen, A. Klotz, C. Sauer, M. Jenihhin
allikas
DATE 2019
ilmumiskoht
[S.l.]
ilmumisaasta
leheküljed
1 p. : ill
konverentsi nimetus, aeg
2019 Design Automation and Test in Europe Conference (UB DATE), 25-29 March, 2019
konverentsi toimumispaik
Florence, Italy
leitav
TTÜ struktuuriüksus
keel
inglise
Gürsoy, C. C., Medeiros, G., Chen, J., Balakrishnan, A., Lai, X., Bagbaba, A. C. Raik, J., Jenihhin, M. et al. RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems design // DATE 2019. [S.l.], 2019. 1 p. : ill. https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/