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Kirjeid leitud 3
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Design obfuscation versus testFarahmandi, Farimah; Sinanoglu, Ozgur; Blanton, Ronald; Pagliarini, Samuel Nascimento2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia2020 / 10 p https://doi.org/10.1109/ETS48528.2020.9131590

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RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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artikkel kogumikus

RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

artikkel kogumikus

Kirjeid leitud 3, kuvan 1 - 3

1. accelerated shelf-life test
2. adaptive test strategy generation
3. antigen test
4. ASTM G65 dry sand rubber wheel abrasion test
5. automated test environment
6. automated test pattern generation
7. automatic test case generation
8. automatic test pattern generation
9. automatic test program generation
10. Auvergne test-bed
11. battery test
12. behavioral test
13. behaviour level test generation
14. bending test
15. bit-error rate test
16. Board and System Test
17. board test
18. bounds test
19. built-in self-test
20. capillary condensation redistribution test
21. chi-square test
22. closed bottle test
23. cognitive screening test
24. compartment fire test
25. compartment test
26. cone penetration test (CPT)
27. COVID-19 antigen test
28. cutting test
29. cybersecurity test bed
30. DDR4 interconnect test
31. design and test
32. design-for-test
33. deterministic test sequences
34. diagnostic test
35. digital test
36. Digital test and testable design
37. double-pulse test
38. drawing test
39. dry droplet antimicrobial test
40. embedded test
41. fan pressurisation test
42. final test result prediction
43. four-point bending test
44. FPGA based test
45. FPGA-Assisted Test
46. FPGA-centric test
47. functional self-test
48. functional test generation
49. Granger causality test
50. hardness test
51. high-level synthesis for test
52. high-level test data generation
53. highlevel test generation
54. high-speed serial link test
55. IEEE 9 bus test system
56. implementation-independent test generation
57. in situ tensile test in SEM
58. industrial field test
59. in-situ tensile test in SEM
60. Johansen cointegration test
61. Kolmogorov-Smirnov test
62. load test
63. logic built-in self-test
64. Luria alternating series test
65. Mann–Kendall test
66. memory interconnect test
67. microprocessor test
68. Model test
69. multiplier test
70. offline test generation
71. orthogonal test
72. package test analysis
73. parallel design and test
74. performance test
75. piezocone penetration test (CPTu)
76. Point Load Test index
77. pressurisation test
78. processor-centric board test
79. progressive damage test
80. provably correct test generation
81. pseudo-exhaustive test
82. purity test
83. rtioco-based timed test sequences
84. seasonal Mann Kendall test
85. seismic piezocone penetration test
86. self-test
87. self-test architectures
88. sentence writing test
89. serial sevens test
90. ship towing test tank
91. similar material simulation test
92. small-scale fire test
93. small‐scale test
94. software based self-test
95. software-based self-test
96. software-based self-test (SBST)
97. soil phosphorus (P) test
98. standard test method
99. static load test
100. static-dynamic probing test (SDT)
101. stress test
102. system level test
103. teaching design and test of systems
104. tensile test
105. test
106. test and evaluation platform
107. test bench
108. test coverage
109. test driven development
110. test driven modelling
111. test embankment
112. test equipment
113. test generation
114. test generation and fault diagnosis
115. test groups
116. test model design
117. test optimization
118. test packets
119. test path synthesis
120. test patterns
121. test point insertion
122. test program generation
123. test reference year
124. test replication
125. test scenario description language
126. test-bed
127. test-chips
128. test-house
129. test-pattern
130. test-suite reduction
131. Three-point bending test
132. unit root test
133. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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