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Design obfuscation versus testFarahmandi, Farimah; Sinanoglu, Ozgur; Blanton, Ronald; Pagliarini, Samuel Nascimento2020 IEEE European Test Symposium (ETS) : ETS 2020, May 25 - 29, 2020, Tallinn, Estonia2020 / 10 p https://doi.org/10.1109/ETS48528.2020.9131590

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RESCUE EDA Toolset for interdependent aspects of reliability, security and quality in nanoelectronic systems designGürsoy, Cemil Cem; Cardoso Medeiros, Guilherme; Chen, Juanho; Balakrishnan, Aneesh; Lai, Xinhui; Bagbaba, Ahmet Cagri; Raik, Jaan; Jenihhin, MaksimDATE 20192019 / 1 p. : ill https://doi.org/10.5281/zenodo.3362529 https://past.date-conference.com/

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RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

artikkel kogumikus

Kirjeid leitud 3, kuvan 1 - 3

1. accelerated shelf-life test
2. adaptive test strategy generation
3. antigen test
4. ASTM G65 dry sand rubber wheel abrasion test
5. automated test environment
6. automated test pattern generation
7. automatic test case generation
8. automatic test pattern generation
9. automatic test program generation
10. Auvergne test-bed
11. battery test
12. behavioral test
13. behaviour level test generation
14. bending test
15. bit-error rate test
16. Board and System Test
17. board test
18. bounds test
19. built-in self-test
20. capillary condensation redistribution test
21. chi-square test
22. closed bottle test
23. cognitive screening test
24. compartment fire test
25. compartment test
26. cone penetration test (CPT)
27. COVID-19 antigen test
28. cutting test
29. cybersecurity test bed
30. DDR4 interconnect test
31. design and test
32. design-for-test
33. deterministic test sequences
34. diagnostic test
35. digital test
36. Digital test and testable design
37. double-pulse test
38. drawing test
39. dry droplet antimicrobial test
40. embedded test
41. fan pressurisation test
42. final test result prediction
43. four-point bending test
44. FPGA based test
45. FPGA-Assisted Test
46. FPGA-centric test
47. functional self-test
48. functional test generation
49. Granger causality test
50. hardness test
51. high-level synthesis for test
52. high-level test data generation
53. highlevel test generation
54. high-speed serial link test
55. IEEE 9 bus test system
56. implementation-independent test generation
57. in situ tensile test in SEM
58. industrial field test
59. in-situ tensile test in SEM
60. Johansen cointegration test
61. Kolmogorov-Smirnov test
62. load test
63. logic built-in self-test
64. Luria alternating series test
65. Mann–Kendall test
66. memory interconnect test
67. microprocessor test
68. Model test
69. multiplier test
70. offline test generation
71. orthogonal test
72. package test analysis
73. parallel design and test
74. performance test
75. piezocone penetration test (CPTu)
76. Point Load Test index
77. pressurisation test
78. processor-centric board test
79. progressive damage test
80. provably correct test generation
81. pseudo-exhaustive test
82. purity test
83. rtioco-based timed test sequences
84. seasonal Mann Kendall test
85. seismic piezocone penetration test
86. self-test
87. self-test architectures
88. sentence writing test
89. serial sevens test
90. ship towing test tank
91. similar material simulation test
92. small‐scale test
93. software based self-test
94. software-based self-test
95. software-based self-test (SBST)
96. soil phosphorus (P) test
97. standard test method
98. static load test
99. static-dynamic probing test (SDT)
100. stress test
101. system level test
102. teaching design and test of systems
103. tensile test
104. test
105. test and evaluation platform
106. test bench
107. test coverage
108. test driven development
109. test driven modelling
110. test embankment
111. test equipment
112. test generation
113. test generation and fault diagnosis
114. test groups
115. test model design
116. test optimization
117. test packets
118. test path synthesis
119. test patterns
120. test point insertion
121. test program generation
122. test reference year
123. test replication
124. test scenario description language
125. test-bed
126. test-chips
127. test-house
128. test-pattern
129. test-suite reduction
130. Three-point bending test
131. unit root test
132. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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