täiskirje prindi

Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties

autor
vastutusandmed
Daniel Kropman, Tiit Kärner, Sergei Dolgov, Ivo Heinmaa, Tõnu Laas, and Charalampos A. Londos
allikas
ajakirja aastakäik number kuu
Vol. 8, 3
ilmumisaasta
leheküljed
p. 694-696 : ill
leitav
ISSN
1610-1642
märkused
Bibliogr.: 6 ref
keel
inglise
Kropman, D., Kärner, T., Dolgov, S., Heinmaa, I., Laas, T., Londos, C.A. Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties // Physica status solidi (c) (2011) Vol. 8, 3, p. 694-696 : ill. https://www.sciencedirect.com/science/article/pii/S0040609009014564