VHDL based test generation system

vastutusandmed
G. Jervan, A. Markus, J. Raik, R. Ubar
ilmumiskoht
Brno
ilmumisaasta
leheküljed
p. 145-148
keel
inglise
Jervan, G., Markus, A., Raik, J., Ubar, R. VHDL based test generation system // Proceedings of the 5th Electronic Devices and Systems Conference, Brno, June 11-12, 1998. Brno : Technical University, Faculty of Electrical Engineering and Computer Science, 1998. p. 145-148.