Otsing - TalTech teadusportaal

kuva

reasta

501

artikkel kogumikus

Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

artikkel kogumikus

502

artikkel kogumikus

On automatic software-based self-test program generation based on high-Level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 177 http://dx.doi.org/10.1109/LATW.2016.7483357

artikkel kogumikus

503

artikkel kogumikus

On efficient logic-level simulation of digital circuits represented by the SSBDD modelJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 621-624 : ill

artikkel kogumikus

504

artikkel kogumikus

On reusability of verification assertions for testingJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Tšepurov, AntonBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 151-154 : ill

artikkel kogumikus

505

artikkel kogumikus EST / artikkel kogumikus ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

506

artikkel kogumikus

On the combined use of HLDDs and EFSMs for functional ATPGDi Guglielmo, Giuseppe; Fummi, Franco; Jenihhin, Maksim; Pravadelli, Graziano; Raik, Jaan; Ubar, Raimund-Johannes5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia2007 / p. 503-508 : ill

artikkel kogumikus

507

artikkel ajakirjas

On the reuse of TLM mutation analysis at RTLGuarnieri, Valerio; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2012 / p. 435-448 : ill

artikkel ajakirjas

508

artikkel kogumikus

On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

artikkel kogumikus

509

artikkel kogumikus

On-line monitoring of dialysis adequacy using diasens optical sensor: accurate Kt/V estimation by smoothing algorithmsTalisainen, Aleksei; Kostin, Sergei; Karai, Deniss; Fridolin, Ivo; Ubar, Raimund-JohannesBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 273-276 : ill

artikkel kogumikus

510

artikkel ajakirjas

Open-source JTAG simulator bundle for labsShibin, Konstantin; Devadze, Sergei; Rosin, Vjatšeslav; Jutman, Artur; Ubar, Raimund-JohannesInternational journal of electronics and telecommunications2012 / p. 233-239 : ill https://journals.pan.pl/Content/87192/PDF/32.pdf

artikkel ajakirjas

511

artikkel kogumikus

Optimierte Steuerung der Fehlersuche auf digitalen LeiterplattenThomä, E.; Ubar, Raimund-JohannesProceedings of the 27th International Conference, Technical University of Ilmenau, October, 19821982 / p. 65-68

artikkel kogumikus

512

artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 20072007 / p. 71-77

artikkel kogumikus

513

artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 133-136 : ill

artikkel kogumikus

514

artikkel kogumikus

Optimization of structurally synthesized BDDsUbar, Raimund-Johannes; Vassiljeva, T.; Raik, Jaan; Jutman, Artur; Tombak, Mati; Peder, AhtiProceedings of the Fourth IASTED International Conference on Modelling, Simulation, and Optimization : August 17-19, 2004, Kavai, Hawaii, USA2004 / p. 234-240 : ill

artikkel kogumikus

515

artikkel kogumikus

Optimization of the store-and-generate based built-in self-testUbar, Raimund-Johannes; Jervan, Gert; Kruus, Helena; Orasson, Elmet; Aleksejev, IgorBEC 2006 : 2006 International Baltic Electronics Conference : Tallinn University of Technology, October 2-4, 2006, Tallinn, Estonia : proceedings of the 10th Biennial Baltic Electronics Conference2006 / p. 199-202 : ill

artikkel kogumikus

516

artikkel ajakirjas

Otstarbeka, õiglase ja efektiivse Eesti eestUbar, Raimund-JohannesTehnikaülikool1995 / 23. jaan., lk. 3-5 https://www.ester.ee/record=b5309277*est

artikkel ajakirjas

517

artikkel kogumikus

Otstarbeka, õiglase ja tõhusa Eesti suunasUbar, Raimund-JohannesInsenerikultuur Eestis. 21995 / lk. 179-185 https://www.ester.ee/record=b1063622*est

artikkel kogumikus

518

artikkel ajakirjas

Overview about low-level and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesFacta Universitatis [Niš]. Series electronics and energetics2011 / p. 303-324 : ill http://dx.doi.org/10.2298/FUEE1103303U

artikkel ajakirjas

519

artikkel kogumikus

Overview about low-lewel and high-level decision diagrams for diagnostic modeling of digital systemsUbar, Raimund-JohannesProceedings of the Reed-Muller 2011 Workshop : May 25-26, 2011, Tuusula, Finland2011 / p. 1-10 : ill

artikkel kogumikus

520

artikkel kogumikus

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 5th European Workshop on Microelectronics Education, held in Lausanne, Switzerland, April 15-16, 20042004 / p. 253-258 : ill https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

artikkel kogumikus

521

artikkel kogumikus

Overview of e-learning environment for web-based study of testing and diagnostics of digital systemsJutman, Artur; Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich5th European Workshop on Microelectronics Education - EWME 2004, Lausanne, 20042004 / p. 173-176 https://link.springer.com/chapter/10.1007/978-1-4020-2651-5_41

artikkel kogumikus

522

artikkel kogumikus

Parallel critical path tracing fault simulationUbar, Raimund-Johannes39. Internationales Wissenschaftliches Kolloquium : 27.-30.09.1994. Bd. 1, Vortragsreihen1994 / S. 399-404

artikkel kogumikus

523

artikkel kogumikus

Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880

artikkel kogumikus

524

artikkel kogumikus

Parallel exact critical path tracing fault simulation with reduced memory requirementsDevadze, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 20092009 / p. 155-160 : ill https://ieeexplore.ieee.org/document/4938046

artikkel kogumikus

525

artikkel kogumikus

Parallel fault analysis on structurally synthesized BDDsDevadze, Sergei; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 47-50 : ill

artikkel kogumikus

teaviku laadid

autor 56

CV 56

tema kohta 27

märksõna 1