On test generation for microprocessors for extended class of functional faults
vastutusandmed
Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, and Jaan Raik
allikas
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
ilmumiskoht
Cham
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 21-44
konverentsi nimetus, aeg
27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019, October 6–9, 2019
konverentsi toimumispaik
Cusco, Peru
ISSN
1868-4238
ISBN
978-3-030-53272-7
märkused
Bibliogr.: 41 ref
Open Access
Open Access
teaduspublikatsioon
teaduspublikatsioon
TTÜ struktuuriüksus
keel
inglise
kategooria (üld)
kategooria (alam)
Oyeniran, A.S., Ubar, R., Jenihhin, M., Raik, J. On test generation for microprocessors for extended class of functional faults // VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers. Cham : Springer Nature, 2020. p. 21-44.