Otsing - TalTech teadusportaal

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1

artikkel kogumikus

An agent-oriented method for designing large socio-technical service-ecosystemsNorta, Alexander; Mahunnah, Msury; Tenso, Tanel; Taveter, Kuldar; Narendra, Nanjangud C.2014 IEEE Tenth World Congress on Services : SERVICES 2014 : 27 June-2 July 2014, Anchorage, Alaska : proceedings2014 / p. 242-249 : ill

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An educational environment for digital testing : hardware, tools, and web-based runtime platformJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes; Vislogubov, VladislavProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 412-419 : ill https://www.researchgate.net/profile/Artur-Jutman/publication/220880167_An_Educational_Environment_for_Digital_Testing_Hardware_Tools_and_Web-Based_Runtime_Platform/links/02e7e53c3c71b0b2a7000000/An-Educational-Environment-for-Digital-Testing-Hardware-Tools-and-Web-Based-Runtime-Platform.pdf

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3

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An external test approach for network-on-a-chip switchesRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesATS '06 : Proceedings of the 15th Asian Test Symposium : November 20-23, 2006, Fukuoka, Japan2006 / p. 437-442 : ill http://dx.doi.org/10.1109/ATS.2006.23

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Asynchronous fault detection in IEEE P1687 instrument networkShibin, Konstantin; Devadze, Sergei; Jutman, ArturIEEE 23rd North Atlantic Test Workshop : 14-16 May 2014, Binghampton, New York : proceedings2014 / p. 73-78 : ill

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5

artikkel ajakirjas EST / artikkel ajakirjas ENG

Automated design error localization in RTL designsJenihhin, Maksim; Tšepurov, Anton; Tihhomirov, Valentin; Raik, Jaan; Hantson, Hanno; Ubar, Raimund-Johannes; Bartsch, Günter; Meza Escobar, Jorge Hernan; Wuttke, Heinz-DietrichIEEE design & test of computers2014 / p. 83-92 : ill https://doi.org/10.1109/MDAT.2013.2271420 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

6

artikkel kogumikus

Back-traced deductive-parallel fault simulation for digital systemsHahanov, Vladimir; Ubar, Raimund-Johannes; Hyduke, StanleyProceedings : Euromicro Symposium on Digital System Design : Belek-Antalya, Turkey, September 1st to 6th, 20032003 / p. 370-377 : ill https://ieeexplore.ieee.org/document/1231969

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Can a HW development and research environment be convenient, scalable and free? zamiaCAD : open-source platform for hardware design and analysis : [invited talk]Jenihhin, MaksimProceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 20122012 / p. 548-549

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Combined model of smart cities and electronic paymentsSoe, Ralf-Martin; Mikheeva, OlgaProceedings of the 7th International Conference for E-Democracy and Open Government CeDEM17 : Danube University Krems, Krems, Austria, 17-19 May 20172017 / p. 194-205 : ill https://doi.org/10.1109/CeDEM.2017.11

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9

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Combining dynamic slicing and mutation operators for ESL correctionRepinski, Urmas; Hantson, Hanno; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-JohannesProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th-June 1st, 2012, Annecy, France2012 / [6] p. : ill https://ieeexplore.ieee.org/document/6233020

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Combining fault analysis technologies for ISO26262 functional safety verificationAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Hamdioui, Said; Sauer, Christian2019 IEEE 28th Asian Test Symposium (ATS) : 10–13 December 2019, Kolkata, India : proceedings2019 / p. 129–134 : ill https://doi.org/10.1109/ATS47505.2019.00024

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

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Comparison of model-based error localization algorithms for C designsRepinski, Urmas; Raik, JaanProceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 20122012 / p. 42-45

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Coordinated PI-based frequency deviation control of isolated hybrid microgrid : an online multi-agent tuning approach via reinforcement learningNosrati, Komeil; Tepljakov, Aleksei; Petlenkov, Eduard; Levron, Yoash; Škiparev, Vjatšeslav; Belikov, Juri2022 IEEE PES Innovative Smart Grid Technologies Conference Europe (ISGT-Europe) : proceedings2022 / p. 1-5 : ill https://doi.org/10.1109/ISGT-Europe54678.2022.9960311

artikkel kogumikus

Seotud publikatsioonid 1

Virtual inertia control of microgrids using deep reinforcement learning methods = Mikrovõrkude virtuaalse inertsi juhtimine sügava stiimulõppe meetoditega

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artikkel kogumikus

Critical path tracing based simulation of transition delay faultsKõusaar, Jaak; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan2014 17th Euromicro Conference on Digital System Design : DSD 2014 : 27-29 August 2014, Verona, Italy : proceedings2014 / p. 108-113 : ill

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14

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Customizable compression architecture for efficient configuration in CGRAsJafri, Syed Mohammad Asad Hassan; Ellervee, Peeter2014 IEEE 22nd International Symposium on Field-Programmable Custom Computing Machines : FCCM 2014 : 11-13 May 2014, Boston, Massachusetts, USA : proceedings2014 / p. 31 : ill

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Cycle-based simulation algorithms for digital systems using high-level decision diagramsMorawiec, Adam; Ubar, Raimund-Johannes; Raik, JaanDesign, Automation and Test in Europe : Conference and Exhibition 2000 : Paris, France, March 27-30, 2000 : proceedings2000 / p. 743 https://ieeexplore.ieee.org/document/840876

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artikkel kogumikus

Cycle-based simulation with decision diagramsUbar, Raimund-Johannes; Morawiec, Adam; Raik, JaanDesign, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings1999 / p. 454-458: ill https://ieeexplore.ieee.org/document/761165

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artikkel kogumikus

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

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artikkel kogumikus

Defect-oriented test- and layout-generation for standard-cell ASIC designsSudbrock, Joachim; Raik, Jaan; Ubar, Raimund-Johannes; Kuzmicz, Wieslaw; Pleskacz, Witold A.Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 79-82 : ill https://ieeexplore.ieee.org/document/1559781

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Designing a contractual choreography language for automating cross-organizational business collaborationNorta, Alexander; Ma, Lixin; Duan, Yucong2014 IEEE Tenth World Congress on Services : SERVICES 2014 : 27 June-2 July 2014, Anchorage, Alaska : proceedings2014 / p. 338-345 : ill

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Developing multi-view Contracts using Event-B and Uppaal Timed AutomataVain, Jüri; Tsiopoulos, Leonidas; Guin, Jishu2016 21st International Conference on Engineering of Complex Computer Systems : ICECCS 2016 : Dubai, United Arab Emirates, 6-8 November 2016 : proceedings2016 / p. 126-134 : ill https://doi.org/10.1109/ICECCS.2016.024

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Digital hardware organization course for SoC programEllervee, Peeter; Tenhunen, Hannu2001 International Conference on Microelectronic Systems Education : June 17-18, 2001, Las Vegas, Nevada, USA : proceedings2001 / p. 26-27 https://ieeexplore.ieee.org/document/932402

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Digital work: A conceptual clarificationBaiyere, Abayomi; Schneider, Sabrina; Stein, Mari-KlaraProceedings of the Annual Hawaii International Conference on System Sciences2023 / p. 4588−4597 https://doi.org/10125/103192

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artikkel kogumikus

Efficiency experiments on Hadoop and Giraph with PageRankKoschel, Arne; Heine, Felix; Astrova, Irina; Korte, Fred; Rossow, Thomas; Stipkovic, Sebastian24th Euromicro International Conference on Parallel, Distributed, and Network-Based Processing : PDP 2016 : 17-19 February 2016, Heraklion, Crete, Greece : proceedings2016 / p. 328-331 : ill https://doi.org/10.1109/PDP.2016.49

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artikkel kogumikus

Efficient hierarchical approach to test generation for digital systemsUbar, Raimund-Johannes; Raik, JaanIEEE ISQED 2000 : proceedings of the IEEE 2000 1st International Symposium on Quality Electronic Design : March 20-22, 2000, San Jose, California2000 / p. 189-195 : ill https://ieeexplore.ieee.org/document/838873

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Embedded synthetic instruments for board-level testingJutman, Artur; Devadze, Sergei; Aleksejev, Igor; Wenzel, ThomasProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p. : ill https://ieeexplore.ieee.org/document/6233044

artikkel kogumikus

IEEE Computer Society (kirjastus/väljaandja)

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