Otsing - TalTech teadusportaal

kuva

reasta

376

artikkel kogumikus

An improved estimation methodology for hybrid BIST cost calculationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 297-300 : ill https://ieeexplore.ieee.org/document/1423882

artikkel kogumikus

377

artikkel kogumikus

An improved estimation technique for hybrid BIST test set generationJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Korelina, OlgaDDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings2005 / p. 182-185 : ill

artikkel kogumikus

378

artikkel kogumikus

Improved fault emulation for synchronous sequential circuitsRaik, Jaan; Ellervee, Peeter; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 20052005 / p. 72-78 : ill

artikkel kogumikus

379

artikkel kogumikus

Improved testability calculation for digital circuitsUbar, Raimund-Johannes; Heinlaid, J.; Raun, L.19th NORCHIP Conference, Kista, Sweden, 12-13 November 2001 : proceedings2001 / p. 264-270 : ill

artikkel kogumikus

380

artikkel kogumikus

Improving the efficiency of timing simulation in digital circuits by using structurally synthesized BDDsUbar, Raimund-Johannes; Jutman, Artur; Peng, Z.IEEE Norchip Conference2000 / p. 254-261

artikkel kogumikus

381

artikkel kogumikus

Increasing the speed of delay simulation in digital circuitsUbar, Raimund-Johannes; Jutman, ArturThe 7th Biennial Conference on Electronics and Microsystem Technology "Baltic Electronics Conference" : BEC 2000 : October 8 - 11, 2000, Tallinn, Estonia : conference proceedings2000 / p. 31-34 : ill

artikkel kogumikus

382

artikkel kogumikus

Infotehnoloogia teaduskondGordon, Boris; Velmre, Enn; Einer, Lauri; Tamm, Uljas; Meister, Ants; Korsen, Viljo; Märtens, Olev; Parve, Toomas; Ubar, Raimund-Johannes; Min, MartLeiutajaid ja leiutisi Tallinna Tehnikaülikoolis 1922-20072008 / lk. 34-47 : ill https://www.ester.ee/record=b2412718*est

artikkel kogumikus

383

artikkel ajalehes

Innovatsiooni võimalikkusest EestisUbar, Raimund-JohannesPostimees1998 / 9. apr., lk. 9

artikkel ajalehes

384

artikkel ajakirjas

Insener projekteerib usaldust : [ka TTÜ arvutitehnika instituudi töödest]Ubar, Raimund-JohannesArvutimaailm2011 / 7/8, lk. 8-9 : ill https://artiklid.elnet.ee/record=b2423013*est

artikkel ajakirjas

385

artikkel kogumikus

Inseneri ja tehnoloogia võidujooksust nanomeeterdistantsil, ehk, Tehnoloogia valitsemisest ja usaldamisest : akadeemiline ettekanne 10. novembril 2010 Eesti Teaduste AkadeemiasUbar, Raimund-JohannesTallinna Tehnikaülikooli aastaraamat 20102011 / lk. 249-260

artikkel kogumikus

386

artikkel ajalehes

Inseneride ärkamisaegUbar, Raimund-JohannesPostimees2011 / lk. 10

artikkel ajalehes

387

artikkel ajalehes

Inseneriharidus mikroelektroonika ajastulUbar, Raimund-JohannesTehnikaülikool1998 / 16. nov., lk. 6

artikkel ajalehes

388

artikkel kogumikus

Integrated design and test generation under Internet based environment MOSCITOSchneider, Andre; Ivask, Eero; Ubar, Raimund-JohannesEuromicro Symposium on Digital System Design : Architectures, Methods and Tools : September 4-6, 2002, Dortmund, Germany : proceedings2002 / p. 187-194 : ill http://dx.doi.org/10.1109/DSD.2002.1115368

artikkel kogumikus

389

artikkel kogumikus

Integration of digital test tools to the internet-based environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, Günter; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesSCI 2003 : the 7th World Multiconference on Systemics, Cybernetics and Informatics : July 27-30, 2003, Orlando, Florida, USA : proceedings. Volume VIII, Applications of Informatics and Cybernetics in Science and Engineering2003 / p. 136-141 : ill

artikkel kogumikus

390

artikkel ajalehes

Integreeritud elektroonikasüsteemide ja biomeditsiinitehnika tippkeskusUbar, Raimund-JohannesEesti Päevaleht2012 / Eesti teaduse tippkeskused, lk. 3

artikkel ajalehes

391

artikkel kogumikus

Integreeritud elektroonikasüsteemide ja biomeditsiinitehnika tippkeskus CEBEUbar, Raimund-JohannesTallinna Tehnikaülikooli aastaraamat 20102011 / lk. 29-40

artikkel kogumikus

392

artikkel kogumikus

Interactive presentation abstract : automated correction of design errors by edge redirection on high-level decision diagrams [Electronic resource]Karputkin, Anton; Ubar, Raimund-Johannes; Tombak, Mati; Raik, JaanIEEE International High Level Design Validation and Test Workshop (HLDVT'11), November 9-11, 2011, Napa Valley, CA2011 / p. 83 : ill. [CD-ROM] http://doi.ieeecomputersociety.org/10.1109/HLDVT.2011.6113980

artikkel kogumikus

393

artikkel kogumikus

Interactive teaching software "Introduction to digital test"Ubar, Raimund-Johannes; Wuttke, Heinz-Dietrich; Orasson, Elmet45. Internationales Wissenschaftliches Kolloquium, 04.-06.10.2000 : Tagungsband2000 / S. 949-954

artikkel kogumikus

394

artikkel kogumikus

Internet based test generation and fault simulationIvask, Eero; Ubar, Raimund-Johannes; Raik, Jaan; Schneider, AndreIEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 20012001 / p. 57-60 : ill

artikkel kogumikus

395

artikkel kogumikus

Internet-based collaborative test generation with MOSCITO [Electronic resource]Schneider, Andre; Ivask, Eero; Miklos, P.; Raik, Jaan; Diener, Karl-Heinz; Ubar, Raimund-Johannes; Cibakova, Tatiana; Gramatova, ElenaSIGDA publications on CD-ROM : DATE'02 : Design, Automation and Test in Europe, Paris, France, March 4-8, 20022002 / [6] p. [CD-ROM] https://www.cecs.uci.edu/~papers/date07/PAPERS/2002/DATE02/PDFFILES/02E_2.PDF

artikkel kogumikus

396

artikkel kogumikus

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Orasson, Elmet; Wuttke, Heinz-Dietrich23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 659-662 : ill https://ieeexplore.ieee.org/document/1003344

artikkel kogumikus

397

artikkel kogumikus

Internet-based software for teaching test of digital circuitsUbar, Raimund-Johannes; Jutman, Artur; Orasson, Elmet; Raik, Jaan; Evartson, Teet; Wuttke, Heinz-DietrichMicroelectronics education : proceedings of the 4th European Workshop on Microelectronics Education : EWME 2002, Spain, May 23-24, 20022002 / p. 317-320 : ill https://ieeexplore.ieee.org/document/1003344

artikkel kogumikus

398

artikkel kogumikus

Internet-based testability-driven test generation in the virtual environment MOSCITOSchneider, Andre; Diener, Karl-Heinz; Elst, G.; Ivask, Eero; Raik, Jaan; Ubar, Raimund-JohannesInternational Federation for Information Processing IFIP : International Workshop on IP-Based SoC Design 2002 : proceedings : Grenoble, October 30-31, 20022002 / p. 357-362 : ill http://publica.fraunhofer.de/dokumente/N-287433.html

artikkel kogumikus

399

artikkel kogumikus

Investigating defects in digital circuits by Boolean differential equationsKruus, Helena; Orasson, Elmet; Robal, Tarmo; Ubar, Raimund-JohannesThe 4th International Conference "Distance Learning - Educational Sphere of XXI Century" (DLESC'04)2004 / p. 432-435

artikkel kogumikus

400

dissertatsioon

Investigation and development of test generation methods for control part of digital systemsBrik, Marina2002 http://www.ester.ee/record=b1688656*est

dissertatsioon

Ubar, Raimund-Johannes (autor)

teaviku laadid

CV 61

autor 57

tema kohta 28

märksõna 1