Otsing - TalTech teadusportaal

kuva

reasta

501

artikkel kogumikus

New built-in self-test scheme for SoC interconnectJutman, Artur; Ubar, Raimund-Johannes; Raik, JaanThe 9th World Multi-Conference on Systemics, Cybernetics and Informatics : WMSCI 2005 : July 10-13, 2005, Orlando, Florida, USA. Vol. IV2005 / p. 19-24 : ill https://www.researchgate.net/publication/237375234_New_Built-In_Self-Test_Scheme_for_SoC_Interconnect

artikkel kogumikus

502

artikkel kogumikus

New categories of Safe Faults in a processor-based Embedded SystemGürsoy, Cemil Cem; Jenihhin, Maksim; Oyeniran, Adeboye Stephen; Piumatti, Davide; Raik, Jaan; Sonza Reorda, Matteo; Ubar, Raimund-Johannes2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 4 p. : ill https://doi.org/10.1109/DDECS.2019.8724642

artikkel kogumikus

503

artikkel kogumikus

New curricula and a competence centre through TEMPUS at the Technical University of TallinnGlesner, M.; Hollstein, Thomas; Courtois, B.; Amblar, P.; Ubar, Raimund-Johannes; Vainomaa, KaidoWorkshop on Design Methodologies for Microelectronics, Smolenice castle, Slovakia, September 11-13, 1995 : proceedings1995 / p. 347-353

artikkel kogumikus

504

artikkel kogumikus

New fault models and self-test generation for microprocessors using High-Level Decision DiagramsJasnetski, Artjom; Raik, Jaan; Tšertov, Anton; Ubar, Raimund-Johannes2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems DDECS 2015 : 22-24 April 2015, Belgrade, Serbia : proceedings2015 / p. 251-254 : ill

artikkel kogumikus

505

artikkel kogumikus

New method of testability calculation to guide RT-level test generationRaik, Jaan; Nõmmeots, Tanel; Ubar, Raimund-Johannes4th IEEE Latin-American Test Workshop : LATW2003 : Natal, Brazil, February 16-19, 20032003 / p. 46-51 : ill https://link.springer.com/article/10.1007/s10836-005-5288-5

artikkel kogumikus

506

artikkel kogumikus

New technique for hierarchical identification of untestable faults in sequential circuitsKrivenko, Anna; Ubar, Raimund-Johannes; Raik, Jaan; Kruus, MargusInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK kolmanda aastakonverentsi artiklite kogumik : 25.-26. aprill 2008, Voore külalistemaja2008 / lk. 155-158 : ill

artikkel kogumikus

507

artikkel ajakirjas

New test design techniques for fault detection in digital objectsAlango, Villem; Kont, Toomas; Ubar, Raimund-JohannesTallinna Tehnikaülikooli Toimetised1990 / lk. 45-62: ill

artikkel ajakirjas

508

artikkel kogumikus

A novel artificial neural networks based automatic adaptive fault detection technique for analog circuitsPetlenkov, Eduard; Jutman, Artur; Nõmm, Sven; Ubar, Raimund-JohannesBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 167-170 : ill

artikkel kogumikus

509

artikkel kogumikus

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

artikkel kogumikus

510

artikkel kogumikus

Off-line testing of crosstalk induced glitch faults in NoC InterconnectsBengtsson, Tomas; Kumar, Shashi; Jutman, Artur; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 221-225 : ill http://dx.doi.org/10.1109/NORCHP.2006.329215

artikkel kogumikus

511

artikkel kogumikus

Off-line testing of delay faults in NoC interconnectsBengtsson, Tomas; Jutman, Artur; Kumar, Shashi; Peng, Zebo; Ubar, Raimund-Johannes9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 677-680 : ill http://dx.doi.org/10.1109/DSD.2006.72

artikkel kogumikus

512

artikkel kogumikus

On automatic software-based self-test program generation based on high-Level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, AntonLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 177 http://dx.doi.org/10.1109/LATW.2016.7483357

artikkel kogumikus

513

artikkel kogumikus

On efficient logic-level simulation of digital circuits represented by the SSBDD modelJutman, Artur; Raik, Jaan; Ubar, Raimund-Johannes23rd International Conference on Microelectronics : MIEL 2002, Niš, Yugoslavia, 12-15 May 2002 : proceedings. Volume 22002 / p. 621-624 : ill https://ieeexplore.ieee.org/document/1003334

artikkel kogumikus

514

artikkel kogumikus

On reusability of verification assertions for testingJenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes; Tšepurov, AntonBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 151-154 : ill

artikkel kogumikus

515

artikkel kogumikus EST / artikkel kogumikus ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

516

artikkel kogumikus

On the combined use of HLDDs and EFSMs for functional ATPGDi Guglielmo, Giuseppe; Fummi, Franco; Jenihhin, Maksim; Pravadelli, Graziano; Raik, Jaan; Ubar, Raimund-Johannes5th IEEE East-West Design & Test Symposium EWDTS 2007 : September 7-10, 2007, Yerevan, Armenia2007 / p. 503-508 : ill

artikkel kogumikus

517

artikkel ajakirjas

On the reuse of TLM mutation analysis at RTLGuarnieri, Valerio; Hantson, Hanno; Raik, Jaan; Jenihhin, Maksim; Ubar, Raimund-JohannesJournal of electronic testing : theory and applications2012 / p. 435-448 : ill

artikkel ajakirjas

518

artikkel kogumikus

On using genetic algorithm for test generationBrik, Marina; Raik, Jaan; Ubar, Raimund-Johannes; Ivask, EeroBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 233-236 : ill

artikkel kogumikus

519

artikkel kogumikus

On-line monitoring of dialysis adequacy using diasens optical sensor: accurate Kt/V estimation by smoothing algorithmsTalisainen, Aleksei; Kostin, Sergei; Karai, Deniss; Fridolin, Ivo; Ubar, Raimund-JohannesBEC 2010 : 2010 12th Biennial Baltic Electronics Conference : proceedings of the 12th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 4-6, 2010, Tallinn, Estonia2010 / p. 273-276 : ill

artikkel kogumikus

520

artikkel ajakirjas

Open-source JTAG simulator bundle for labsShibin, Konstantin; Devadze, Sergei; Rosin, Vjatšeslav; Jutman, Artur; Ubar, Raimund-JohannesInternational journal of electronics and telecommunications2012 / p. 233-239 : ill https://journals.pan.pl/Content/87192/PDF/32.pdf

artikkel ajakirjas

521

raamat

Operatsioonautomaadid digitaalarvutites : metoodiline materjal1987 https://www.ester.ee/record=b1234461*est

raamat

522

artikkel kogumikus

Optimierte Steuerung der Fehlersuche auf digitalen LeiterplattenThomä, E.; Ubar, Raimund-JohannesProceedings of the 27th International Conference, Technical University of Ilmenau, October, 19821982 / p. 65-68

artikkel kogumikus

523

dissertatsioon

Optimization of built-in self-test in digital systems = Sisseehitatud enesetestimise optimeerimine digitaalsüsteemidesKruus, Helena2011

dissertatsioon

524

artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the IEEE 2nd International Symposium on Industrial Embedded Systems : SIES'2007 : Lisbon, Portugal, 4-6 July 20072007 / p. 71-77 https://ieeexplore.ieee.org/document/4297319

artikkel kogumikus

525

artikkel kogumikus

Optimization of memory-constrained hybrid BIST for testing core-based systemsJervan, Gert; Kruus, Helena; Orasson, Elmet; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 133-136 : ill

artikkel kogumikus

Ubar, Raimund-Johannes (autor)

teaviku laadid

CV 61

autor 57

tema kohta 28

märksõna 1