Otsing - TalTech teadusportaal

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401

artikkel kogumikus

Replication-based deterministic testing of 2-dimensional arrays with highly interrelated cellsAzad, Siavoosh Payandeh; Oyeniran, Adeboye Stephen; Ubar, Raimund-Johannes21st IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems : DDECS 2018 : Budapest, Hungary 25-27 April, 2018 : proceedings2018 / p. 21-26 : ill https://doi.org/10.1109/DDECS.2018.00011

artikkel kogumikus

402

artikkel kogumikus EST / artikkel kogumikus ENG

Requirements for e-testing services in the afgREN cloud-based e-learning systemSaay, Salim; Laanpere, Mart; Norta, AlexanderTechnology Enhanced Assessment, 19th International Conference, TEA 2016, Tallinn Estonia, October 5–6, 2016 : revised selected papers2017 / p. 133-147 https://doi.org/10.1007/978-3-319-57744-9_12 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

403

artikkel kogumikus

Requirements-driven model-based testing of the IP Multimedia SubsystemErnits, Juhan-Peep; Kääramees, Marko; Raiend, Kullo; Kull, AndresBEC 2008 : 2008 International Biennial Baltic Electronics Conference : proceedings of the 11th Biennial Baltic Electronics Conference : Tallinn University of Technology : October 6-8, 2008, Tallinn, Estonia2008 / p. 203-206

artikkel kogumikus

404

artikkel kogumikus

RESCUE: interdependent challenges of reliability, security and quality in nanoelectronic systemsJenihhin, Maksim; Raik, Jaan2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / art. 19690741 , 6 p https://doi.org/10.23919/DATE48585.2020.9116558

artikkel kogumikus

405

artikkel kogumikus

Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-DietrichProceedings of the Eighth IASTED International Conference on Computers and Advanced Technology in Education : August 29-31, 2005, Oranjestad, Aruba2005 / p. 232-237 : ill https://ieeexplore.ieee.org/document/1408779

artikkel kogumikus

406

artikkel kogumikus

Research and training environment for digital design and testUbar, Raimund-Johannes; Wuttke, Heinz-Dietrich34th ASEE/IEEE Frontiers in Education Conference : October 20-23, 2004, Savannah, GA2004 / p. S3F-18-S3F-23 : ill http://dx.doi.org/10.1109/FIE.2004.1408779

artikkel kogumikus

407

artikkel ajakirjas

Research in digital design and test at Tallinn University of TechnologyUbar, Raimund-Johannes; Jervan, Gert; Jutman, Artur; Raik, Jaan; Ellervee, Peeter; Kruus, MargusRadioelectronics & informatics2008 / p. 4-12 : ill http://www.ewdtest.com/ri/%E2%84%96-1-40-january-march-2008/

artikkel ajakirjas

408

artikkel kogumikus

Reseeding using compaction of pre-generated LFSR sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : 31st August to 3rd September 2008, Malta : conference guide2008 / p. 215

artikkel kogumikus

409

artikkel kogumikus

Reseeding using compaction of pre-generated LFSR sub-sequencesJutman, Artur; Aleksejev, Igor; Raik, Jaan; Ubar, Raimund-JohannesICECS 2008 : The 15th IEEE International Conference on Electronics, Circuits and Systems : Malta2008 / p. 1290-1295 : ill http://dx.doi.org/10.1109/ICECS.2008.4675096

artikkel kogumikus

410

artikkel ajalehes

Robot reducing mining industry's environmental impact tested in Estonianews.err.ee2023 Robot reducing mining industry's environmental impact tested in Estonia

artikkel ajalehes

411

artikkel ajakirjas

Role of experimental damage mechanics for the circular economy implementation in cotton industriesHussein, Abrar; Abbas, Muhammad MujtabaJournal of Modern Nanotechnology2021 / 9 p https://doi.org/10.53964/jmn.2021004

artikkel ajakirjas

412

artikkel kogumikus

RT-level identification of potentially testable initialization faultsRaik, Jaan; Fujiwara, Hideo; Krivenko, AnnaThe Ninth IEEE Workshop on RTL and High Level Testing (WRTLT 2008), Sapporo, Japan2008 / [6] p https://www.researchgate.net/publication/234032548_RT-level_identification_of_potentially_testable_initialization_faults

artikkel kogumikus

413

artikkel kogumikus

RT-level test point insertion for sequential circuitsRaik, Jaan; Govind, Vineeth; Ubar, Raimund-JohannesIWoTA 2004 : IEEE 1st International Workshop on Testability Assessment : November 2, 2004, Rennes, France : proceedings2004 / p. 34-40 : ill https://ieeexplore.ieee.org/document/1428412

artikkel kogumikus

414

artikkel kogumikus

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 385-392 : ill https://doi.org/10.1109/AUTEST.2016.7589627

artikkel kogumikus

415

artikkel ajakirjas

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

artikkel ajakirjas

416

artikkel ajakirjas EST / artikkel ajakirjas ENG

Safeguarding female reproductive health against endocrine disrupting chemicals-The FREIA projectDuursen, Majorie B.M. van; Boberg, Julie; Christiansen, Sofie; Jääger, Kersti; Salumets, Andres; Velthut-Meikas, AgneInternational journal of molecular sciences2020 / art. 3215 https://doi.org/10.3390/ijms21093215 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

417

artikkel kogumikus

A scalable technique to identify true critical paths in sequential circuitsUbar, Raimund-Johannes; Kostin, Sergei; Jenihhin, Maksim; Raik, JaanProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 152-157 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

artikkel kogumikus

418

dissertatsioon

Scenario oriented model-based testing = Stsenaariumjuhitud mudelipõhine testimineHalling, Evelin2019 https://digi.lib.ttu.ee/i/?11943

dissertatsioon

419

artikkel kogumikus

Scenario-based Validation for Autonomous Vehicles with Different Fidelity LevelsMalayjerdi, Mohsen; Kaljavesi, Gemb; Diermeyer, Frank; Sell, Raivo2023 IEEE Conference on Intelligent Transportation Systems (ITSC 2023)2023 / 6 p https://doi.org/10.1109/ITSC57777.2023.10422403

artikkel kogumikus

420

dissertatsioon

Scenario-based validation of safety and performance of an autonomous vehicle by a software in loop simulation method = Autonoomse sõiduki ohutuse ja jõudluse stsenaariumipõhine valideerimine tsüklisimulatsiooni meetodi abilMalayjerdi, Mohsen2023 https://doi.org/10.23658/taltech.43/2023 https://digikogu.taltech.ee/et/Item/5d3435ba-8ce1-4da6-8d16-4b279e88c861 https://www.ester.ee/record=b5574240*est

dissertatsioon

Seotud publikatsioonid 5

421

artikkel ajakirjas

Second IEEE East-West Design and Test WorkshopHahanov, Vladimir; Ubar, Raimund-JohannesIEEE journal of design & test of computers2004 / p. 594

artikkel ajakirjas

422

dissertatsioon

Selected issues of modeling, verification and testing of digital systemsJutman, Artur2004 https://www.ester.ee/record=b1989760*est

dissertatsioon

423

dissertatsioon

Self-diagnosis in digital systems = Isediagnoosivad digitaalsüsteemidKostin, Sergei2012 https://www.ester.ee/record=b2757857*est

dissertatsioon

424

artikkel ajalehes

Self-driving bus to be tested in Mustamäe this summer [online resource]news.err.ee2021 "Self-driving bus to be tested in Mustamäe this summer "

artikkel ajalehes

425

artikkel kogumikus

Self-testing of pipe-lined signal processing architectures at-speedGorev, Maksim; Ubar, Raimund-Johannes; Ellervee, PeeterInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu2013 / p. 25-28 : ill

artikkel kogumikus

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