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426

artikkel kogumikus

Sequential circuits BIST synthesis from signal specificationsRaik, Jaan; Jenihhin, Maksim; Adelbert, RainProceedings 23rd NORCHIP Conference : Oulu, Finland, 21-22 November 20052005 / p. 196-199 : ill https://ieeexplore.ieee.org/document/1597023

artikkel kogumikus

427

artikkel kogumikus

Sequential circuits BIST with status bit controlRaik, Jaan; Orasson, Elmet; Ubar, Raimund-JohannesProceedings of the 11th International Conference : Mixed Design of Integrated Circuits and Systems : MIXDES 2004 : Szczecin, Poland, 24-26 June 20042004 / p. 507-510 : ill https://pld.ttu.ee/~raiub/files/aaaaa_pulk/MIXDES/jaan.pdf

artikkel kogumikus

428

artikkel kogumikus

Sequential test set compaction in LFSR reseedingJutman, Artur; Aleksejev, Igor; Raik, JaanDesign and test technology for dependable systems-on-chip2011 / p. 476-493 : ill https://ieeexplore.ieee.org/document/4738292

artikkel kogumikus

429

artikkel kogumikus

Shift register based TPG for at-speed interconnect BISTJutman, ArturMIEL 2004 : 24th International Conference on Microelectronics : Niš, Serbia and Montenegro, 16-19 May 2004 : proceedings. Volume 22004 / p. 751-754 : ill https://ieeexplore.ieee.org/document/1314941?signout=success

artikkel kogumikus

430

artikkel kogumikus

Simulation and automated test development system for digital devicesBirger, AlexanderBEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 11994 / p. 293-295

artikkel kogumikus

431

artikkel ajakirjas EST / artikkel ajakirjas ENG

Single-stage buck–boost inverters: a state-of-the-art surveyAzizi, Mohammadreza; Husev, Oleksandr; Vinnikov, DmitriEnergies2022 / art. 1622 https://doi.org/10.3390/en15051622 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

432

artikkel ajakirjas

Sisseehitatud isetestimine digitaalsüsteemidesKruus, HelenaA & A2011 / lk. 32-37 : ill https://artiklid.elnet.ee/record=b2472216*est

artikkel ajakirjas

433

artikkel kogumikus

Smooth coordination and management of impact of EstLink 2 transmission testing on electricity markets, power system operations and system technical performanceRauhala, T.; Laasonen, M.; Kilter, JakoCIGRE Session 2016 : 21-26 August 2016, Paris, France2016 / p. 1-11

artikkel kogumikus

434

artikkel kogumikus

SoC and board modeling for processor-centric board testingTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei14th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2011 : 31 August - 2 September 2011, Oulu, Finland : proceedings2011 / p. 575-582 : ill https://ieeexplore.ieee.org/document/6037463

artikkel kogumikus

435

artikkel kogumikus

Soft-sensor approach in characterization of VRLA batteriesTenno, Ander; Tenno, Robert; Suntio, TeuvoProc. INTELEC 20012001 / p. 554-562 https://ieeexplore.ieee.org/document/988617/similar#similar

artikkel kogumikus

436

artikkel kogumikus

Software environment for synthesis of testable FSM through decompositionDevadze, Sergei; Sudnitsõn, Aleksander2008 26th International Conference on Microelectronics (MIEL 2008) : proceedings2008 / p. 433-436 https://ieeexplore.ieee.org/document/4559314

artikkel kogumikus

437

dissertatsioon

Software-based self-test for microprocessors with high-level decision diagrams = Mikroprotsessorite tarkvara-põhine enesetestimine kõrgtasandi otsustusdiagrammide põhjalJasnetski, Artjom2018 https://digi.lib.ttu.ee/i/?10629 https://www.ester.ee/record=b5151486*est

dissertatsioon

438

artikkel kogumikus

Software-based self-test generation for microprocessors with high-level decision diagramsUbar, Raimund-Johannes; Tšertov, Anton; Jasnetski, Artjom; Brik, MarinaLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

artikkel kogumikus

439

artikkel ajakirjas

Software-based self-test generation for microprocessors with high-level decision diagramsJasnetski, Artjom; Ubar, Raimund-Johannes; Tšertov, Anton; Brik, MarinaProceedings of the Estonian Academy of Sciences2014 / p. 48-61 : ill https://artiklid.elnet.ee/record=b2665215*est

artikkel ajakirjas

440

raamat

Software-based self-test with decision diagrams for microprocessorsUbar, Raimund-Johannes; Jasnetski, Artjom; Tšertov, Anton; Oyeniran, Adeboye Stephen2018

raamat

441

artikkel ajalehes

Solaride lõpetas testsõidu maastikupõlengu tõttuHansar, Helinapostimees.ee2023 Solaride lõpetas testsõidu maastikupõlengu tõttu

artikkel ajalehes

442

artikkel kogumikus

Some aspects of testing speaking skills in UKPutrova, M.; Gridneva, I.V Regional Seminar East-West Meeting of Language Testing, Tallinn, September 2-4, 1991 : summaries1991 / p. 74-76

artikkel kogumikus

443

artikkel kogumikus EST / artikkel kogumikus ENG

Special session: approximation and fault resiliency of DNN acceleratorsAhmadilivani, Mohammad Hasan; Barbareschi, Mario; Barone, Salvatore; Bosio, Alberto; Daneshtalab, Masoud; Torca, Salvatore Della; Gavarini, Gabriele; Jenihhin, Maksim; Raik, Jaan; Taheri, MahdiProceedings 2023 IEEE 41st VLSI Test Symposium (VTS)2023 / 10 p. : ill https://doi.org/10.1109/VTS56346.2023.10140043 Conference proceeding at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG

444

artikkel kogumikus

Statistical strength of brittle materials : test methods and weibull modulusPreis, IrinaProceedings of the 3rd International Conference Industrial Engineering - New Challenges to SME : 25-27 April 2002, Tallinn, Estonia2002 / p. 205-208 : ill

artikkel kogumikus

445

artikkel kogumikus

Step-wise approximated multi-cycle sine wave for dynamic tests of AD convertersLand, RaulXVI IMEKO World Congress : IMEKO2000 : proceedings of the 5th Workshop on ADC Modelling and Testing (EWADC'2000) : Vienna, Austria, Sept. 25-28, 20002000 / p. 217-220

artikkel kogumikus

446

artikkel kogumikus

Structural fault collapsing by superposition of BDDs for test generation in digital circuitsUbar, Raimund-Johannes; Mironov, Dmitri; Raik, Jaan; Jutman, ArturProceedings of the Eleventh International Symposium on Quality Electronic Design ISQED 2010 : March 22-24, 2010 San Jose, California USA2010 / p. 250-257 : ill https://ieeexplore.ieee.org/document/5450451

artikkel kogumikus

447

artikkel ajalehes

Studioosus testis liiklust : [marsruudil TTÜ peahoone - Viru keskus]Nassar, Bia; Käger, MaarjaStudioosus2008 / märts, lk. 10

artikkel ajalehes

448

artikkel kogumikus

Study of effects of modulated microwaves by method of face maskingRodina, Anastasia; Lass, Jaanus; Bachmann, T.; Hinrikus, HiieProceedings of the 25th Annual International Conference of the IEEE Engineering in Medicine and Biology Society. Vol. 25, A New Beginning for Human Health : volume 4 of 4 : 17-21 September 2003, Cancun, Mexico2003 / p. 3249-3252 https://ieeexplore.ieee.org/document/1280836

artikkel kogumikus

449

artikkel kogumikus

Subsurface of Cr3C2-Ni cermets modified by wear [Electronic resource]Antonov, Maksim; Hussainova, IrinaProceedings of the 10th International Conference of the European Ceramic Society2008 / ? p. [CD-ROM] https://www.academia.edu/24587100/Subsurface_of_Cr_3_C_2_Ni_Cermets_Modified_by_Wear

artikkel kogumikus

450

artikkel kogumikus

A suite of IEEE 1687 benchmark networksTšertov, Anton; Jutman, Artur; Devadze, Sergei2016 IEEE International Test Conference (ITC) : proceedings2016 / art. 6.1, p. 1-10 : ill https://doi.org/10.1109/TEST.2016.7805840

artikkel kogumikus

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