Otsing - TalTech teadusportaal

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226

artikkel kogumikus

High-level decision diagrams based coverage metrics for verification and testJenihhin, Maksim; Raik, Jaan; Tšepurov, Anton; Reinsalu, Uljana; Ubar, Raimund-JohannesLATW 2009 : 10th IEEE Latin American Test Workshop : Buzios, Rio de Janero, Brazil, March 2-5, 20092009 / [6] p. : ill http://dx.doi.org/10.1109/LATW.2009.4813792

artikkel kogumikus

227

artikkel kogumikus

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

artikkel kogumikus

228

artikkel kogumikus

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

artikkel kogumikus

229

artikkel ajakirjas

High-Level Implementation-Independent Functional Software-Based Self-Test for RISC ProcessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanJournal of electronic testing : theory and applications2020 / p. 87-103 https://doi.org/10.1007/s10836-020-05856-7

artikkel ajakirjas

230

artikkel kogumikus

High-level modeling and testing of multiple control faults in digital systemsJasnetski, Artjom; Oyeniran, Adeboye Stephen; Tšertov, Anton; Schölzel, Mario; Ubar, Raimund-JohannesFormal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia2016 / [6] p. : ill http://dx.doi.org/10.1109/DDECS.2016.7482445

artikkel kogumikus

231

artikkel kogumikus

High-level synthesis and test in the MOSCITO-based virtual laboratorySchneider, Andre; Diener, Karl-Heinz; Jervan, Gert; Peng, Z.; Raik, Jaan; Ubar, Raimund-Johannes; Hollstein, Thomas; Glesner, M.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 287-290 : ill

artikkel kogumikus

232

artikkel kogumikus

High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

artikkel kogumikus

233

artikkel kogumikus

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

artikkel kogumikus

234

artikkel kogumikus

High-level test synthesis with hierarchical test generationJervan, Gert; Eles, Petru; Peng, Zebo; Raik, Jaan; Ubar, Raimund-Johannes17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings1999 / p. 291-296

artikkel kogumikus

235

artikkel ajakirjas

Hiired laboris : [arvutihiirte testist TTÜ mehaanikateaduskonna laboris]Urbas, Ando; Einama, KaidoArvutimaailm2010 / 11, lk. 40-45 : ill

artikkel ajakirjas

236

artikkel kogumikus

How to generate high quality tests for digital systemsUbar, Raimund-Johannes; Aarna, Margit; Kruus, Helena; Raik, Jaan2004 International Semiconductor Conference : 27th edition, October 4-6, 2004, Sinaia, Romania : CAS 2004 proceedings. Volume 22004 / p. 459-462 : ill http://dx.doi.org/10.1109/SMICND.2004.1403048

artikkel kogumikus

237

artikkel ajakirjas

Hädavalgustuse automaattestimise näideTamm, TiiuElektriala2015 / lk. 22-23 : ill https://artiklid.elnet.ee/record=b2721082*est

artikkel ajakirjas

238

artikkel kogumikus

A hybrid BIST architecture and its optimization for SoC testingJervan, Gert; Peng, Zebo; Ubar, Raimund-Johannes; Kruus, HelenaProceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California2002 / p. 273-279 : ill https://ieeexplore.ieee.org/document/996750

artikkel kogumikus

239

artikkel ajakirjas

Hybrid BIST methodology for testing core-based systemsJervan, Gert; Ubar, Raimund-Johannes; Peng, ZeboProceedings of the Estonian Academy of Sciences. Engineering2006 / 3-2, p. 300-322 : ill

artikkel ajakirjas

240

artikkel kogumikus

Hybrid BIST optimization for core-based systems with test pattern broadcastingUbar, Raimund-Johannes; Jenihhin, Maksim; Jervan, Gert; Peng, ZeboDELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : 28-30 January 2004, Perth, Australia : proceedings2004 / p. 3-8 : ill https://ieeexplore.ieee.org/document/1409808

artikkel kogumikus

241

artikkel kogumikus

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-Johannes10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 596-603 : ill http://dx.doi.org/10.1109/DSD.2007.4341529

artikkel kogumikus

242

artikkel ajakirjas

Hybrid BIST optimization using reseeding and test set compactionJervan, Gert; Orasson, Elmet; Kruus, Helena; Ubar, Raimund-JohannesMicroprocessors and microsystems2008 / 5/6, p. 254-262 : ill https://www.sciencedirect.com/science/article/abs/pii/S0141933108000288

artikkel ajakirjas

243

artikkel kogumikus

Hybrid BIST scheduling for NoC-based SoCsJervan, Gert; Shchenova, Tatjana; Ubar, Raimund-JohannesProceedings [of] 24th IEEE Norchip Conference : Linköping, Sweden, 20-21 November 20062006 / p. 141-144 : ill https://ieeexplore.ieee.org/document/4126966

artikkel kogumikus

244

artikkel kogumikus

Hybrid BIST time minimization for core-based systems with STUMPS architectureJervan, Gert; Eles, Petru; Peng, Zebo; Ubar, Raimund-Johannes; Jenihhin, Maksim18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings2003 / p. 225-232 : ill https://ieeexplore.ieee.org/document/1250116

artikkel kogumikus

245

dissertatsioon

Hybrid built-in self-test : methods and tools for analysis and optimization of BIST = Sisseehitatud hübriidne isetestimine : meetodid ja vahendid analüüsiks ning optimeerimiseksOrasson, Elmet2007 https://www.ester.ee/record=b2305436*est

dissertatsioon

246

raamat

Hybrid built-in self-test and test generation techniques for digital systemsJervan, Gert2005 https://www.ester.ee/record=b2177537*est

raamat

247

artikkel kogumikus

Hybrid functional BIST for digital systemsMazurova, Natalja; Smahtina, Julia; Ubar, Raimund-JohannesBEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia2004 / p. 205-208 : ill

artikkel kogumikus

248

artikkel kogumikus

Hydraulic conductivity testing method for all-in aggregates and mining waste materialsŠommet, Julija; Pastarus, Jüri-Rivaldo; Sabanov, Sergei10th International Symposium "Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology II : Pärnu, Estonia, January 10-15, 20112011 / p. 122-126 : ill

artikkel kogumikus

249

artikkel ajakirjas

Hygrothermal calculations and laboratory tests on timber-framed wall structuresKalamees, Targo; Vinha, JuhaBuilding and environment2003 / 5, p. 689-697 : ill https://www.sciencedirect.com/science/article/pii/S036013230200207X

artikkel ajakirjas

250

artikkel kogumikus EST / artikkel kogumikus ENG

IEEE European Test Symposium (ETS)Eggersgluss, Stephan; Hamdioui, Said; Jutman, Artur; Michael, Maria K.; Raik, Jaan2019 IEEE International Test Conference (ITC)2019 / 4 p https://doi.org/10.1109/ITC44170.2019.9000148 Conference proceeding at Scopus Article at Scopus Article at WOS

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