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Devadze, Sergei (TTÜ autor)

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Kirjeid leitud 92
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51

artikkel ajakirjas

Learning digital test and diagnostics via internetUbar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of online engineering2007 / 1, [9] p. : ill https://www.db-thueringen.de/servlets/MCRFileNodeServlet/dbt_derivate_00032681/iJOE_1681-1221_03_2007_1_361.pdf

artikkel ajakirjas
52

artikkel ajakirjas

Learning digital test and diagnostics via internet [Electronic resource]Ubar, Raimund-Johannes; Jutman, Artur; Kruus, Margus; Orasson, Elmet; Devadze, Sergei; Wuttke, Heinz-DietrichInternational journal of computing & information sciences2006 / 2, p. 86-96 : ill

artikkel ajakirjas
53

artikkel kogumikus EST / artikkel kogumikus ENG

Marginal PCB assembly defect detection on DDR3/4 memory busOdintsov, Sergei; Jutman, Artur; Devadze, Sergei2017 IEEE International Test Conference (ITC 2017) : Forth Worth, Texas, USA, 31 October - 2 November 20172017 / p. 238-247 : ill https://doi.org/10.1109/TEST.2017.8242070 Conference proceedings at Scopus Article at Scopus Article at WOS

artikkel kogumikus EST / artikkel kogumikus ENG
54

artikkel kogumikus

Microprocessor modeling for board level test access automationDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Ubar, Raimund-JohannesProceedings of 10th IEEE Workshop on RTL and High Level Testing : Hong Kong, November 27-28, 20092009 / ? p

artikkel kogumikus
55

artikkel kogumikus

Microprocessor-based system test using debug interfaceDevadze, Sergei; Jutman, Artur; Tšertov, Anton; Instenberg, Martin; Ubar, Raimund-Johannes26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings2008 / p. 98-101 : ill http://dx.doi.org/10.1109/NORCHP.2008.4738291

artikkel kogumikus
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artikkel kogumikus

On coverage of timing related faults at board levelJutman, Artur; Aleksejev, Igor; Devadze, Sergei2016 21st IEEE European Test Symposium (ETS) : May 23rd-26th 2016, Amsterdam, The Netherlands : proceedings2016 / [2] p. : ill https://doi.org/10.1109/ETS.2016.7519295

artikkel kogumikus
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artikkel kogumikus

On in-system programming of non-volatile memoriesTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomProceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2013, Gdynia, Poland, June 20-22, 20132013 / p. 408-413 : ill

artikkel kogumikus
58

artikkel ajakirjas

On in-system programming of non-volatile memoriesTšertov, Anton; Devadze, Sergei; Jutman, Artur; Jasnetski, ArtjomInternational journal of microelectronics and computer science2013 / p. 72-78 : ill

artikkel ajakirjas
59

artikkel kogumikus

On-line fault classification and handling in IEEE1687 based fault management system for complex SoCsShibin, Konstantin; Devadze, Sergei; Jutman, ArturLATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 20162016 / p. 69-74 : ill https://doi.org/10.1109/LATW.2016.7483342

artikkel kogumikus
60

artikkel ajakirjas

Open-source JTAG simulator bundle for labsShibin, Konstantin; Devadze, Sergei; Rosin, Vjatšeslav; Jutman, Artur; Ubar, Raimund-JohannesInternational journal of electronics and telecommunications2012 / p. 233-239 : ill https://journals.pan.pl/Content/87192/PDF/32.pdf

artikkel ajakirjas
61

artikkel ajakirjas EST / artikkel ajakirjas ENG

Optimization of boundary scan tests using FPGA-based efficient scan architecturesAleksejev, Igor; Devadze, Sergei; Jutman, Artur; Shibin, KonstantinJournal of electronic testing : theory and applications (JETTA)2016 / p. 245-255 : ill https://doi.org/10.1007/s10836-016-5588-y Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG
62

artikkel kogumikus

Parallel critical path tracing fault simulation in sequential circuitsKõusaar, Jaak; Ubar, Raimund-Johannes; Kostin, Sergei; Devadze, Sergei; Raik, JaanProceedings of 25th International Conference MIXED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS : MIXDES 2018 : Gdynia, Poland, June 21–23, 20182018 / p. 305-310 : ill https://doi.org/10.23919/MIXDES.2018.8436880

artikkel kogumikus
63

artikkel kogumikus

Parallel exact critical path tracing fault simulation with reduced memory requirementsDevadze, Sergei; Ubar, Raimund-Johannes; Raik, Jaan; Jutman, Artur4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 20092009 / p. 155-160 : ill https://ieeexplore.ieee.org/document/4938046

artikkel kogumikus
64

artikkel kogumikus

Parallel fault analysis on structurally synthesized BDDsDevadze, Sergei; Ubar, Raimund-JohannesInfo- ja kommunikatsioonitehnoloogia doktorikooli IKTDK teise aastakonverentsi artiklite kogumik : 11.-12. mai 2007, Viinistu kunstimuuseum2007 / lk. 47-50 : ill

artikkel kogumikus
65

artikkel kogumikus

Parallel fault backtracing for calculation of fault coverageUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur43rd International Conference on Microelectronics, Devices and Materials and the Workshop on Electronic Testing : September 12. - September 14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings2007 / p. 165-170 : ill

artikkel kogumikus
66

artikkel kogumikus

Parallel fault backtracing for calculation of fault coverageUbar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturProceedings of the ASP-DAC 2008 : [13th] Asia and South Pacific Design Automation Conference 2008 : January 21-24, 2008, COEX, Seoul, Korea2008 / p. 667-672 : ill https://www.researchgate.net/publication/221153650_Parallel_fault_backtracing_for_calculation_of_fault_coverage

artikkel kogumikus
67

artikkel kogumikus

Parallel X-fault simulation with critical path tracing technique [Electronic resource]Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, ArturDATE 10 : Design, Automation & Test in Europe : Dresden, Germany, 8-12 March, 20102010 / p. 879-884 [CD-ROM] https://www.researchgate.net/publication/221341788_Parallel_X-fault_simulation_with_critical_path_tracing_technique

artikkel kogumikus
68

artikkel kogumikus

Reliable health monitoring and fault management infrastructure based on embedded instrumentation and IEEE 1687Jutman, Artur; Shibin, Konstantin; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 240-249 : ill https://doi.org/10.1109/AUTEST.2016.7589605

artikkel kogumikus
69

artikkel kogumikus

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE AUTOTESTCON 2016 : Anaheim, California, USA, September 12-15, 2016 : proceedings2016 / p. 385-392 : ill https://doi.org/10.1109/AUTEST.2016.7589627

artikkel kogumikus
70

artikkel ajakirjas

Run-time reconfigurable instruments for advanced board-level testingAleksejev, Igor; Jutman, Artur; Devadze, SergeiIEEE instrumentation & measurement magazine2017 / p. 23-30 : ill https://doi.org/10.1109/MIM.2017.8006390

artikkel ajakirjas
71

artikkel kogumikus

SoC and board modeling for processor-centric board testingTšertov, Anton; Ubar, Raimund-Johannes; Jutman, Artur; Devadze, Sergei14th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2011 : 31 August - 2 September 2011, Oulu, Finland : proceedings2011 / p. 575-582 : ill https://ieeexplore.ieee.org/document/6037463

artikkel kogumikus
72

artikkel kogumikus

Software environment for synthesis of testable FSM through decompositionDevadze, Sergei; Sudnitsõn, Aleksander2008 26th International Conference on Microelectronics (MIEL 2008) : proceedings2008 / p. 433-436 https://ieeexplore.ieee.org/document/4559314

artikkel kogumikus
73

artikkel kogumikus

Structurally synthesized multiple input BDDs for speeding up logic-level simulation of digital circuitsMironov, Dmitri; Ubar, Raimund-Johannes; Devadze, Sergei; Raik, Jaan; Jutman, Artur13th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : DSD 2010 : Lille, France, 1-3 September 2010 : proceedings2010 / p. 658-663 : ill

artikkel kogumikus
74

artikkel kogumikus

A suite of IEEE 1687 benchmark networksTšertov, Anton; Jutman, Artur; Devadze, Sergei2016 IEEE International Test Conference (ITC) : proceedings2016 / art. 6.1, p. 1-10 : ill https://doi.org/10.1109/TEST.2016.7805840

artikkel kogumikus
75

artikkel kogumikus

Synchronization, calibration and triggering of IEEE 1687 embedded instrumentsJutman, Artur; Devadze, Sergei; Shibin, KonstantinThe Seventeenth Workshop on RTL and High Level Testing (WRTLT'16) : November 24-25, 2016, Aki Grand Hotel, Hiroshima, Japan2016 / [6] p

artikkel kogumikus

Kirjeid leitud 92, kuvan 51 - 75

eelmine
1
2
3
4
järgmine

1. Anikin, Sergei
2. Astapov, Sergei
3. Bereznev, Sergei
4. Bogatenkov, Sergei
5. Jermolajev, Sergei
6. Kaganski, Sergei, 1987-
7. Kostin, Sergei
8. Letunovitš, Sergei
9. Nazarenko, Sergei
10. Pavlov, Sergei
11. Preis, Sergei, 1959-
12. Sabanov, Sergei, 1974-
13. Soldatov, Sergei, 1933-2003
14. Žari, Sergei
15. Žigailov, Sergei

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