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kuva

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176

artikkel ajakirjas

Fehlerbestimmung in kombinatorischen Scaltungen durch Lösung der Booleschen DifferentialgleichungenUbar, Raimund-JohannesNachrichtentechnik, Elektronik : technisch-wissenschaftlishe Zeitschrift für die gesamte elektronische Nachrichtentechnik1978 / p. 330-334 : ill https://www.ester.ee/record=b1550811*est

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177

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Finite element analysis based technique implementation for fault diagnostic of electrical machinesAkbar, Siddique22nd International Symposium “Topical Problems in the Field of Electrical and Power Engineering”. Doctoral School of Energy and Geotechnology III : Pärnu, Estonia, August 23-26, 20232023 / p. 103-104 https://www.ester.ee/record=b5570906*est

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178

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First results on load model estimation using digital fault recorder measurementsLeinakse, Madis; Sarnet, Tanel; Kangro, Triin; Kilter, Jako16th International Symposium "Topical Problems in the Field of Electrical and Power Engineering. Doctoral School of Energy and Geotechnology III" : Pärnu, Estonia, January 16-21, 20172017 / p. 101-105 : ill http://www.ester.ee/record=b4650094*est

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179

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FPGA based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tihhomirov, Valentin; Ubar, Raimund-JohannesProceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 20042004 / p. 59-62 https://ieeexplore.ieee.org/abstract/document/1423822

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180

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FPGA-based fault emulation of synchronous sequential circuitsEllervee, Peeter; Raik, Jaan; Tammemäe, Kalle; Ubar, Raimund-JohannesIET computers and digital techniques2007 / 2, p. 70-76 : ill https://ieeexplore.ieee.org/abstract/document/1423822

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181

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A framework for combining concurrent checking and online embedded test for low-latency fault detection in NoC routersSaltarelli, Pietro; Niazmand, Behrad; Raik, Jaan; Govind, Vineeth; Hollstein, Thomas; Jervan, Gert; Hariharan, RanganathanNOCS '15 : International Symposium on Networks-on-Chip : Vancouver, BC, Canada, September 28-30, 20152015 / [8] p. : ill http://dx.doi.org/10.1145/2786572.2788713

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182

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From online fault detection to fault management in network-on-chips : a ground-up approachAzad, Siavoosh Payandeh; Niazmand, Behrad; Janson, Karl; Nevin, George; Oyeniran, Adeboye Stephen; Putkaradze, Tsotne; Apneet Kaur; Raik, Jaan; Jervan, Gert; Ubar, Raimund-Johannes; Hollstein, ThomasProceedings 2017 IEEE 20th International Symposium on Design and Diagnotics of Electronic Circuit & Systems(DDECS) : April 19-21, 2017, Dresden, Germany2017 / p. 48-53 : ill https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=7934553

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183

artikkel kogumikus

Generation of tests for the localization of single gate design errors in combinational circuits using the stuck-at fault modelUbar, Raimund-Johannes; Borrione, DominiqueXI Brasilian Symposium on Integrated Circuit Design, September 30 - October 3, 1998, Rio de Janeiro, Brazil : proceedings1998 / p. 51-54 https://ieeexplore.ieee.org/document/715409

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184

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Guardbands in random testingKemnitz, GünterBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 85-88: ill

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185

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Handling of SETs on NoC links by exploitation of inherent redundancy in circular input buffers [Online resource]Janson, Karl; Pihlak, Rene; Azad, Siavoosh Payandeh; Niazmand, Behrad; Jervan, Gert; Raik, JaanBEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 20182018 / 4 p.: ill https://doi.org/10.1109/BEC.2018.8600989

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186

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Harmonic spectrum analysis of induction motor with broken rotor bar faultAsad, Bilal; Vaimann, Toomas; Kallaste, Ants; Belahcen, Anouar59th Annual International Scientific Conference on Power and Electrical Engineering : November 12, 13, 2018, Riga Technical University (RTUCON) : conference proceedings2018 / 7 p. : ill https://doi.org/10.1109/RTUCON.2018.8659842

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187

artikkel ajakirjas EST / artikkel ajakirjas ENG

Health management for self-aware SoCs based on IEEE 1687 infrastructureShibin, Konstantin; Devadze, Sergei; Jutman, Artur; Grabmann, Martin; Pricken, RobinIEEE Design & Test2017 / p. 27-35 : ill https://doi.org/10.1109/MDAT.2017.2750902 Journal metrics at Scopus Article at Scopus Journal metrics at WOS Article at WOS

artikkel ajakirjas EST / artikkel ajakirjas ENG

188

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Hierarchical approaches to test generation and fault simulationUbar, Raimund-JohannesRadioelectronics and informatics2003 / p. 204

artikkel ajakirjas

189

artikkel kogumikus

Hierarchical calculation of malicious faults for evaluating the fault-toleranceUbar, Raimund-Johannes; Devadze, Sergei; Jenihhin, Maksim; Raik, Jaan; Jervan, Gert; Ellervee, PeeterProceedings : Fourth IEEE International Symposium on Electronic Design, Test and Applications : [DELTA 2008] : 23-25 January 2008, Hong Kong, SAR, China2008 / p. 222-227 : ill https://ieeexplore.ieee.org/document/4459544

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190

artikkel kogumikus

Hierarchical design error diagnosis in combinational circuits by stuck-at fault test patternsUbar, Raimund-Johannes; Jutman, ArturProceedings of the 6th International Conference on Mixed Design of Integrated Circuits and Systems : MIXDES'99 : Krakow, Poland, 17-19 June 19991999 / p. 437-442 : ill https://www.sciencedirect.com/science/article/pii/S0026271499002036

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191

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Hierarchical fault diagnosis in embedded digital systems with multi-level decision diagrams [Electronic resource]Ubar, Raimund-Johannes; Evartson, Teet; Lensen, Harri; Aarna, Margit5th International Conference on Industrial Automation = Cinquieme Conference Internationale sur l'Automatisation Industrielle : June 11-13, 2007, Montreal, Canada2007 / [6] p. [CD-ROM]

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192

artikkel kogumikus

Hierarchical fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaInternational Symposium on Signals, Circuits and Systems : SCS 2001 : July 10-11, 2001, Iasi, Romania : proceedings2001 / p. 181-184 : ill

artikkel kogumikus

193

artikkel kogumikus

Hierarchical identification of NBTI-critical gates in nanoscale logicKostin, Sergei; Raik, Jaan; Ubar, Raimund-Johannes; Jenihhin, MaksimLATW2014 : 15th IEEE Latin-American Test Workshop : Fortaleza, Brazil, March 12th-15th, 20142014 / [6] p. : ill

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194

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Hierarchical identification of untestable faults in sequential circuitsRaik, Jaan; Ubar, Raimund-Johannes; Krivenko, Anna; Kruus, Margus10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings2007 / p. 668-671 : ill http://dx.doi.org/10.1109/DSD.2007.4341539

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195

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High level fault modeling in digital systemsUbar, Raimund-Johannes; Aarna, Margit; Brik, Marina; Raik, JaanSynergies between Information and Automation : 49. Internationales Wissenschaftliches Kolloquium, 27.-30.9.2004, Technische Universität Ilmenau, Germany. Volume 22004 / p. 486-491

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196

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High-frequency current sensor for power network on-line mea[s]urementsKütt, Lauri; Järvik, Jaan; Vaimann, Toomas; Shafiq, Muhammad; Lehtonen, Matti; Kilter, JakoProceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 12012 / p. 367-371 : ill https://www.researchgate.net/publication/262674502_High-Frequency_Current_Sensor_for_Power_Network_On-line_Measurements

artikkel kogumikus

197

artikkel kogumikus

High-level decision diagram based fault models for targeting FSMsRaik, Jaan; Ubar, Raimund-Johannes; Viilukas, Taavi9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings2006 / p. 353-358 : ill http://dx.doi.org/10.1109/DSD.2006.60

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198

artikkel kogumikus

High-level design error diagnosis using backtrace on decision diagramsRaik, Jaan; Repinski, Urmas; Ubar, Raimund-Johannes; Jenihhin, Maksim; Tšepurov, Anton28th Norchip Conference : Tampere, Finland, 15-16 November 2010 : conference program and papers2010 / [4] p. : ill http://dx.doi.org/10.1109/NORCHIP.2010.5669486

artikkel kogumikus

199

artikkel kogumikus

High-level fault diagnosis in RISC processors with Implementation-Independent Functional TestOyeniran, Adeboye Stephen; Jenihhin, Maksim; Raik, Jaan; Ubar, Raimund-Johannes2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 20222022 / p. 32-37 https://doi.org/10.1109/ISVLSI54635.2022.00019

artikkel kogumikus

200

artikkel kogumikus

High-level functional test generation for microprocessor modulesOyeniran, Adeboye Stephen; Ubar, Raimund-JohannesProceedings of 26th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2019 : Rzeszów, Poland, June 27 - 29, 20192019 / p. 356-361 : ill https://doi.org/10.23919/MIXDES.2019.8787131

artikkel kogumikus

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