Otsing - TalTech teadusportaal

kuva

reasta

76

artikkel kogumikus

Defect oriented fault coverage of 100stuck-at fault test setsBlyzniuk, M.; Cibakova, Tatiana; Gramatova, Elena; Kuzmicz, W.; Lobur, M.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 20002000 / p. 511-516 : ill https://repo.pw.edu.pl/info.seam?ps=20&id=WUT7e20f35d67ae45d3b2d1264d7a4ba722&lang=en&pn=1&cid=156607

artikkel kogumikus

77

artikkel kogumikus

Defect-oriented fault simulation and test generation in digital circuitsKuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesIEEE ISQED 2001 : proceedings of the IEEE 2001 2nd International Symposium on Quality Electronic Design : March 26-28, 2001, San Jose, California2001 / p. 365-371 https://ieeexplore.ieee.org/document/915257

artikkel kogumikus

78

artikkel ajakirjas

Defect-oriented mixed-level fault simulation in digital systemsUbar, Raimund-Johannes; Raik, Jaan; Ivask, Eero; Brik, MarinaFacta Universitatis [Niš]. Series electronics and energetics2002 / 1, April, p. 123-136 : ill

artikkel ajakirjas

79

artikkel kogumikus

Defect-oriented modul-level fault diagnosis in digital circuitsKostin, Sergei; Ubar, Raimund-Johannes; Raik, JaanProceedings of the 2011 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 13-15, 2011, Gottbus, Germany2011 / p. 81-86

artikkel kogumikus

80

artikkel kogumikus

Defect-oriented test generation and fault simulation in the environment of MOSCITOSchneider, Andre; Diener, Karl-Heinz; Gramatova, Elena; Fisherova, Maria; Ivask, Eero; Ubar, Raimund-Johannes; Pleskacz, Witold A.; Kuzmicz, W.BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia2002 / p. 303-306 : ill

artikkel kogumikus

81

artikkel kogumikus

Defect-oriented test generation using probabilistic estimationCibakova, Tatiana; Fischerova, Maria; Gramatova, Elena; Kuzmicz, W.; Pleskacz, Witold A.; Raik, Jaan; Ubar, Raimund-JohannesProceedings of the 8th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2001 : Zakopane, Poland, 21-23 June 20002001 / p. 131-136 : ill

artikkel kogumikus

82

raamat

Defektide ja rikete seoste analüüs : lepingu Lep16039 aruanne [Võrguväljaanne]Palu, Ivo; Keel, Matti; Tammoja, Heiki2016 https://www.elektrilevi.ee/-/doc/6305157/ettevottest/defektide_rikete_aruanne.pdf

raamat

83

artikkel kogumikus

DefSim - the defective ICPleskacz, Witold A.; Jutman, Artur; Ubar, Raimund-Johannes; Devadze, SergeiDATE 2007 : Design Automation and Test in Europe : Nice, France, April 16-20, 20072007 / p. s96 (2 p.)

artikkel kogumikus

84

artikkel kogumikus

Delay fault investigation at the register transfer levelFischerova, Maria; Gramatova, ElenaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 141-144

artikkel kogumikus

85

dissertatsioon

Dependability improvements of NoC-based systems = Töökindluse parandamine kiipvõrkudel põhinevates süsteemidesNiazmand, Behrad2018 https://digi.lib.ttu.ee/i/?9879 https://www.ester.ee/record=b4907650*est

dissertatsioon

86

artikkel kogumikus EST / artikkel kogumikus ENG

Dependence of the carrier removal rate in 4H-SIC PN structures on irradiation temperatureLebedev, Alexander A.; Davydovskaya, Klavdya S.; Kozlovski, Vitali V.; Korolkov, Oleg; Sleptsuk, Natalja; Toompuu, JanaSilicon Carbide and Related Materials 2018 : 12th European Conference on Silicon Carbide and Related Materials (ECSCRM 2018) : Selected, peer reviewed papers from the European Conference on Silicon Carbide and Related Materials (ECSCRM 2018), September 2-6, 2018,Birmingham, UK2019 / p. 730-733 https://doi.org/10.4028/www.scientific.net/MSF.963.730 Conference proceeding at Scopus Article at Scopus

artikkel kogumikus EST / artikkel kogumikus ENG

87

artikkel ajakirjas

Design error diagnosis in digital circuits with stuck-at fault modelJutman, Artur; Ubar, Raimund-JohannesMicroelectronics reliability2000 / 2, p. 307-320 : ill

artikkel ajakirjas

88

artikkel kogumikus

Design error diagnosis in digital circuits without error modelUbar, Raimund-Johannes; Borrione, DominiqueVLSI : systems on a chip : IFIP TC10 WG10.5 Tenth International Conference on Very Large Scale Integration (VLSI'99) : December 1-4, 1999, Lisboa, Portugal1999 / p. 281-292 : ill https://www.researchgate.net/publication/292157544_Design_Error_Diagnosis_in_Digital_Circuits_without_Error_Model

artikkel kogumikus

89

artikkel kogumikus

Design error diagnosis in scan-path designsUbar, Raimund-Johannes2nd IEEE Latin American Test Workshop : LATW 2001 : Cancun, Mexico, February 11-14, 2001 : digest of papers2001 / p. 162-168 : ill

artikkel kogumikus

90

artikkel ajakirjas

Design error diagnosis with re-synthesis in combinational circuitsUbar, Raimund-JohannesJournal of electronic testing : theory and applications2003 / 1, p. 73-82 : ill https://link.springer.com/article/10.1023/A:1021948013402

artikkel ajakirjas

91

artikkel kogumikus

Design error localization in digital circuits by stuck-at fault test patternsJutman, Artur; Ubar, Raimund-Johannes[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 22000 / p. 723-726 https://ieeexplore.ieee.org/document/838792

artikkel kogumikus

92

artikkel kogumikus

Design issues of redundant protection and supervision system for the special purpose power converters [Electronic resource]Vinnikov, Dmitri; Roasto, Indrek; Vodovozov, ValeryInternational Conference on Renewable Energies and Power Quality : ICREPQ'09 : Valencia, Spain, 15th to 17th April 20092009 / [6] p. [CD-ROM] https://www.icrepq.com/ICREPQ%2709/356-vinnikov.pdf

artikkel kogumikus

93

artikkel kogumikus

Design technologies for system-on-chip : fault simulation in complex digital designsHahanov, V.; Ubar, Raimund-JohannesАвтоматизированные системы управления и приборы автоматики, 20032003 / p. 16-35

artikkel kogumikus

94

artikkel ajakirjas EST / artikkel ajakirjas ENG

Detection of induction motor broken bars in grid and frequency converter supplyVaimann, Toomas; Belahcen, Anouar; Martinez, Javier; Kilk, AleksanderPrzeglad elektrotechniczny2014 / p. 90-94 : ill https://www.pe.org.pl/articles/2014/1/22.pdf Journal metrics at Scopus Article at Scopus

artikkel ajakirjas EST / artikkel ajakirjas ENG

95

artikkel kogumikus

Determination of the nonfaulty limits of circuit characteristics in the fault identification of discrete-type circuitsGadzheva, ElissavetaBEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings1996 / p. 97-100: ill

artikkel kogumikus

96

artikkel kogumikus

Determined-safe faults identification : a step towards ISO26262 hardware compliant designsAugusto da Silva, Felipe; Bagbaba, Ahmet Cagri; Sartoni, Sandro; Cantoro, Riccardo; Sonza Reorda, Matteo; Hamdioui, Said; Sauer, Christian2020 25th IEEE European Test Symposium (ETS)2020 / 6 p. : ill https://doi.org/10.1109/ETS48528.2020.9131568

artikkel kogumikus

Seotud publikatsioonid 1

Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks

97

artikkel kogumikus

Determining the unknown faults of the HV overhead linesTaklaja, Paul; Niitsoo, Jaan; Palu, IvoProceedings of the 13th International Scientific Conference Electric Power Engineering 2012 : EPE 2012 : Brno. Vol. 12012 / p. 187-192 : ill

artikkel kogumikus

98

dissertatsioon

Development of a Substation Risk-Based Asset Management Decision-Making Process in the Case of Insuffcient Information = Alajaama riskipõhise varahalduse otsustusprotsessi arendamine ebapiisava sisendteabe tingimustesAndreesen, Guido2025 https://www.ester.ee/record=b5754736*est https://digikogu.taltech.ee/et/Item/49e349b9-c62b-4a9e-af14-5c8408e54028 https://doi.org/10.23658/taltech.52/2025

dissertatsioon

Seotud publikatsioonid 4

99

artikkel kogumikus

A DFT scheme to improve coverage of hard-to-detect faults in FinFET SRAMsCardoso Medeiros, Guilherme; Gürsoy, Cemil Cem; Fieback, Moritz; Wu, Lizhou; Jenihhin, Maksim; Taouil, Mottaqiallah; Hamdioui, Said2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 9-13 March 2020, Grenoble, France : proceedings2020 / p. 792-797 https://doi.org/10.23919/DATE48585.2020.9116278

artikkel kogumikus

100

dissertatsioon

DfT-based external test and diagnosis of mesh-like networks on chips = Testitavusel põhinev välise testi ja diagnoosi meetod kahemõõtmelistele kiipvõrkudeleGovind, Vineeth2009 https://digi.lib.ttu.ee/i/?454 https://www.ester.ee/record=b2539211*est

dissertatsioon

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