prindi

Fast static compaction of test sequences using implications and greedy search

autor
Raik, Jaan
Jutman, Artur
Ubar, Raimund-Johannes
vastutusandmed
J.Raik, A.Jutman, R.Ubar
allikas
ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest
ilmumiskoht
[S. l.]
ilmumisaasta
2001
leheküljed
p. 207-209 : ill
märkused
Bibliogr.: 13 ref
Raik, J., Jutman, A., Ubar, R.-J. Fast static compaction of test sequences using implications and greedy search // ETW 2001 : IEEE European Test Workshop : Stockholm, May 29 June 1, 2001 : informal digest. [S. l.], 2001. p. 207-209 : ill.