An approach for verification assertions reuse in RTL test pattern generation
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Maksim Jenihhin, Jaan Raik, Hideo Fujiwara, Raimund Ubar, Taavi Viilukas
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Digest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China
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[Shanghai]
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p. 107-110 : ill
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IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010
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Shanghai, China
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Bibliogr.: 25 ref
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Jenihhin, M., Raik, J., Fujiwara, H., Ubar, R., Viilukas, T. An approach for verification assertions reuse in RTL test pattern generation // Digest of papers : IEEE 11th Workshop on RTL and High Level Testing : WRTLT'10 : December 5-6, 2010, Shanghai, China. [Shanghai], 2010. p. 107-110 : ill.