täiskirje prindi

Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs

autor
vastutusandmed
Raimund Ubar, Lembit Jürimägi, Elmet Orasson, and Jaan Raik
allikas
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 23-45 : ill
seeria-sari
IFIP advances in information and communication technology ; 483
konverentsi nimetus, aeg
VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference, October 5-7, 2015
konverentsi toimumispaik
Daejeon, Korea
leitav
ISSN
1868-4238
ISBN
978-3-319-46096-3
märkused
Bibliogr.: 35 ref
Saadaval ka e-raamatuna
teaduspublikatsioon
teaduspublikatsioon
TTÜ struktuuriüksus
keel
inglise
Ubar, R., Jürimägi, L., Orasson, E., Raik, J. Fault collapsing in digital circuits using fast fault dominance and equivalence analysis with SSBDDs // VLSI-SoC : Design for Reliability, Security, and Low Power : 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015 Daejeon, Korea, October 5-7, 2015 : revised selected papers. [S.l.] : Springer, 2016. p. 23-45 : ill. (IFIP advances in information and communication technology ; 483). https://doi.org/10.1007/978-3-319-46097-0_2