prindi

Hybrid BIST optimization using reseeding and test set compaction

autor
Jervan, Gert
Orasson, Elmet
Kruus, Helena
Ubar, Raimund-Johannes
vastutusandmed
Gert Jervan, Elmet Orasson, Helena Kruus, Raimund Ubar
allikas
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
ilmumiskoht
Los Alamitos
kirjastus/väljaandja
IEEE Computer Society
ilmumisaasta
2007
leheküljed
p. 596-603 : ill
konverentsi nimetus, aeg
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 29-31 August, 2007
konverentsi toimumispaik
Lübeck, Germany
leitav
http://dx.doi.org/10.1109/DSD.2007.4341529
märksõna
integraallülitused
digitaalelektroonika
testimine
ISBN
978-0-7695-2978-3
märkused
Bibliogr.: 16 ref
TTÜ struktuuriüksus
arvutitehnika instituut
keel
inglise
Jervan, G., Orasson, E., Kruus, H., Ubar, R.-J. Hybrid BIST optimization using reseeding and test set compaction // 10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings. Los Alamitos : IEEE Computer Society, 2007. p. 596-603 : ill. http://dx.doi.org/10.1109/DSD.2007.4341529