Parallel exact critical path tracing fault simulation with reduced memory requirements
vastutusandmed
Sergei Devadze, Raimund-Johannes Ubar, Jaan Raik, Artur Jutman
allikas
4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009
ilmumiskoht
[S.l.]
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 155-160 : ill
ISBN
978-1-4244-4321-5
märkused
Bibliogr.: 18 ref
keel
inglise
Devadze, S., Ubar, R.-J., Raik, J., Jutman, A. Parallel exact critical path tracing fault simulation with reduced memory requirements // 4th International Conference on Design and Technology of Integrated Systems in Nanoscal Era : DTIS'09 : Cairo, Egypt, April 6-9, 2009. [S.l.] : IEEE, 2009. p. 155-160 : ill.