prindi

An iterative approach to test time minimization for parallel hybrid BIST architecture

autor
Ubar, Raimund-Johannes
Jenihhin, Maksim
Jervan, Gert
Peng, Z.
vastutusandmed
Raimund Ubar, Maksim Jenihhin, Gert Jervan, Zebo Peng
allikas
5th IEEE Latin-American Test Workshop - LATW 2004 : Cartagena, Colombia, 2004 : digest of papers
ilmumiskoht
[S.l.]
kirjastus/väljaandja
IEEE
ilmumisaasta
2004
leheküljed
p. 98-103 : ill
konverentsi nimetus, aeg
5th IEEE Latin-American Test Workshop, Cartagena, Colombia, March 8-10, 2004
konverentsi toimumispaik
Cartagena, Colombia
märkused
Bibliogr.: 14 ref
keel
inglise
Ubar, R.-J., Jenihhin, M., Jervan, G., Peng, Z. An iterative approach to test time minimization for parallel hybrid BIST architecture // 5th IEEE Latin-American Test Workshop - LATW 2004 : Cartagena, Colombia, 2004 : digest of papers. [S.l.] : IEEE, 2004. p. 98-103 : ill.