prindi

Low-area boundary BIST architecture for mesh-like network-on-chip

autor
Raik, Jaan
Govind, Vineeth
vastutusandmed
Jaan Raik, Vineeth Govind
allikas
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
ilmumiskoht
[S. l.]
kirjastus/väljaandja
IEEE
ilmumisaasta
2012
leheküljed
p. 95-100 : ill
konverentsi nimetus, aeg
IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), April 18-20, 2012
konverentsi toimumispaik
Tallinn
märksõna
integraallülitused
testimine
ISBN
978-1-4673-1185-4
märkused
Bibliogr.: 18 ref
keel
inglise
Raik, J., Govind, V. Low-area boundary BIST architecture for mesh-like network-on-chip // Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia. [S. l.] : IEEE, 2012. p. 95-100 : ill.