prindi

Testability analysis for efficient register-transfer level test generation [Electronic resource]

autor
Nõmmeots, Tanel
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
T. Nõmmeots, J. Raik, R. Ubar
allikas
9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 2002
ilmumiskoht
[S.l.]
ilmumisaasta
2002
leheküljed
[4] p. [CD-ROM]
konverentsi nimetus, aeg
9th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDES 2002), June 20-22, 2002
konverentsi toimumispaik
Wroclaw, Poland
ISBN
83-89003-26-0
märkused
Bibliogr.: 16 ref
keel
inglise
Nõmmeots, T., Raik, J., Ubar, R.-J. Testability analysis for efficient register-transfer level test generation [Electronic resource] // 9th International Conference MIXDES 2002 : Mixed Design of Integrated Circuits and Systems, Wroclaw, Poland, 20-22 June 2002. [S.l.], 2002. [4] p. [CD-ROM].