Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches
vastutusandmed
J. Raik, R. Ubar
allikas
World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1
ilmumiskoht
[S.l.]
ilmumisaasta
leheküljed
p. 374-381: ill
ISBN
980-07-5078-9
märkused
Bibl. 27 ref
keel
inglise
Raik, J., Ubar, R. Hierarchical test generation for digital systems based on combining bottom-up and top-down approaches // World Multiconference on Systemics, Cybernetics and Informatics, July 12-16, 1998, Orlando, Florida : proceedings. Vol. 1. [S.l.], 1998. p. 374-381: ill.