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board test (võtmesõna)

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Kirjeid leitud 2
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ekspordi kõik päringu tulemused (2)
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artikkel kogumikus

A new FPGA-based detection method for spurious variations in PCBA power distribution networkOdintsov, Sergei; Bozzoli, Ludovica; De Sio, Corrado; Sterpone, Luca; Jutman, Artur2019 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), Cluj-Napoca, Romania : proceedings2019 / 6 p. : ill https://doi.org/10.1109/DDECS.2019.8724662

artikkel kogumikus
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artikkel kogumikus

Re-using chip level DFT at board levelGu, Xinli; Jutman, ArturProceedings : 2012 17th IEEE European Test Symposium (ETS) : May 28th–June 1st, 2012, Annecy, France2012 / 1 p https://www.academia.edu/25351525/Re_using_chip_level_DFT_at_board_level

artikkel kogumikus

Kirjeid leitud 2, kuvan 1 - 2

1. board test
2. processor-centric board test
3. Board and System Test
4. across-the-board cuts
5. board
6. board composition
7. board diagnosis
8. board diversity
9. board of directors
10. Estonian Police and Border Guard Board (PPA)
11. laminate embedded printed circuit board
12. off-board charger
13. off-board charger (OBC)
14. off-board chargers
15. on-board charger (OBC)
16. on-board chargers
17. processor-centric board
18. single board computer
19. single-board computer
20. accelerated shelf-life test
21. adaptive test strategy generation
22. antigen test
23. Applications in Test Engineering
24. ASTM G65 dry sand rubber wheel abrasion test
25. Automated Synthesis of Software-based Self-test
26. automated test environment
27. automated test pattern generation
28. automatic test case generation
29. automatic test pattern generation
30. automatic test program generation
31. Auvergne test-bed
32. battery test
33. behavioral test
34. behaviour level test generation
35. bending test
36. bit-error rate test
37. bounds test
38. built-in self-test
39. capillary condensation redistribution test
40. chi-square test
41. closed bottle test
42. cognitive screening test
43. compartment fire test
44. compartment test
45. cone penetration test (CPT)
46. COVID-19 antigen test
47. cutting test
48. cybersecurity test bed
49. DDR4 interconnect test
50. design and test
51. design-for-test
52. deterministic test sequences
53. diagnostic test
54. digital test
55. Digital test and testable design
56. double-pulse test
57. drawing test
58. dry droplet antimicrobial test
59. Embedded figures test
60. embedded test
61. fan pressurisation test
62. final test result prediction
63. four-point bending test
64. FPGA based test
65. FPGA-Assisted Test
66. FPGA-centric test
67. functional self-test
68. functional test generation
69. Granger causality test
70. hardness test
71. Hierarchical Multi-level Test Generation
72. high-level synthesis for test
73. high-level test data generation
74. highlevel test generation
75. high-speed serial link test
76. IEEE 9 bus test system
77. implementation-independent test generation
78. in situ tensile test in SEM
79. industrial field test
80. in-situ tensile test in SEM
81. Johansen cointegration test
82. Kolmogorov-Smirnov test
83. load test
84. logic built-in self-test
85. Luria alternating series test
86. Mann–Kendall test
87. Mann-Kendall trend test
88. memory interconnect test
89. microprocessor test
90. Model test
91. multiplier test
92. offline test generation
93. orthogonal test
94. package test analysis
95. parallel design and test
96. performance test
97. piezocone penetration test (CPTu)
98. Point Load Test index
99. pressurisation test
100. progressive damage test
101. Provably Correct Test Development
102. provably correct test generation
103. pseudo-exhaustive test
104. purity test
105. real-time room temperature test
106. rolling thin film oven test
107. rtioco-based timed test sequences
108. seasonal Mann Kendall test
109. seismic piezocone penetration test
110. self-test
111. self-test architectures
112. sentence writing test
113. serial sevens test
114. ship towing test tank
115. similar material simulation test
116. small-scale fire test
117. small‐scale test
118. software based self-test
119. software-based self-test
120. software-based self-test (SBST)
121. soil phosphorus (P) test
122. standard test method
123. static load test
124. static-dynamic probing test (SDT)
125. stress test
126. system level test
127. teaching design and test of systems
128. tensile test
129. tensile test
130. test
131. Test Adapters
132. test and evaluation platform
133. test automation
134. test bench
135. test coverage
136. test driven development
137. test driven modelling
138. test embankment
139. test equipment
140. test generation
141. test generation and fault diagnosis
142. Test Group Generation for Detecting Multiple Faults
143. test groups
144. test model design
145. test optimization
146. test packets
147. test path synthesis
148. test patterns
149. test point insertion
150. test program generation
151. test reference year
152. test replication
153. test scenario description language
154. test-bed
155. test-chips
156. test-house
157. test-pattern
158. test-suite reduction
159. Three-point bending test
160. unit root test
161. usability platform test
162. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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