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diagnostic test (keyword)
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1
book article
Assessment of diagnostic test for automated bug localization
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[6] p. : ill
book article
Number of records 1, displaying
1 - 1
keyword
159
1.
diagnostic test
2.
random diagnostic tests
3.
rapid diagnostic tests
4.
diagnostic
5.
diagnostic accuracy
6.
diagnostic and statistical manual of mental disorders (DSM-5)
7.
diagnostic coverage
8.
diagnostic data
9.
diagnostic resolution
10.
diagnostic tools
11.
diagnostic traces
12.
fault diagnostic
13.
fault diagnostic resolution
14.
In vitro diagnostic medical devices
15.
accelerated shelf-life test
16.
adaptive test strategy generation
17.
antigen test
18.
Applications in Test Engineering
19.
ASTM G65 dry sand rubber wheel abrasion test
20.
Automated Synthesis of Software-based Self-test
21.
automated test environment
22.
automated test pattern generation
23.
automatic test case generation
24.
automatic test pattern generation
25.
automatic test program generation
26.
Auvergne test-bed
27.
battery test
28.
behavioral test
29.
behaviour level test generation
30.
bending test
31.
bit-error rate test
32.
Board and System Test
33.
board test
34.
bounds test
35.
built-in self-test
36.
capillary condensation redistribution test
37.
chi-square test
38.
closed bottle test
39.
cognitive screening test
40.
compartment fire test
41.
compartment test
42.
cone penetration test (CPT)
43.
COVID-19 antigen test
44.
cutting test
45.
cybersecurity test bed
46.
DDR4 interconnect test
47.
design and test
48.
design-for-test
49.
deterministic test sequences
50.
digital test
51.
Digital test and testable design
52.
double-pulse test
53.
drawing test
54.
dry droplet antimicrobial test
55.
Embedded figures test
56.
embedded test
57.
fan pressurisation test
58.
final test result prediction
59.
four-point bending test
60.
FPGA based test
61.
FPGA-Assisted Test
62.
FPGA-centric test
63.
functional self-test
64.
functional test generation
65.
Granger causality test
66.
hardness test
67.
Hierarchical Multi-level Test Generation
68.
high-level synthesis for test
69.
high-level test data generation
70.
highlevel test generation
71.
high-speed serial link test
72.
IEEE 9 bus test system
73.
implementation-independent test generation
74.
in situ tensile test in SEM
75.
industrial field test
76.
in-situ tensile test in SEM
77.
Johansen cointegration test
78.
Kolmogorov-Smirnov test
79.
load test
80.
logic built-in self-test
81.
Luria alternating series test
82.
Mann–Kendall test
83.
Mann-Kendall trend test
84.
memory interconnect test
85.
microprocessor test
86.
Model test
87.
multiplier test
88.
offline test generation
89.
orthogonal test
90.
package test analysis
91.
parallel design and test
92.
performance test
93.
piezocone penetration test (CPTu)
94.
Point Load Test index
95.
pressurisation test
96.
processor-centric board test
97.
progressive damage test
98.
Provably Correct Test Development
99.
provably correct test generation
100.
pseudo-exhaustive test
101.
purity test
102.
real-time room temperature test
103.
rolling thin film oven test
104.
rtioco-based timed test sequences
105.
seasonal Mann Kendall test
106.
seismic piezocone penetration test
107.
self-test
108.
self-test architectures
109.
sentence writing test
110.
serial sevens test
111.
ship towing test tank
112.
similar material simulation test
113.
small-scale fire test
114.
small‐scale test
115.
software based self-test
116.
software-based self-test
117.
software-based self-test (SBST)
118.
soil phosphorus (P) test
119.
standard test method
120.
static load test
121.
static-dynamic probing test (SDT)
122.
stress test
123.
system level test
124.
teaching design and test of systems
125.
tensile test
126.
tensile test
127.
test
128.
Test Adapters
129.
test and evaluation platform
130.
test automation
131.
test bench
132.
test coverage
133.
test driven development
134.
test driven modelling
135.
test embankment
136.
test equipment
137.
test generation
138.
test generation and fault diagnosis
139.
Test Group Generation for Detecting Multiple Faults
140.
test groups
141.
test model design
142.
test optimization
143.
test packets
144.
test path synthesis
145.
test patterns
146.
test point insertion
147.
test program generation
148.
test reference year
149.
test replication
150.
test scenario description language
151.
test-bed
152.
test-chips
153.
test-house
154.
test-pattern
155.
test-suite reduction
156.
Three-point bending test
157.
unit root test
158.
usability platform test
159.
1995 ECC benchmark test
subject term
3
1.
Laser Diagnostic Instruments
2.
European Test Symposium (ETS)
3.
16PF (test)
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