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diagnostic test (keyword)
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1
book article
Assessment of diagnostic test for automated bug localization
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[6] p. : ill
book article
Number of records 1, displaying
1 - 1
keyword
142
1.
diagnostic test
2.
random diagnostic tests
3.
rapid diagnostic tests
4.
diagnostic coverage
5.
diagnostic data
6.
diagnostic resolution
7.
diagnostic tools
8.
diagnostic traces
9.
fault diagnostic
10.
fault diagnostic resolution
11.
In vitro diagnostic medical devices
12.
accelerated shelf-life test
13.
adaptive test strategy generation
14.
antigen test
15.
ASTM G65 dry sand rubber wheel abrasion test
16.
automated test environment
17.
automated test pattern generation
18.
automatic test case generation
19.
automatic test pattern generation
20.
automatic test program generation
21.
Auvergne test-bed
22.
battery test
23.
behavioral test
24.
behaviour level test generation
25.
bending test
26.
bit-error rate test
27.
Board and System Test
28.
board test
29.
bounds test
30.
built-in self-test
31.
capillary condensation redistribution test
32.
chi-square test
33.
closed bottle test
34.
cognitive screening test
35.
compartment fire test
36.
compartment test
37.
cone penetration test (CPT)
38.
COVID-19 antigen test
39.
cutting test
40.
cybersecurity test bed
41.
DDR4 interconnect test
42.
design and test
43.
design-for-test
44.
deterministic test sequences
45.
digital test
46.
Digital test and testable design
47.
double-pulse test
48.
drawing test
49.
dry droplet antimicrobial test
50.
embedded test
51.
fan pressurisation test
52.
final test result prediction
53.
four-point bending test
54.
FPGA based test
55.
FPGA-Assisted Test
56.
FPGA-centric test
57.
functional self-test
58.
functional test generation
59.
Granger causality test
60.
hardness test
61.
high-level synthesis for test
62.
high-level test data generation
63.
highlevel test generation
64.
high-speed serial link test
65.
IEEE 9 bus test system
66.
implementation-independent test generation
67.
in situ tensile test in SEM
68.
industrial field test
69.
in-situ tensile test in SEM
70.
Johansen cointegration test
71.
Kolmogorov-Smirnov test
72.
load test
73.
logic built-in self-test
74.
Luria alternating series test
75.
Mann–Kendall test
76.
memory interconnect test
77.
microprocessor test
78.
Model test
79.
multiplier test
80.
offline test generation
81.
orthogonal test
82.
package test analysis
83.
parallel design and test
84.
performance test
85.
piezocone penetration test (CPTu)
86.
Point Load Test index
87.
pressurisation test
88.
processor-centric board test
89.
progressive damage test
90.
provably correct test generation
91.
pseudo-exhaustive test
92.
purity test
93.
rtioco-based timed test sequences
94.
seasonal Mann Kendall test
95.
seismic piezocone penetration test
96.
self-test
97.
self-test architectures
98.
sentence writing test
99.
serial sevens test
100.
ship towing test tank
101.
similar material simulation test
102.
small‐scale test
103.
software based self-test
104.
software-based self-test
105.
software-based self-test (SBST)
106.
soil phosphorus (P) test
107.
standard test method
108.
static load test
109.
static-dynamic probing test (SDT)
110.
stress test
111.
system level test
112.
teaching design and test of systems
113.
tensile test
114.
test
115.
test and evaluation platform
116.
test bench
117.
test coverage
118.
test driven development
119.
test driven modelling
120.
test embankment
121.
test equipment
122.
test generation
123.
test generation and fault diagnosis
124.
test groups
125.
test model design
126.
test optimization
127.
test packets
128.
test path synthesis
129.
test patterns
130.
test point insertion
131.
test program generation
132.
test reference year
133.
test replication
134.
test scenario description language
135.
test-bed
136.
test-chips
137.
test-house
138.
test-pattern
139.
test-suite reduction
140.
Three-point bending test
141.
unit root test
142.
1995 ECC benchmark test
subject term
3
1.
Laser Diagnostic Instruments
2.
European Test Symposium (ETS)
3.
16PF (test)
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