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diagnostic test (keyword)
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1
book article
Assessment of diagnostic test for automated bug localization
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[6] p. : ill
book article
Number of records 1, displaying
1 - 1
keyword
156
1.
diagnostic test
2.
random diagnostic tests
3.
rapid diagnostic tests
4.
diagnostic
5.
diagnostic accuracy
6.
diagnostic and statistical manual of mental disorders (DSM-5)
7.
diagnostic coverage
8.
diagnostic data
9.
diagnostic resolution
10.
diagnostic tools
11.
diagnostic traces
12.
fault diagnostic
13.
fault diagnostic resolution
14.
In vitro diagnostic medical devices
15.
accelerated shelf-life test
16.
adaptive test strategy generation
17.
antigen test
18.
Applications in Test Engineering
19.
ASTM G65 dry sand rubber wheel abrasion test
20.
Automated Synthesis of Software-based Self-test
21.
automated test environment
22.
automated test pattern generation
23.
automatic test case generation
24.
automatic test pattern generation
25.
automatic test program generation
26.
Auvergne test-bed
27.
battery test
28.
behavioral test
29.
behaviour level test generation
30.
bending test
31.
bit-error rate test
32.
Board and System Test
33.
board test
34.
bounds test
35.
built-in self-test
36.
capillary condensation redistribution test
37.
chi-square test
38.
closed bottle test
39.
cognitive screening test
40.
compartment fire test
41.
compartment test
42.
cone penetration test (CPT)
43.
COVID-19 antigen test
44.
cutting test
45.
cybersecurity test bed
46.
DDR4 interconnect test
47.
design and test
48.
design-for-test
49.
deterministic test sequences
50.
digital test
51.
Digital test and testable design
52.
double-pulse test
53.
drawing test
54.
dry droplet antimicrobial test
55.
embedded test
56.
fan pressurisation test
57.
final test result prediction
58.
four-point bending test
59.
FPGA based test
60.
FPGA-Assisted Test
61.
FPGA-centric test
62.
functional self-test
63.
functional test generation
64.
Granger causality test
65.
hardness test
66.
Hierarchical Multi-level Test Generation
67.
high-level synthesis for test
68.
high-level test data generation
69.
highlevel test generation
70.
high-speed serial link test
71.
IEEE 9 bus test system
72.
implementation-independent test generation
73.
in situ tensile test in SEM
74.
industrial field test
75.
in-situ tensile test in SEM
76.
Johansen cointegration test
77.
Kolmogorov-Smirnov test
78.
load test
79.
logic built-in self-test
80.
Luria alternating series test
81.
Mann–Kendall test
82.
Mann-Kendall trend test
83.
memory interconnect test
84.
microprocessor test
85.
Model test
86.
multiplier test
87.
offline test generation
88.
orthogonal test
89.
package test analysis
90.
parallel design and test
91.
performance test
92.
piezocone penetration test (CPTu)
93.
Point Load Test index
94.
pressurisation test
95.
processor-centric board test
96.
progressive damage test
97.
provably correct test generation
98.
pseudo-exhaustive test
99.
purity test
100.
real-time room temperature test
101.
rolling thin film oven test
102.
rtioco-based timed test sequences
103.
seasonal Mann Kendall test
104.
seismic piezocone penetration test
105.
self-test
106.
self-test architectures
107.
sentence writing test
108.
serial sevens test
109.
ship towing test tank
110.
similar material simulation test
111.
small-scale fire test
112.
small‐scale test
113.
software based self-test
114.
software-based self-test
115.
software-based self-test (SBST)
116.
soil phosphorus (P) test
117.
standard test method
118.
static load test
119.
static-dynamic probing test (SDT)
120.
stress test
121.
system level test
122.
teaching design and test of systems
123.
tensile test
124.
tensile test
125.
test
126.
test and evaluation platform
127.
test automation
128.
test bench
129.
test coverage
130.
test driven development
131.
test driven modelling
132.
test embankment
133.
test equipment
134.
test generation
135.
test generation and fault diagnosis
136.
Test Group Generation for Detecting Multiple Faults
137.
test groups
138.
test model design
139.
test optimization
140.
test packets
141.
test path synthesis
142.
test patterns
143.
test point insertion
144.
test program generation
145.
test reference year
146.
test replication
147.
test scenario description language
148.
test-bed
149.
test-chips
150.
test-house
151.
test-pattern
152.
test-suite reduction
153.
Three-point bending test
154.
unit root test
155.
usability platform test
156.
1995 ECC benchmark test
subject term
3
1.
Laser Diagnostic Instruments
2.
European Test Symposium (ETS)
3.
16PF (test)
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