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book article
Assessment of diagnostic test for automated bug localization
Tihhomirov, Valentin
;
Tšepurov, Anton
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
LATW2013 : 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013 : [proceedings]
2013
/
[6] p. : ill
book article
Number of records 1, displaying
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keyword
155
1.
diagnostic test
2.
random diagnostic tests
3.
rapid diagnostic tests
4.
diagnostic
5.
diagnostic accuracy
6.
diagnostic coverage
7.
diagnostic data
8.
diagnostic resolution
9.
diagnostic tools
10.
diagnostic traces
11.
fault diagnostic
12.
fault diagnostic resolution
13.
In vitro diagnostic medical devices
14.
accelerated shelf-life test
15.
adaptive test strategy generation
16.
antigen test
17.
Applications in Test Engineering
18.
ASTM G65 dry sand rubber wheel abrasion test
19.
Automated Synthesis of Software-based Self-test
20.
automated test environment
21.
automated test pattern generation
22.
automatic test case generation
23.
automatic test pattern generation
24.
automatic test program generation
25.
Auvergne test-bed
26.
battery test
27.
behavioral test
28.
behaviour level test generation
29.
bending test
30.
bit-error rate test
31.
Board and System Test
32.
board test
33.
bounds test
34.
built-in self-test
35.
capillary condensation redistribution test
36.
chi-square test
37.
closed bottle test
38.
cognitive screening test
39.
compartment fire test
40.
compartment test
41.
cone penetration test (CPT)
42.
COVID-19 antigen test
43.
cutting test
44.
cybersecurity test bed
45.
DDR4 interconnect test
46.
design and test
47.
design-for-test
48.
deterministic test sequences
49.
digital test
50.
Digital test and testable design
51.
double-pulse test
52.
drawing test
53.
dry droplet antimicrobial test
54.
embedded test
55.
fan pressurisation test
56.
final test result prediction
57.
four-point bending test
58.
FPGA based test
59.
FPGA-Assisted Test
60.
FPGA-centric test
61.
functional self-test
62.
functional test generation
63.
Granger causality test
64.
hardness test
65.
Hierarchical Multi-level Test Generation
66.
high-level synthesis for test
67.
high-level test data generation
68.
highlevel test generation
69.
high-speed serial link test
70.
IEEE 9 bus test system
71.
implementation-independent test generation
72.
in situ tensile test in SEM
73.
industrial field test
74.
in-situ tensile test in SEM
75.
Johansen cointegration test
76.
Kolmogorov-Smirnov test
77.
load test
78.
logic built-in self-test
79.
Luria alternating series test
80.
Mann–Kendall test
81.
Mann-Kendall trend test
82.
memory interconnect test
83.
microprocessor test
84.
Model test
85.
multiplier test
86.
offline test generation
87.
orthogonal test
88.
package test analysis
89.
parallel design and test
90.
performance test
91.
piezocone penetration test (CPTu)
92.
Point Load Test index
93.
pressurisation test
94.
processor-centric board test
95.
progressive damage test
96.
provably correct test generation
97.
pseudo-exhaustive test
98.
purity test
99.
real-time room temperature test
100.
rolling thin film oven test
101.
rtioco-based timed test sequences
102.
seasonal Mann Kendall test
103.
seismic piezocone penetration test
104.
self-test
105.
self-test architectures
106.
sentence writing test
107.
serial sevens test
108.
ship towing test tank
109.
similar material simulation test
110.
small-scale fire test
111.
small‐scale test
112.
software based self-test
113.
software-based self-test
114.
software-based self-test (SBST)
115.
soil phosphorus (P) test
116.
standard test method
117.
static load test
118.
static-dynamic probing test (SDT)
119.
stress test
120.
system level test
121.
teaching design and test of systems
122.
tensile test
123.
tensile test
124.
test
125.
test and evaluation platform
126.
test automation
127.
test bench
128.
test coverage
129.
test driven development
130.
test driven modelling
131.
test embankment
132.
test equipment
133.
test generation
134.
test generation and fault diagnosis
135.
Test Group Generation for Detecting Multiple Faults
136.
test groups
137.
test model design
138.
test optimization
139.
test packets
140.
test path synthesis
141.
test patterns
142.
test point insertion
143.
test program generation
144.
test reference year
145.
test replication
146.
test scenario description language
147.
test-bed
148.
test-chips
149.
test-house
150.
test-pattern
151.
test-suite reduction
152.
Three-point bending test
153.
unit root test
154.
usability platform test
155.
1995 ECC benchmark test
subject term
3
1.
Laser Diagnostic Instruments
2.
European Test Symposium (ETS)
3.
16PF (test)
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