Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Advanced search
My bookmarks
0
industrial field test (keyword)
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
source
author
DOI
year of publication
location of publication
supervisor
category
publisher
classifier
conference location
quartile
availibility
subject term
title
series
name of the person
TalTech subject term
TalTech department
url
keyword
All fields
author
co-contibutor
commentator
compiler
corporate author
editor
expert
interviewer
supervisor
translator
series variant title
title
translation of title
variant title
source
special issue
name of the institution
subject of form
subject of location
subject of time
subject term
series
series variant title
availibility
Open Access
category (general)
category (sub)
starts with
containes
exact match
—
Add criteria
Simple search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(3/276)
Export
export all inquiry results
(1)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
journal article EST
/
journal article ENG
Wear of different PVD coatings at industrial fine-blanking field tests
Lind, Liina
;
Peetsalu, Priidu
;
Sergejev, Fjodor
Medžiagotyra = Materials science
2015
/
p. 343-348 : ill
https://doi.org/10.5755/j01.ms.21.3.7249
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
Number of records 1, displaying
1 - 1
keyword
273
1.
industrial field test
2.
industrial field wear tests
3.
ash field
4.
borehole field
5.
design field testing
6.
differential field
7.
direct field-oriented control (DFOC)
8.
Earth's magnetic field
9.
educational field
10.
effective field
11.
electric field
12.
electric field simulation
13.
Electrical field
14.
electromagnetic field
15.
Eulerian velocity field
16.
field data
17.
field density in tissue
18.
field effect transistor
19.
field instrumentation
20.
field measurements
21.
field monitoring
22.
field of study
23.
Field Penetration Depth
24.
Field Programmable Gate Array (FPGA)
25.
field programmable gate arrays
26.
field robot
27.
field strength
28.
field strengths
29.
field study
30.
field survey camp
31.
field tests model validation
32.
field-oriented control
33.
field-programmable gate array
34.
Field-Programmable Gate Array (FPGA)
35.
field-programmable gate arrays
36.
field-programmable gate arrays (FPGA)
37.
field-weakening
38.
force field calculations
39.
FPGA (field-programmable gate array)
40.
Gaussian Markov random field
41.
geomagnetic field
42.
gravity field
43.
intertidal boulder field
44.
junction field-effect transistor (JFET)
45.
Kaali impact crater field
46.
leakage magnetic field
47.
magnetic field
48.
magnetics field simulation
49.
magnetostatic field
50.
metal-oxide-semiconductor field-effect transistors (MOSFETs)
51.
molecular reaction field
52.
Opal Kelly field programmable gate array (FPGA)
53.
phase field theory
54.
primary magnetic field
55.
Qiangtang volcanic field
56.
radiofrequency electromagnetic field
57.
real field measurements
58.
rotational magnetic field
59.
single far-field measurement
60.
Single far-field pattern
61.
static magnetic field
62.
ultrametric (or nonarchimedean) field
63.
ultrametric (or non-archimedean) field
64.
vector field
65.
velocity field
66.
vorticity field
67.
academic-industrial divide
68.
collaborative industrial robots
69.
commercial and industrial nanogrids
70.
early industrial policy
71.
EU defence industrial policy
72.
IIoT (Industrial-Internet-of-Things)
73.
industrial organization
74.
industrial application
75.
industrial applications
76.
industrial automation
77.
industrial buildings
78.
industrial chemistry
79.
industrial control
80.
industrial control system (ICS)
81.
industrial control systems
82.
Industrial Control Systems (ICS)
83.
industrial controller (PLC)
84.
industrial design
85.
industrial district heating
86.
industrial emissions
87.
industrial engineering
88.
industrial enterprises
89.
industrial environment
90.
industrial halls
91.
industrial innovation
92.
industrial internet
93.
industrial internet of things
94.
Industrial Internet of Things (IIoT)
95.
Industrial IoT
96.
industrial IoT (IIoT)
97.
industrial marketing
98.
industrial metaverse
99.
Industrial microbiology
100.
industrial microgrids
101.
industrial monitoring
102.
Industrial needs
103.
industrial polic
104.
Industrial Policy
105.
industrial power systems
106.
industrial process
107.
industrial processes
108.
industrial product positioning
109.
industrial relations
110.
industrial restructuring
111.
industrial revolution
112.
industrial robot
113.
industrial robotics
114.
industrial robots
115.
industrial robots virtual factory
116.
industrial scale
117.
industrial sourdough
118.
industrial structure
119.
industrial town
120.
industrial waste
121.
industrial wastes
122.
industrial wastewater
123.
industrial wastewater treatment
124.
industrial water
125.
Industrial Virtual Reality
126.
industrial workers
127.
multi-machine industrial power plant
128.
price based control of industrial processes
129.
research and industrial policy
130.
used industrial equipment
131.
24th IEEE International Conference on Industrial Technology 2023
132.
accelerated shelf-life test
133.
adaptive test strategy generation
134.
antigen test
135.
Applications in Test Engineering
136.
ASTM G65 dry sand rubber wheel abrasion test
137.
Automated Synthesis of Software-based Self-test
138.
automated test environment
139.
automated test pattern generation
140.
automatic test case generation
141.
automatic test pattern generation
142.
automatic test program generation
143.
Auvergne test-bed
144.
battery test
145.
behavioral test
146.
behaviour level test generation
147.
bending test
148.
bit-error rate test
149.
Board and System Test
150.
board test
151.
bounds test
152.
built-in self-test
153.
capillary condensation redistribution test
154.
chi-square test
155.
closed bottle test
156.
cognitive screening test
157.
compartment fire test
158.
compartment test
159.
cone penetration test (CPT)
160.
COVID-19 antigen test
161.
cutting test
162.
cybersecurity test bed
163.
DDR4 interconnect test
164.
design and test
165.
design-for-test
166.
deterministic test sequences
167.
diagnostic test
168.
digital test
169.
Digital test and testable design
170.
double-pulse test
171.
drawing test
172.
dry droplet antimicrobial test
173.
embedded test
174.
fan pressurisation test
175.
final test result prediction
176.
four-point bending test
177.
FPGA based test
178.
FPGA-Assisted Test
179.
FPGA-centric test
180.
functional self-test
181.
functional test generation
182.
Granger causality test
183.
hardness test
184.
Hierarchical Multi-level Test Generation
185.
high-level synthesis for test
186.
high-level test data generation
187.
highlevel test generation
188.
high-speed serial link test
189.
IEEE 9 bus test system
190.
implementation-independent test generation
191.
in situ tensile test in SEM
192.
in-situ tensile test in SEM
193.
Johansen cointegration test
194.
Kolmogorov-Smirnov test
195.
load test
196.
logic built-in self-test
197.
Luria alternating series test
198.
Mann–Kendall test
199.
Mann-Kendall trend test
200.
memory interconnect test
201.
microprocessor test
202.
Model test
203.
multiplier test
204.
offline test generation
205.
orthogonal test
206.
package test analysis
207.
parallel design and test
208.
performance test
209.
piezocone penetration test (CPTu)
210.
Point Load Test index
211.
pressurisation test
212.
processor-centric board test
213.
progressive damage test
214.
provably correct test generation
215.
pseudo-exhaustive test
216.
purity test
217.
real-time room temperature test
218.
rolling thin film oven test
219.
rtioco-based timed test sequences
220.
seasonal Mann Kendall test
221.
seismic piezocone penetration test
222.
self-test
223.
self-test architectures
224.
sentence writing test
225.
serial sevens test
226.
ship towing test tank
227.
similar material simulation test
228.
small-scale fire test
229.
small‐scale test
230.
software based self-test
231.
software-based self-test
232.
software-based self-test (SBST)
233.
soil phosphorus (P) test
234.
standard test method
235.
static load test
236.
static-dynamic probing test (SDT)
237.
stress test
238.
system level test
239.
teaching design and test of systems
240.
tensile test
241.
tensile test
242.
test
243.
test and evaluation platform
244.
test automation
245.
test bench
246.
test coverage
247.
test driven development
248.
test driven modelling
249.
test embankment
250.
test equipment
251.
test generation
252.
test generation and fault diagnosis
253.
Test Group Generation for Detecting Multiple Faults
254.
test groups
255.
test model design
256.
test optimization
257.
test packets
258.
test path synthesis
259.
test patterns
260.
test point insertion
261.
test program generation
262.
test reference year
263.
test replication
264.
test scenario description language
265.
test-bed
266.
test-chips
267.
test-house
268.
test-pattern
269.
test-suite reduction
270.
Three-point bending test
271.
unit root test
272.
usability platform test
273.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
TalTech department
1
1.
Department of Mechanical and Industrial Engineering
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT