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double-pulse test (keyword)
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1
journal article
Experimental evaluation of GaN gate injection transistors
Rabkowski, Jacek
;
Barlik, Roman
Przeglad elektrotechniczny = Electrical review
2015
/
p. 9-12 : ill
http://dx.doi.org/10.15199/48.2015.03.03
journal article
Number of records 1, displaying
1 - 1
keyword
213
1.
double-pulse test
2.
double bootstrap DEA
3.
double bottom damage
4.
Double categories
5.
double category
6.
double diamond model
7.
double forged tungsten
8.
double interceptor system
9.
double ML
10.
double negation shift
11.
double positivity
12.
double power-law
13.
double pushout (DPO) rewriting
14.
double Q-learning
15.
double seam
16.
double sequence
17.
double skin facade
18.
double sparsity
19.
double-cabled system
20.
double-frequency ripple
21.
double-layer capacitance
22.
double-pushout rewriting
23.
Double-stepped planing hull
24.
Double-well potential
25.
electric double-layer
26.
minimization by double reversal
27.
arterial pulse wave
28.
cardiac pulse
29.
cardiac pulse variability
30.
complementary pulse wave velocity
31.
differential pulse voltammetry
32.
hybrid pulse width modulation
33.
nerve pulse
34.
partial discharge (PD) pulse
35.
pulse
36.
pulse analysis
37.
pulse arrival time
38.
pulse control
39.
pulse density modulation
40.
Pulse electrodeposition
41.
pulse features
42.
pulse inverters
43.
pulse measurements
44.
pulse propagation
45.
pulse rate
46.
Pulse shape analysis
47.
pulse shaping
48.
pulse shaping filters
49.
pulse transformers
50.
pulse wave
51.
pulse wave analysis
52.
pulse wave velocity
53.
pulse waveform analysis
54.
pulse width modulated converters
55.
pulse width modulated inverters
56.
pulse width modulated power converters
57.
pulse width modulation
58.
pulse width modulation (PWM)
59.
pulse width modulation (PWM) inverters
60.
pulse width modulation converter
61.
pulse width modulation converters
62.
pulse width modulation inverters
63.
Pulse-Amplitude-Modulation (PAM)
64.
pulse-width modulation
65.
pulse-width modulation (PWM)
66.
pulse-width modulations
67.
rectangular pulse
68.
sinusoidal pulse width modulator (SPWM)
69.
space vector pulse width modulation
70.
space vector pulse width modulation (SVPWM)
71.
space vector pulse-width modulation
72.
accelerated shelf-life test
73.
adaptive test strategy generation
74.
antigen test
75.
Applications in Test Engineering
76.
ASTM G65 dry sand rubber wheel abrasion test
77.
Automated Synthesis of Software-based Self-test
78.
automated test environment
79.
automated test pattern generation
80.
automatic test case generation
81.
automatic test pattern generation
82.
automatic test program generation
83.
Auvergne test-bed
84.
battery test
85.
behavioral test
86.
behaviour level test generation
87.
bending test
88.
bit-error rate test
89.
Board and System Test
90.
board test
91.
bounds test
92.
built-in self-test
93.
capillary condensation redistribution test
94.
chi-square test
95.
closed bottle test
96.
cognitive screening test
97.
compartment fire test
98.
compartment test
99.
cone penetration test (CPT)
100.
COVID-19 antigen test
101.
cutting test
102.
cybersecurity test bed
103.
DDR4 interconnect test
104.
design and test
105.
design-for-test
106.
deterministic test sequences
107.
diagnostic test
108.
digital test
109.
Digital test and testable design
110.
drawing test
111.
dry droplet antimicrobial test
112.
embedded test
113.
fan pressurisation test
114.
final test result prediction
115.
four-point bending test
116.
FPGA based test
117.
FPGA-Assisted Test
118.
FPGA-centric test
119.
functional self-test
120.
functional test generation
121.
Granger causality test
122.
hardness test
123.
Hierarchical Multi-level Test Generation
124.
high-level synthesis for test
125.
high-level test data generation
126.
highlevel test generation
127.
high-speed serial link test
128.
IEEE 9 bus test system
129.
implementation-independent test generation
130.
in situ tensile test in SEM
131.
industrial field test
132.
in-situ tensile test in SEM
133.
Johansen cointegration test
134.
Kolmogorov-Smirnov test
135.
load test
136.
logic built-in self-test
137.
Luria alternating series test
138.
Mann–Kendall test
139.
Mann-Kendall trend test
140.
memory interconnect test
141.
microprocessor test
142.
Model test
143.
multiplier test
144.
offline test generation
145.
orthogonal test
146.
package test analysis
147.
parallel design and test
148.
performance test
149.
piezocone penetration test (CPTu)
150.
Point Load Test index
151.
pressurisation test
152.
processor-centric board test
153.
progressive damage test
154.
provably correct test generation
155.
pseudo-exhaustive test
156.
purity test
157.
real-time room temperature test
158.
rolling thin film oven test
159.
rtioco-based timed test sequences
160.
seasonal Mann Kendall test
161.
seismic piezocone penetration test
162.
self-test
163.
self-test architectures
164.
sentence writing test
165.
serial sevens test
166.
ship towing test tank
167.
similar material simulation test
168.
small-scale fire test
169.
small‐scale test
170.
software based self-test
171.
software-based self-test
172.
software-based self-test (SBST)
173.
soil phosphorus (P) test
174.
standard test method
175.
static load test
176.
static-dynamic probing test (SDT)
177.
stress test
178.
system level test
179.
teaching design and test of systems
180.
tensile test
181.
tensile test
182.
test
183.
test and evaluation platform
184.
test automation
185.
test bench
186.
test coverage
187.
test driven development
188.
test driven modelling
189.
test embankment
190.
test equipment
191.
test generation
192.
test generation and fault diagnosis
193.
Test Group Generation for Detecting Multiple Faults
194.
test groups
195.
test model design
196.
test optimization
197.
test packets
198.
test path synthesis
199.
test patterns
200.
test point insertion
201.
test program generation
202.
test reference year
203.
test replication
204.
test scenario description language
205.
test-bed
206.
test-chips
207.
test-house
208.
test-pattern
209.
test-suite reduction
210.
Three-point bending test
211.
unit root test
212.
usability platform test
213.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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