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double-pulse test (keyword)
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1
journal article
Experimental evaluation of GaN gate injection transistors
Rabkowski, Jacek
;
Barlik, Roman
Przeglad elektrotechniczny = Electrical review
2015
/
p. 9-12 : ill
http://dx.doi.org/10.15199/48.2015.03.03
journal article
Number of records 1, displaying
1 - 1
keyword
185
1.
double-pulse test
2.
double bottom damage
3.
Double categories
4.
double forged tungsten
5.
double power-law
6.
double pushout (DPO) rewriting
7.
double Q-learning
8.
double seam
9.
double sequence
10.
double-cabled system
11.
double-frequency ripple
12.
double-layer capacitance
13.
double-pushout rewriting
14.
Double-stepped planing hull
15.
electric double-layer
16.
minimization by double reversal
17.
arterial pulse wave
18.
cardiac pulse
19.
cardiac pulse variability
20.
differential pulse voltammetry
21.
hybrid pulse width modulation
22.
nerve pulse
23.
pulse
24.
pulse analysis
25.
pulse arrival time
26.
Pulse electrodeposition
27.
pulse inverters
28.
pulse measurements
29.
pulse propagation
30.
pulse rate
31.
pulse shaping
32.
pulse shaping filters
33.
pulse transformers
34.
pulse wave
35.
pulse wave analysis
36.
pulse wave velocity
37.
pulse waveform analysis
38.
pulse width modulated converters
39.
pulse width modulated inverters
40.
pulse width modulated power converters
41.
pulse width modulation
42.
pulse width modulation (PWM)
43.
pulse width modulation (PWM) inverters
44.
pulse width modulation converter
45.
pulse width modulation converters
46.
pulse width modulation inverters
47.
Pulse-Amplitude-Modulation (PAM)
48.
pulse-width modulation
49.
pulse-width modulation (PWM)
50.
pulse-width modulations
51.
rectangular pulse
52.
space vector pulse width modulation
53.
space vector pulse width modulation (SVPWM)
54.
space vector pulse-width modulation
55.
accelerated shelf-life test
56.
adaptive test strategy generation
57.
antigen test
58.
ASTM G65 dry sand rubber wheel abrasion test
59.
automated test environment
60.
automated test pattern generation
61.
automatic test case generation
62.
automatic test pattern generation
63.
automatic test program generation
64.
Auvergne test-bed
65.
battery test
66.
behavioral test
67.
behaviour level test generation
68.
bending test
69.
bit-error rate test
70.
Board and System Test
71.
board test
72.
bounds test
73.
built-in self-test
74.
capillary condensation redistribution test
75.
chi-square test
76.
closed bottle test
77.
cognitive screening test
78.
compartment fire test
79.
compartment test
80.
cone penetration test (CPT)
81.
COVID-19 antigen test
82.
cutting test
83.
cybersecurity test bed
84.
DDR4 interconnect test
85.
design and test
86.
design-for-test
87.
deterministic test sequences
88.
diagnostic test
89.
digital test
90.
Digital test and testable design
91.
drawing test
92.
dry droplet antimicrobial test
93.
embedded test
94.
fan pressurisation test
95.
final test result prediction
96.
four-point bending test
97.
FPGA based test
98.
FPGA-Assisted Test
99.
FPGA-centric test
100.
functional self-test
101.
functional test generation
102.
Granger causality test
103.
hardness test
104.
high-level synthesis for test
105.
high-level test data generation
106.
highlevel test generation
107.
high-speed serial link test
108.
IEEE 9 bus test system
109.
implementation-independent test generation
110.
in situ tensile test in SEM
111.
industrial field test
112.
in-situ tensile test in SEM
113.
Johansen cointegration test
114.
Kolmogorov-Smirnov test
115.
load test
116.
logic built-in self-test
117.
Luria alternating series test
118.
Mann–Kendall test
119.
memory interconnect test
120.
microprocessor test
121.
Model test
122.
multiplier test
123.
offline test generation
124.
orthogonal test
125.
package test analysis
126.
parallel design and test
127.
performance test
128.
piezocone penetration test (CPTu)
129.
Point Load Test index
130.
pressurisation test
131.
processor-centric board test
132.
progressive damage test
133.
provably correct test generation
134.
pseudo-exhaustive test
135.
purity test
136.
rtioco-based timed test sequences
137.
seasonal Mann Kendall test
138.
seismic piezocone penetration test
139.
self-test
140.
self-test architectures
141.
sentence writing test
142.
serial sevens test
143.
ship towing test tank
144.
similar material simulation test
145.
small‐scale test
146.
software based self-test
147.
software-based self-test
148.
software-based self-test (SBST)
149.
soil phosphorus (P) test
150.
standard test method
151.
static load test
152.
static-dynamic probing test (SDT)
153.
stress test
154.
system level test
155.
teaching design and test of systems
156.
tensile test
157.
test
158.
test and evaluation platform
159.
test bench
160.
test coverage
161.
test driven development
162.
test driven modelling
163.
test embankment
164.
test equipment
165.
test generation
166.
test generation and fault diagnosis
167.
test groups
168.
test model design
169.
test optimization
170.
test packets
171.
test path synthesis
172.
test patterns
173.
test point insertion
174.
test program generation
175.
test reference year
176.
test replication
177.
test scenario description language
178.
test-bed
179.
test-chips
180.
test-house
181.
test-pattern
182.
test-suite reduction
183.
Three-point bending test
184.
unit root test
185.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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