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journal article
Experimental evaluation of GaN gate injection transistors
Rabkowski, Jacek
;
Barlik, Roman
Przeglad elektrotechniczny = Electrical review
2015
/
p. 9-12 : ill
http://dx.doi.org/10.15199/48.2015.03.03
journal article
Number of records 1, displaying
1 - 1
keyword
219
1.
double-pulse test
2.
double bootstrap DEA
3.
double bottom damage
4.
Double categories
5.
double category
6.
double deep Q-network
7.
double diamond model
8.
double forged tungsten
9.
double interceptor system
10.
double ML
11.
double negation shift
12.
double positivity
13.
double power-law
14.
double pushout (DPO) rewriting
15.
double Q-learning
16.
double seam
17.
double sequence
18.
double skin facade
19.
double sparsity
20.
double-cabled system
21.
double-frequency ripple
22.
double-layer capacitance
23.
double-pushout rewriting
24.
Double-stepped planing hull
25.
Double-well potential
26.
electric double-layer
27.
minimization by double reversal
28.
virtual double category
29.
aortic pulse wave velocity
30.
arterial pulse wave
31.
cardiac pulse
32.
cardiac pulse variability
33.
complementary pulse wave velocity
34.
differential pulse voltammetry
35.
hybrid pulse width modulation
36.
nerve pulse
37.
partial discharge (PD) pulse
38.
pulse
39.
pulse analysis
40.
pulse arrival time
41.
pulse control
42.
pulse density modulation
43.
Pulse electrodeposition
44.
pulse features
45.
pulse inverters
46.
pulse measurements
47.
pulse propagation
48.
pulse rate
49.
Pulse shape analysis
50.
pulse shaping
51.
pulse shaping filters
52.
pulse transformers
53.
pulse wave
54.
pulse wave analysis
55.
pulse wave velocity
56.
pulse waveform analysis
57.
pulse width modulated converters
58.
pulse width modulated inverters
59.
pulse width modulated power converters
60.
pulse width modulation
61.
pulse width modulation (PWM)
62.
pulse width modulation (PWM) inverters
63.
pulse width modulation converter
64.
pulse width modulation converters
65.
pulse width modulation inverters
66.
Pulse-Amplitude-Modulation (PAM)
67.
pulse-width modulation
68.
pulse-width modulation (PWM)
69.
pulse-width modulations
70.
rectangular pulse
71.
sinusoidal pulse width modulator (SPWM)
72.
space vector pulse width modulation
73.
space vector pulse width modulation (SVPWM)
74.
space vector pulse-width modulation
75.
accelerated shelf-life test
76.
adaptive test strategy generation
77.
antigen test
78.
Applications in Test Engineering
79.
ASTM G65 dry sand rubber wheel abrasion test
80.
Automated Synthesis of Software-based Self-test
81.
automated test environment
82.
automated test pattern generation
83.
automatic test case generation
84.
automatic test pattern generation
85.
automatic test program generation
86.
Auvergne test-bed
87.
battery test
88.
behavioral test
89.
behaviour level test generation
90.
bending test
91.
bit-error rate test
92.
Board and System Test
93.
board test
94.
bounds test
95.
built-in self-test
96.
capillary condensation redistribution test
97.
chi-square test
98.
closed bottle test
99.
cognitive screening test
100.
compartment fire test
101.
compartment test
102.
cone penetration test (CPT)
103.
COVID-19 antigen test
104.
cutting test
105.
cybersecurity test bed
106.
DDR4 interconnect test
107.
design and test
108.
design-for-test
109.
deterministic test sequences
110.
diagnostic test
111.
digital test
112.
Digital test and testable design
113.
drawing test
114.
dry droplet antimicrobial test
115.
Embedded figures test
116.
embedded test
117.
fan pressurisation test
118.
final test result prediction
119.
four-point bending test
120.
FPGA based test
121.
FPGA-Assisted Test
122.
FPGA-centric test
123.
functional self-test
124.
functional test generation
125.
Granger causality test
126.
hardness test
127.
Hierarchical Multi-level Test Generation
128.
high-level synthesis for test
129.
high-level test data generation
130.
highlevel test generation
131.
high-speed serial link test
132.
IEEE 9 bus test system
133.
implementation-independent test generation
134.
in situ tensile test in SEM
135.
industrial field test
136.
in-situ tensile test in SEM
137.
Johansen cointegration test
138.
Kolmogorov-Smirnov test
139.
load test
140.
logic built-in self-test
141.
Luria alternating series test
142.
Mann–Kendall test
143.
Mann-Kendall trend test
144.
memory interconnect test
145.
microprocessor test
146.
Model test
147.
multiplier test
148.
offline test generation
149.
orthogonal test
150.
package test analysis
151.
parallel design and test
152.
performance test
153.
piezocone penetration test (CPTu)
154.
Point Load Test index
155.
pressurisation test
156.
processor-centric board test
157.
progressive damage test
158.
Provably Correct Test Development
159.
provably correct test generation
160.
pseudo-exhaustive test
161.
purity test
162.
real-time room temperature test
163.
rolling thin film oven test
164.
rtioco-based timed test sequences
165.
seasonal Mann Kendall test
166.
seismic piezocone penetration test
167.
self-test
168.
self-test architectures
169.
sentence writing test
170.
serial sevens test
171.
ship towing test tank
172.
similar material simulation test
173.
small-scale fire test
174.
small‐scale test
175.
software based self-test
176.
software-based self-test
177.
software-based self-test (SBST)
178.
soil phosphorus (P) test
179.
standard test method
180.
static load test
181.
static-dynamic probing test (SDT)
182.
stress test
183.
system level test
184.
teaching design and test of systems
185.
tensile test
186.
tensile test
187.
test
188.
Test Adapters
189.
test and evaluation platform
190.
test automation
191.
test bench
192.
test coverage
193.
test driven development
194.
test driven modelling
195.
test embankment
196.
test equipment
197.
test generation
198.
test generation and fault diagnosis
199.
Test Group Generation for Detecting Multiple Faults
200.
test groups
201.
test model design
202.
test optimization
203.
test packets
204.
test path synthesis
205.
test patterns
206.
test point insertion
207.
test program generation
208.
test reference year
209.
test replication
210.
test scenario description language
211.
test-bed
212.
test-chips
213.
test-house
214.
test-pattern
215.
test-suite reduction
216.
Three-point bending test
217.
unit root test
218.
usability platform test
219.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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