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1
journal article
Experimental evaluation of GaN gate injection transistors
Rabkowski, Jacek
;
Barlik, Roman
Przeglad elektrotechniczny = Electrical review
2015
/
p. 9-12 : ill
http://dx.doi.org/10.15199/48.2015.03.03
journal article
Number of records 1, displaying
1 - 1
keyword
211
1.
double-pulse test
2.
double bootstrap DEA
3.
double bottom damage
4.
Double categories
5.
double category
6.
double diamond model
7.
double forged tungsten
8.
double interceptor system
9.
double ML
10.
double negation shift
11.
double positivity
12.
double power-law
13.
double pushout (DPO) rewriting
14.
double Q-learning
15.
double seam
16.
double sequence
17.
double skin facade
18.
double sparsity
19.
double-cabled system
20.
double-frequency ripple
21.
double-layer capacitance
22.
double-pushout rewriting
23.
Double-stepped planing hull
24.
Double-well potential
25.
electric double-layer
26.
minimization by double reversal
27.
arterial pulse wave
28.
cardiac pulse
29.
cardiac pulse variability
30.
complementary pulse wave velocity
31.
differential pulse voltammetry
32.
hybrid pulse width modulation
33.
nerve pulse
34.
pulse
35.
pulse analysis
36.
pulse arrival time
37.
pulse control
38.
Pulse electrodeposition
39.
pulse features
40.
pulse inverters
41.
pulse measurements
42.
pulse propagation
43.
pulse rate
44.
Pulse shape analysis
45.
pulse shaping
46.
pulse shaping filters
47.
pulse transformers
48.
pulse wave
49.
pulse wave analysis
50.
pulse wave velocity
51.
pulse waveform analysis
52.
pulse width modulated converters
53.
pulse width modulated inverters
54.
pulse width modulated power converters
55.
pulse width modulation
56.
pulse width modulation (PWM)
57.
pulse width modulation (PWM) inverters
58.
pulse width modulation converter
59.
pulse width modulation converters
60.
pulse width modulation inverters
61.
Pulse-Amplitude-Modulation (PAM)
62.
pulse-width modulation
63.
pulse-width modulation (PWM)
64.
pulse-width modulations
65.
rectangular pulse
66.
sinusoidal pulse width modulator (SPWM)
67.
space vector pulse width modulation
68.
space vector pulse width modulation (SVPWM)
69.
space vector pulse-width modulation
70.
accelerated shelf-life test
71.
adaptive test strategy generation
72.
antigen test
73.
Applications in Test Engineering
74.
ASTM G65 dry sand rubber wheel abrasion test
75.
Automated Synthesis of Software-based Self-test
76.
automated test environment
77.
automated test pattern generation
78.
automatic test case generation
79.
automatic test pattern generation
80.
automatic test program generation
81.
Auvergne test-bed
82.
battery test
83.
behavioral test
84.
behaviour level test generation
85.
bending test
86.
bit-error rate test
87.
Board and System Test
88.
board test
89.
bounds test
90.
built-in self-test
91.
capillary condensation redistribution test
92.
chi-square test
93.
closed bottle test
94.
cognitive screening test
95.
compartment fire test
96.
compartment test
97.
cone penetration test (CPT)
98.
COVID-19 antigen test
99.
cutting test
100.
cybersecurity test bed
101.
DDR4 interconnect test
102.
design and test
103.
design-for-test
104.
deterministic test sequences
105.
diagnostic test
106.
digital test
107.
Digital test and testable design
108.
drawing test
109.
dry droplet antimicrobial test
110.
embedded test
111.
fan pressurisation test
112.
final test result prediction
113.
four-point bending test
114.
FPGA based test
115.
FPGA-Assisted Test
116.
FPGA-centric test
117.
functional self-test
118.
functional test generation
119.
Granger causality test
120.
hardness test
121.
Hierarchical Multi-level Test Generation
122.
high-level synthesis for test
123.
high-level test data generation
124.
highlevel test generation
125.
high-speed serial link test
126.
IEEE 9 bus test system
127.
implementation-independent test generation
128.
in situ tensile test in SEM
129.
industrial field test
130.
in-situ tensile test in SEM
131.
Johansen cointegration test
132.
Kolmogorov-Smirnov test
133.
load test
134.
logic built-in self-test
135.
Luria alternating series test
136.
Mann–Kendall test
137.
Mann-Kendall trend test
138.
memory interconnect test
139.
microprocessor test
140.
Model test
141.
multiplier test
142.
offline test generation
143.
orthogonal test
144.
package test analysis
145.
parallel design and test
146.
performance test
147.
piezocone penetration test (CPTu)
148.
Point Load Test index
149.
pressurisation test
150.
processor-centric board test
151.
progressive damage test
152.
provably correct test generation
153.
pseudo-exhaustive test
154.
purity test
155.
real-time room temperature test
156.
rolling thin film oven test
157.
rtioco-based timed test sequences
158.
seasonal Mann Kendall test
159.
seismic piezocone penetration test
160.
self-test
161.
self-test architectures
162.
sentence writing test
163.
serial sevens test
164.
ship towing test tank
165.
similar material simulation test
166.
small-scale fire test
167.
small‐scale test
168.
software based self-test
169.
software-based self-test
170.
software-based self-test (SBST)
171.
soil phosphorus (P) test
172.
standard test method
173.
static load test
174.
static-dynamic probing test (SDT)
175.
stress test
176.
system level test
177.
teaching design and test of systems
178.
tensile test
179.
tensile test
180.
test
181.
test and evaluation platform
182.
test automation
183.
test bench
184.
test coverage
185.
test driven development
186.
test driven modelling
187.
test embankment
188.
test equipment
189.
test generation
190.
test generation and fault diagnosis
191.
Test Group Generation for Detecting Multiple Faults
192.
test groups
193.
test model design
194.
test optimization
195.
test packets
196.
test path synthesis
197.
test patterns
198.
test point insertion
199.
test program generation
200.
test reference year
201.
test replication
202.
test scenario description language
203.
test-bed
204.
test-chips
205.
test-house
206.
test-pattern
207.
test-suite reduction
208.
Three-point bending test
209.
unit root test
210.
usability platform test
211.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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