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microprocessor test (keyword)
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1
book article
On automatic software-based self-test program generation based on high-Level decision diagrams
Jasnetski, Artjom
;
Ubar, Raimund-Johannes
;
Tšertov, Anton
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
2016
/
p. 177
http://dx.doi.org/10.1109/LATW.2016.7483357
book article
Number of records 1, displaying
1 - 1
keyword
149
1.
microprocessor test
2.
microprocessor testing
3.
microprocessor
4.
microprocessor architecture
5.
microprocessor chips
6.
microprocessor systems
7.
shakti microprocessor
8.
accelerated shelf-life test
9.
adaptive test strategy generation
10.
antigen test
11.
Applications in Test Engineering
12.
ASTM G65 dry sand rubber wheel abrasion test
13.
Automated Synthesis of Software-based Self-test
14.
automated test environment
15.
automated test pattern generation
16.
automatic test case generation
17.
automatic test pattern generation
18.
automatic test program generation
19.
Auvergne test-bed
20.
battery test
21.
behavioral test
22.
behaviour level test generation
23.
bending test
24.
bit-error rate test
25.
Board and System Test
26.
board test
27.
bounds test
28.
built-in self-test
29.
capillary condensation redistribution test
30.
chi-square test
31.
closed bottle test
32.
cognitive screening test
33.
compartment fire test
34.
compartment test
35.
cone penetration test (CPT)
36.
COVID-19 antigen test
37.
cutting test
38.
cybersecurity test bed
39.
DDR4 interconnect test
40.
design and test
41.
design-for-test
42.
deterministic test sequences
43.
diagnostic test
44.
digital test
45.
Digital test and testable design
46.
double-pulse test
47.
drawing test
48.
dry droplet antimicrobial test
49.
embedded test
50.
fan pressurisation test
51.
final test result prediction
52.
four-point bending test
53.
FPGA based test
54.
FPGA-Assisted Test
55.
FPGA-centric test
56.
functional self-test
57.
functional test generation
58.
Granger causality test
59.
hardness test
60.
Hierarchical Multi-level Test Generation
61.
high-level synthesis for test
62.
high-level test data generation
63.
highlevel test generation
64.
high-speed serial link test
65.
IEEE 9 bus test system
66.
implementation-independent test generation
67.
in situ tensile test in SEM
68.
industrial field test
69.
in-situ tensile test in SEM
70.
Johansen cointegration test
71.
Kolmogorov-Smirnov test
72.
load test
73.
logic built-in self-test
74.
Luria alternating series test
75.
Mann–Kendall test
76.
Mann-Kendall trend test
77.
memory interconnect test
78.
Model test
79.
multiplier test
80.
offline test generation
81.
orthogonal test
82.
package test analysis
83.
parallel design and test
84.
performance test
85.
piezocone penetration test (CPTu)
86.
Point Load Test index
87.
pressurisation test
88.
processor-centric board test
89.
progressive damage test
90.
provably correct test generation
91.
pseudo-exhaustive test
92.
purity test
93.
real-time room temperature test
94.
rolling thin film oven test
95.
rtioco-based timed test sequences
96.
seasonal Mann Kendall test
97.
seismic piezocone penetration test
98.
self-test
99.
self-test architectures
100.
sentence writing test
101.
serial sevens test
102.
ship towing test tank
103.
similar material simulation test
104.
small-scale fire test
105.
small‐scale test
106.
software based self-test
107.
software-based self-test
108.
software-based self-test (SBST)
109.
soil phosphorus (P) test
110.
standard test method
111.
static load test
112.
static-dynamic probing test (SDT)
113.
stress test
114.
system level test
115.
teaching design and test of systems
116.
tensile test
117.
tensile test
118.
test
119.
test and evaluation platform
120.
test automation
121.
test bench
122.
test coverage
123.
test driven development
124.
test driven modelling
125.
test embankment
126.
test equipment
127.
test generation
128.
test generation and fault diagnosis
129.
Test Group Generation for Detecting Multiple Faults
130.
test groups
131.
test model design
132.
test optimization
133.
test packets
134.
test path synthesis
135.
test patterns
136.
test point insertion
137.
test program generation
138.
test reference year
139.
test replication
140.
test scenario description language
141.
test-bed
142.
test-chips
143.
test-house
144.
test-pattern
145.
test-suite reduction
146.
Three-point bending test
147.
unit root test
148.
usability platform test
149.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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