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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
78
1.
microprocessor testing
2.
microprocessor
3.
microprocessor chips
4.
microprocessor systems
5.
microprocessor test
6.
shakti microprocessor
7.
accelerated testing
8.
acoustomechanical testing
9.
anaerobic testing
10.
aspect-oriented testing
11.
at-speed testing
12.
benchmark testing
13.
Berridge testing
14.
cancer genomic testing
15.
compliance testing
16.
compositional testing
17.
computer aided testing
18.
conformance testing
19.
courses on electronic testing and design
20.
cybersecurity testing
21.
D. non-destructive testing
22.
design field testing
23.
eddy current testing
24.
erosion testing
25.
fatigue testing
26.
fire testing
27.
hierarchical testing
28.
hypotheses testing
29.
integration testing
30.
laboratory scale testing
31.
load testing
32.
macro mechanical testing and green surface tribology
33.
material testing
34.
materials testing
35.
measurement and testing
36.
mechanical testing
37.
memory testing
38.
metamorphic testing
39.
model based testing
40.
model-based mutation testing
41.
model-based testing
42.
mutation testing
43.
network-testing
44.
non destructive testing
45.
nondestructive testing
46.
non-destructive testing
47.
on-site testing
48.
pin on disc wear testing
49.
PMU calibration testing
50.
PMU testing
51.
point-of-care testing
52.
processor core testing
53.
processor testing
54.
real-time HiL testing
55.
regression testing
56.
RISC processor testing
57.
robustness testing
58.
scenario testing
59.
scratch testing
60.
security testing
61.
small-scale fire testing
62.
software testing
63.
software-in-the-loop (SIL) testing
64.
stand-alone testing
65.
stress-testing
66.
substation testing methods
67.
system testing
68.
tensile testing
69.
testing
70.
testing methods
71.
testing of digital devices
72.
testing of generator
73.
testing of phasor measurement units
74.
two-dimensional array testing
75.
wafer testing
76.
wear testing
77.
vibration testing
78.
virtual testing
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