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microprocessor testing (keyword)
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1
book article
High-level fault diagnosis in RISC processors with Implementation-Independent Functional Test
Oyeniran, Adeboye Stephen
;
Jenihhin, Maksim
;
Raik, Jaan
;
Ubar, Raimund-Johannes
2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) : Nicosia, Cyprus : 04-06 July 2022
2022
/
p. 32-37
https://doi.org/10.1109/ISVLSI54635.2022.00019
book article
2
book article
Implementation-independent functional test generation for RISC microprocessors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]
2019
/
p. 82-87 : ill
https://doi.org/10.1109/VLSI-SoC.2019.8920323
book article
3
book article
Minimization of the high-level fault model for microprocessor control parts [Online resource]
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Medaiyese, Olusiji
BEC 2018 : 2018 16th Biennial Baltic Electronics Conference (BEC) : proceedings of the 16th Biennial Baltic Electronics Conference, October 8-10, 2018
2018
/
4 p.: ill
https://doi.org/10.1109/BEC.2018.8600980
book article
4
book article EST
/
book article ENG
On test generation for microprocessors for extended class of functional faults
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
VLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers
2020
/
p. 21-44
https://doi.org/10.1007/978-3-030-53273-4
Conference proceedings at Scopus
Article at Scopus
book article EST
/
book article ENG
Number of records 4, displaying
1 - 4
keyword
86
1.
microprocessor testing
2.
Implementation-Independent Testing of Microprocessors
3.
microprocessor
4.
microprocessor architecture
5.
microprocessor chips
6.
microprocessor systems
7.
microprocessor test
8.
shakti microprocessor
9.
accelerated testing
10.
acoustomechanical testing
11.
anaerobic testing
12.
aspect-oriented testing
13.
at-speed testing
14.
benchmark testing
15.
Berridge testing
16.
burst testing
17.
cancer genomic testing
18.
compliance testing
19.
compositional testing
20.
computer aided testing
21.
conformance testing
22.
courses on electronic testing and design
23.
cybersecurity testing
24.
D. non-destructive testing
25.
deformation testing
26.
design field testing
27.
destructive testing
28.
eddy current testing
29.
eddy current testing (ECT)
30.
erosion testing
31.
fatigue testing
32.
fire testing
33.
hierarchical testing
34.
hypotheses testing
35.
integration testing
36.
laboratory scale testing
37.
load testing
38.
macro mechanical testing and green surface tribology
39.
material testing
40.
materials testing
41.
measurement and testing
42.
mechanical testing
43.
memory testing
44.
metamorphic testing
45.
model based testing
46.
model-based mutation testing
47.
model-based testing
48.
mutation testing
49.
network-testing
50.
non destructive testing
51.
nondestructive testing
52.
non-destructive testing
53.
on-site testing
54.
pin on disc wear testing
55.
PMU calibration testing
56.
PMU testing
57.
point-of-care testing
58.
processor core testing
59.
processor testing
60.
real-time HiL testing
61.
regression testing
62.
RISC processor testing
63.
robustness testing
64.
safety and security testing
65.
scenario testing
66.
scratch testing
67.
security testing
68.
small-scale fire testing
69.
software testing
70.
software-in-the-loop (SIL) testing
71.
stand-alone testing
72.
stress-testing
73.
substation testing methods
74.
system testing
75.
tensile testing
76.
testing
77.
testing methods
78.
testing of digital devices
79.
testing of generator
80.
testing of phasor measurement units
81.
two-dimensional array testing
82.
ultrasonic testing
83.
wafer testing
84.
wear testing
85.
vibration testing
86.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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