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FPGA-centric test (keyword)
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book article
Embedded instrumentation toolbox for screening marginal defects and outliers for production
Odintsov, Sergei
;
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Igor
IEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings
2017
/
p. 336-334 : ill
https://doi.org/10.1109/AUTEST.2017.8080516
book article
Number of records 1, displaying
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keyword
157
1.
FPGA-centric test
2.
processor-centric board test
3.
FPGA based test
4.
FPGA-Assisted Test
5.
citizen-centric
6.
data-centric construction
7.
data-centric systems
8.
human-centric design
9.
patient-centric care
10.
patient-centric systems
11.
processor-centric board
12.
user-centric public services
13.
value centric design
14.
value-centric business
15.
value-centric design
16.
value-centric model
17.
Field Programmable Gate Array (FPGA)
18.
Field-Programmable Gate Array (FPGA)
19.
FPGA
20.
FPGA (field-programmable gate array)
21.
FPGA based lab kit
22.
FPGA implementation
23.
FPGA redaction
24.
FPGA/PSoC design
25.
FPGA-based development boards
26.
FPGA-based prototyping
27.
FPGA-Embedded Instrument
28.
Opal Kelly field programmable gate array (FPGA)
29.
recycled FPGA detection
30.
accelerated shelf-life test
31.
adaptive test strategy generation
32.
antigen test
33.
ASTM G65 dry sand rubber wheel abrasion test
34.
automated test environment
35.
automated test pattern generation
36.
automatic test case generation
37.
automatic test pattern generation
38.
automatic test program generation
39.
Auvergne test-bed
40.
battery test
41.
behavioral test
42.
behaviour level test generation
43.
bending test
44.
bit-error rate test
45.
Board and System Test
46.
board test
47.
bounds test
48.
built-in self-test
49.
capillary condensation redistribution test
50.
chi-square test
51.
closed bottle test
52.
cognitive screening test
53.
compartment fire test
54.
compartment test
55.
cone penetration test (CPT)
56.
COVID-19 antigen test
57.
cutting test
58.
cybersecurity test bed
59.
DDR4 interconnect test
60.
design and test
61.
design-for-test
62.
deterministic test sequences
63.
diagnostic test
64.
digital test
65.
Digital test and testable design
66.
double-pulse test
67.
drawing test
68.
dry droplet antimicrobial test
69.
embedded test
70.
fan pressurisation test
71.
final test result prediction
72.
four-point bending test
73.
functional self-test
74.
functional test generation
75.
Granger causality test
76.
hardness test
77.
high-level synthesis for test
78.
high-level test data generation
79.
highlevel test generation
80.
high-speed serial link test
81.
IEEE 9 bus test system
82.
implementation-independent test generation
83.
in situ tensile test in SEM
84.
industrial field test
85.
in-situ tensile test in SEM
86.
Johansen cointegration test
87.
Kolmogorov-Smirnov test
88.
load test
89.
logic built-in self-test
90.
Luria alternating series test
91.
Mann–Kendall test
92.
memory interconnect test
93.
microprocessor test
94.
Model test
95.
multiplier test
96.
offline test generation
97.
orthogonal test
98.
package test analysis
99.
parallel design and test
100.
performance test
101.
piezocone penetration test (CPTu)
102.
Point Load Test index
103.
pressurisation test
104.
progressive damage test
105.
provably correct test generation
106.
pseudo-exhaustive test
107.
purity test
108.
rtioco-based timed test sequences
109.
seasonal Mann Kendall test
110.
seismic piezocone penetration test
111.
self-test
112.
self-test architectures
113.
sentence writing test
114.
serial sevens test
115.
ship towing test tank
116.
similar material simulation test
117.
small‐scale test
118.
software based self-test
119.
software-based self-test
120.
software-based self-test (SBST)
121.
soil phosphorus (P) test
122.
standard test method
123.
static load test
124.
static-dynamic probing test (SDT)
125.
stress test
126.
system level test
127.
teaching design and test of systems
128.
tensile test
129.
test
130.
test and evaluation platform
131.
test bench
132.
test coverage
133.
test driven development
134.
test driven modelling
135.
test embankment
136.
test equipment
137.
test generation
138.
test generation and fault diagnosis
139.
test groups
140.
test model design
141.
test optimization
142.
test packets
143.
test path synthesis
144.
test patterns
145.
test point insertion
146.
test program generation
147.
test reference year
148.
test replication
149.
test scenario description language
150.
test-bed
151.
test-chips
152.
test-house
153.
test-pattern
154.
test-suite reduction
155.
Three-point bending test
156.
unit root test
157.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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