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book article
Embedded instrumentation toolbox for screening marginal defects and outliers for production
Odintsov, Sergei
;
Jutman, Artur
;
Devadze, Sergei
;
Aleksejev, Igor
IEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings
2017
/
p. 336-334 : ill
https://doi.org/10.1109/AUTEST.2017.8080516
book article
Number of records 1, displaying
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keyword
174
1.
FPGA-centric test
2.
processor-centric board test
3.
FPGA based test
4.
FPGA-Assisted Test
5.
citizen-centric
6.
data-centric construction
7.
data-centric systems
8.
firm (goods) centric
9.
human-centric design
10.
patient-centric care
11.
patient-centric systems
12.
processor-centric board
13.
user-centric public services
14.
value centric design
15.
value-centric business
16.
value-centric design
17.
value-centric model
18.
Field Programmable Gate Array (FPGA)
19.
Field-Programmable Gate Array (FPGA)
20.
field-programmable gate arrays (FPGA)
21.
FPGA
22.
FPGA (field-programmable gate array)
23.
FPGA based lab kit
24.
FPGA implementation
25.
FPGA redaction
26.
FPGA/PSoC design
27.
FPGA-based development boards
28.
FPGA-based prototyping
29.
FPGA-Embedded Instrument
30.
Opal Kelly field programmable gate array (FPGA)
31.
recycled FPGA detection
32.
SoC FPGA
33.
accelerated shelf-life test
34.
adaptive test strategy generation
35.
antigen test
36.
Applications in Test Engineering
37.
ASTM G65 dry sand rubber wheel abrasion test
38.
Automated Synthesis of Software-based Self-test
39.
automated test environment
40.
automated test pattern generation
41.
automatic test case generation
42.
automatic test pattern generation
43.
automatic test program generation
44.
Auvergne test-bed
45.
battery test
46.
behavioral test
47.
behaviour level test generation
48.
bending test
49.
bit-error rate test
50.
Board and System Test
51.
board test
52.
bounds test
53.
built-in self-test
54.
capillary condensation redistribution test
55.
chi-square test
56.
closed bottle test
57.
cognitive screening test
58.
compartment fire test
59.
compartment test
60.
cone penetration test (CPT)
61.
COVID-19 antigen test
62.
cutting test
63.
cybersecurity test bed
64.
DDR4 interconnect test
65.
design and test
66.
design-for-test
67.
deterministic test sequences
68.
diagnostic test
69.
digital test
70.
Digital test and testable design
71.
double-pulse test
72.
drawing test
73.
dry droplet antimicrobial test
74.
Embedded figures test
75.
embedded test
76.
fan pressurisation test
77.
final test result prediction
78.
four-point bending test
79.
functional self-test
80.
functional test generation
81.
Granger causality test
82.
hardness test
83.
Hierarchical Multi-level Test Generation
84.
high-level synthesis for test
85.
high-level test data generation
86.
highlevel test generation
87.
high-speed serial link test
88.
IEEE 9 bus test system
89.
implementation-independent test generation
90.
in situ tensile test in SEM
91.
industrial field test
92.
in-situ tensile test in SEM
93.
Johansen cointegration test
94.
Kolmogorov-Smirnov test
95.
load test
96.
logic built-in self-test
97.
Luria alternating series test
98.
Mann–Kendall test
99.
Mann-Kendall trend test
100.
memory interconnect test
101.
microprocessor test
102.
Model test
103.
multiplier test
104.
offline test generation
105.
orthogonal test
106.
package test analysis
107.
parallel design and test
108.
performance test
109.
piezocone penetration test (CPTu)
110.
Point Load Test index
111.
pressurisation test
112.
progressive damage test
113.
Provably Correct Test Development
114.
provably correct test generation
115.
pseudo-exhaustive test
116.
purity test
117.
real-time room temperature test
118.
rolling thin film oven test
119.
rtioco-based timed test sequences
120.
seasonal Mann Kendall test
121.
seismic piezocone penetration test
122.
self-test
123.
self-test architectures
124.
sentence writing test
125.
serial sevens test
126.
ship towing test tank
127.
similar material simulation test
128.
small-scale fire test
129.
small‐scale test
130.
software based self-test
131.
software-based self-test
132.
software-based self-test (SBST)
133.
soil phosphorus (P) test
134.
standard test method
135.
static load test
136.
static-dynamic probing test (SDT)
137.
stress test
138.
system level test
139.
teaching design and test of systems
140.
tensile test
141.
tensile test
142.
test
143.
Test Adapters
144.
test and evaluation platform
145.
test automation
146.
test bench
147.
test coverage
148.
test driven development
149.
test driven modelling
150.
test embankment
151.
test equipment
152.
test generation
153.
test generation and fault diagnosis
154.
Test Group Generation for Detecting Multiple Faults
155.
test groups
156.
test model design
157.
test optimization
158.
test packets
159.
test path synthesis
160.
test patterns
161.
test point insertion
162.
test program generation
163.
test reference year
164.
test replication
165.
test scenario description language
166.
test-bed
167.
test-chips
168.
test-house
169.
test-pattern
170.
test-suite reduction
171.
Three-point bending test
172.
unit root test
173.
usability platform test
174.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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