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FPGA-Assisted Test (keyword)
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book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
Number of records 1, displaying
1 - 1
keyword
185
1.
FPGA-Assisted Test
2.
FPGA based test
3.
FPGA-centric test
4.
Field Programmable Gate Array (FPGA)
5.
Field-Programmable Gate Array (FPGA)
6.
field-programmable gate arrays (FPGA)
7.
FPGA
8.
FPGA (field-programmable gate array)
9.
FPGA based lab kit
10.
FPGA implementation
11.
FPGA redaction
12.
FPGA/PSoC design
13.
FPGA-based development boards
14.
FPGA-based prototyping
15.
FPGA-Embedded Instrument
16.
Opal Kelly field programmable gate array (FPGA)
17.
recycled FPGA detection
18.
SoC FPGA
19.
aerosol assisted chemical vapour deposition (AACVD)
20.
assisted living
21.
assisted reproductive technologies
22.
capacitor assisted extended boost qZSI
23.
CdS chlorine assisted optimization
24.
computer assisted language learning
25.
computer-assisted language learning (CALL)
26.
diode assisted extended boost qZSI
27.
fan-assisted radiator
28.
fan-assisted radiators
29.
Internet assisted laboratories
30.
laser-assisted directed energy deposition
31.
matrix-assisted laser
32.
microwave assisted synthesis
33.
microwave-assisted synthesis
34.
permanent magnet assisted synchronous reluctance machines
35.
permanent magnet assisted synchronous reluctance motor
36.
permanent magnet-assisted synchronous reluctance motor
37.
photo-assisted electrodeposition
38.
robot-assisted education
39.
robot-assisted teaching
40.
technology-assisted refereeing
41.
Ultrasound-assisted transesterification
42.
wind-assisted propulsion
43.
accelerated shelf-life test
44.
adaptive test strategy generation
45.
antigen test
46.
Applications in Test Engineering
47.
ASTM G65 dry sand rubber wheel abrasion test
48.
Automated Synthesis of Software-based Self-test
49.
automated test environment
50.
automated test pattern generation
51.
automatic test case generation
52.
automatic test pattern generation
53.
automatic test program generation
54.
Auvergne test-bed
55.
battery test
56.
behavioral test
57.
behaviour level test generation
58.
bending test
59.
bit-error rate test
60.
Board and System Test
61.
board test
62.
bounds test
63.
built-in self-test
64.
capillary condensation redistribution test
65.
chi-square test
66.
closed bottle test
67.
cognitive screening test
68.
compartment fire test
69.
compartment test
70.
cone penetration test (CPT)
71.
COVID-19 antigen test
72.
cutting test
73.
cybersecurity test bed
74.
DDR4 interconnect test
75.
design and test
76.
design-for-test
77.
deterministic test sequences
78.
diagnostic test
79.
digital test
80.
Digital test and testable design
81.
double-pulse test
82.
drawing test
83.
dry droplet antimicrobial test
84.
Embedded figures test
85.
embedded test
86.
fan pressurisation test
87.
final test result prediction
88.
four-point bending test
89.
functional self-test
90.
functional test generation
91.
Granger causality test
92.
hardness test
93.
Hierarchical Multi-level Test Generation
94.
high-level synthesis for test
95.
high-level test data generation
96.
highlevel test generation
97.
high-speed serial link test
98.
IEEE 9 bus test system
99.
implementation-independent test generation
100.
in situ tensile test in SEM
101.
industrial field test
102.
in-situ tensile test in SEM
103.
Johansen cointegration test
104.
Kolmogorov-Smirnov test
105.
load test
106.
logic built-in self-test
107.
Luria alternating series test
108.
Mann–Kendall test
109.
Mann-Kendall trend test
110.
memory interconnect test
111.
microprocessor test
112.
Model test
113.
multiplier test
114.
offline test generation
115.
orthogonal test
116.
package test analysis
117.
parallel design and test
118.
performance test
119.
piezocone penetration test (CPTu)
120.
Point Load Test index
121.
pressurisation test
122.
processor-centric board test
123.
progressive damage test
124.
Provably Correct Test Development
125.
provably correct test generation
126.
pseudo-exhaustive test
127.
purity test
128.
real-time room temperature test
129.
rolling thin film oven test
130.
rtioco-based timed test sequences
131.
seasonal Mann Kendall test
132.
seismic piezocone penetration test
133.
self-test
134.
self-test architectures
135.
sentence writing test
136.
serial sevens test
137.
ship towing test tank
138.
similar material simulation test
139.
small-scale fire test
140.
small‐scale test
141.
software based self-test
142.
software-based self-test
143.
software-based self-test (SBST)
144.
soil phosphorus (P) test
145.
standard test method
146.
static load test
147.
static-dynamic probing test (SDT)
148.
stress test
149.
system level test
150.
teaching design and test of systems
151.
tensile test
152.
tensile test
153.
test
154.
Test Adapters
155.
test and evaluation platform
156.
test automation
157.
test bench
158.
test coverage
159.
test driven development
160.
test driven modelling
161.
test embankment
162.
test equipment
163.
test generation
164.
test generation and fault diagnosis
165.
Test Group Generation for Detecting Multiple Faults
166.
test groups
167.
test model design
168.
test optimization
169.
test packets
170.
test path synthesis
171.
test patterns
172.
test point insertion
173.
test program generation
174.
test reference year
175.
test replication
176.
test scenario description language
177.
test-bed
178.
test-chips
179.
test-house
180.
test-pattern
181.
test-suite reduction
182.
Three-point bending test
183.
unit root test
184.
usability platform test
185.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
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