Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
FPGA-Assisted Test (keyword)
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
All fields
Source search
Author search
Subject term search
Title search
starts with
containes
exact match
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
1
Look more..
(2/184)
Export
export all inquiry results
(1)
Save TXT fail
Save PDF fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
Ways for board and system test to benefit from FPGA embedded instrumentation
Ehrenberg, Heiko
;
Odintsov, Sergei
;
Devadze, Sergei
;
Jutman, Artur
;
Aleksejev, Igor
;
Wenzel, Thomas
2019 IEEE AUTOTESTCON
2019
/
10 p : ill
https://doi.org/10.1109/AUTOTESTCON43700.2019.8961057
book article
Number of records 1, displaying
1 - 1
keyword
182
1.
FPGA-Assisted Test
2.
FPGA based test
3.
FPGA-centric test
4.
Field Programmable Gate Array (FPGA)
5.
Field-Programmable Gate Array (FPGA)
6.
field-programmable gate arrays (FPGA)
7.
FPGA
8.
FPGA (field-programmable gate array)
9.
FPGA based lab kit
10.
FPGA implementation
11.
FPGA redaction
12.
FPGA/PSoC design
13.
FPGA-based development boards
14.
FPGA-based prototyping
15.
FPGA-Embedded Instrument
16.
Opal Kelly field programmable gate array (FPGA)
17.
recycled FPGA detection
18.
SoC FPGA
19.
aerosol assisted chemical vapour deposition (AACVD)
20.
assisted living
21.
assisted reproductive technologies
22.
capacitor assisted extended boost qZSI
23.
CdS chlorine assisted optimization
24.
computer assisted language learning
25.
computer-assisted language learning (CALL)
26.
diode assisted extended boost qZSI
27.
fan-assisted radiator
28.
fan-assisted radiators
29.
Internet assisted laboratories
30.
laser-assisted directed energy deposition
31.
matrix-assisted laser
32.
microwave assisted synthesis
33.
microwave-assisted synthesis
34.
permanent magnet assisted synchronous reluctance machines
35.
permanent magnet assisted synchronous reluctance motor
36.
permanent magnet-assisted synchronous reluctance motor
37.
photo-assisted electrodeposition
38.
robot-assisted education
39.
robot-assisted teaching
40.
technology-assisted refereeing
41.
Ultrasound-assisted transesterification
42.
wind-assisted propulsion
43.
accelerated shelf-life test
44.
adaptive test strategy generation
45.
antigen test
46.
Applications in Test Engineering
47.
ASTM G65 dry sand rubber wheel abrasion test
48.
Automated Synthesis of Software-based Self-test
49.
automated test environment
50.
automated test pattern generation
51.
automatic test case generation
52.
automatic test pattern generation
53.
automatic test program generation
54.
Auvergne test-bed
55.
battery test
56.
behavioral test
57.
behaviour level test generation
58.
bending test
59.
bit-error rate test
60.
Board and System Test
61.
board test
62.
bounds test
63.
built-in self-test
64.
capillary condensation redistribution test
65.
chi-square test
66.
closed bottle test
67.
cognitive screening test
68.
compartment fire test
69.
compartment test
70.
cone penetration test (CPT)
71.
COVID-19 antigen test
72.
cutting test
73.
cybersecurity test bed
74.
DDR4 interconnect test
75.
design and test
76.
design-for-test
77.
deterministic test sequences
78.
diagnostic test
79.
digital test
80.
Digital test and testable design
81.
double-pulse test
82.
drawing test
83.
dry droplet antimicrobial test
84.
embedded test
85.
fan pressurisation test
86.
final test result prediction
87.
four-point bending test
88.
functional self-test
89.
functional test generation
90.
Granger causality test
91.
hardness test
92.
Hierarchical Multi-level Test Generation
93.
high-level synthesis for test
94.
high-level test data generation
95.
highlevel test generation
96.
high-speed serial link test
97.
IEEE 9 bus test system
98.
implementation-independent test generation
99.
in situ tensile test in SEM
100.
industrial field test
101.
in-situ tensile test in SEM
102.
Johansen cointegration test
103.
Kolmogorov-Smirnov test
104.
load test
105.
logic built-in self-test
106.
Luria alternating series test
107.
Mann–Kendall test
108.
Mann-Kendall trend test
109.
memory interconnect test
110.
microprocessor test
111.
Model test
112.
multiplier test
113.
offline test generation
114.
orthogonal test
115.
package test analysis
116.
parallel design and test
117.
performance test
118.
piezocone penetration test (CPTu)
119.
Point Load Test index
120.
pressurisation test
121.
processor-centric board test
122.
progressive damage test
123.
provably correct test generation
124.
pseudo-exhaustive test
125.
purity test
126.
real-time room temperature test
127.
rolling thin film oven test
128.
rtioco-based timed test sequences
129.
seasonal Mann Kendall test
130.
seismic piezocone penetration test
131.
self-test
132.
self-test architectures
133.
sentence writing test
134.
serial sevens test
135.
ship towing test tank
136.
similar material simulation test
137.
small-scale fire test
138.
small‐scale test
139.
software based self-test
140.
software-based self-test
141.
software-based self-test (SBST)
142.
soil phosphorus (P) test
143.
standard test method
144.
static load test
145.
static-dynamic probing test (SDT)
146.
stress test
147.
system level test
148.
teaching design and test of systems
149.
tensile test
150.
tensile test
151.
test
152.
test and evaluation platform
153.
test automation
154.
test bench
155.
test coverage
156.
test driven development
157.
test driven modelling
158.
test embankment
159.
test equipment
160.
test generation
161.
test generation and fault diagnosis
162.
Test Group Generation for Detecting Multiple Faults
163.
test groups
164.
test model design
165.
test optimization
166.
test packets
167.
test path synthesis
168.
test patterns
169.
test point insertion
170.
test program generation
171.
test reference year
172.
test replication
173.
test scenario description language
174.
test-bed
175.
test-chips
176.
test-house
177.
test-pattern
178.
test-suite reduction
179.
Three-point bending test
180.
unit root test
181.
usability platform test
182.
1995 ECC benchmark test
subject term
2
1.
European Test Symposium (ETS)
2.
16PF (test)
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT