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mutation testing (keyword)
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1
journal article
On the reuse of TLM mutation analysis at RTL
Guarnieri, Valerio
;
Hantson, Hanno
;
Raik, Jaan
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
Journal of electronic testing : theory and applications
2012
/
p. 435-448 : ill
https://link.springer.com/article/10.1007/s10836-012-5303-6
journal article
Number of records 1, displaying
1 - 1
keyword
87
1.
model-based mutation testing
2.
mutation testing
3.
missense mutation
4.
mutation
5.
mutation analysis
6.
Mutation and crossover operators
7.
mutation operators
8.
specification mutation
9.
timed automata mutation
10.
accelerated testing
11.
acoustomechanical testing
12.
anaerobic testing
13.
aspect-oriented testing
14.
at-speed testing
15.
benchmark testing
16.
Berridge testing
17.
burst testing
18.
cancer genomic testing
19.
compliance testing
20.
compositional testing
21.
computer aided testing
22.
conformance testing
23.
courses on electronic testing and design
24.
cybersecurity testing
25.
D. non-destructive testing
26.
deformation testing
27.
design field testing
28.
destructive testing
29.
eddy current testing
30.
eddy current testing (ECT)
31.
erosion testing
32.
fatigue testing
33.
fire testing
34.
hierarchical testing
35.
hypotheses testing
36.
Implementation-Independent Testing of Microprocessors
37.
integration testing
38.
laboratory scale testing
39.
load testing
40.
macro mechanical testing and green surface tribology
41.
material testing
42.
materials testing
43.
measurement and testing
44.
mechanical testing
45.
memory testing
46.
metamorphic testing
47.
microprocessor testing
48.
model based testing
49.
model-based testing
50.
network-testing
51.
non destructive testing
52.
nondestructive testing
53.
non-destructive testing
54.
on-site testing
55.
pin on disc wear testing
56.
PMU calibration testing
57.
PMU testing
58.
point-of-care testing
59.
processor core testing
60.
processor testing
61.
real-time HiL testing
62.
regression testing
63.
RISC processor testing
64.
robustness testing
65.
safety and security testing
66.
scenario testing
67.
scratch testing
68.
security testing
69.
small-scale fire testing
70.
software testing
71.
software-in-the-loop (SIL) testing
72.
stand-alone testing
73.
stress-testing
74.
substation testing methods
75.
system testing
76.
tensile testing
77.
testing
78.
testing methods
79.
testing of digital devices
80.
testing of generator
81.
testing of phasor measurement units
82.
two-dimensional array testing
83.
ultrasonic testing
84.
wafer testing
85.
wear testing
86.
vibration testing
87.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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