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accelerated testing (keyword)
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journal article EST
/
journal article ENG
Design for accelerated testing of DC-link capacitors in photovoltaic inverters based on mission profiles
Sangwongwanich, Ariya
;
Shen, Yanfeng
;
Chub, Andrii
;
Liivik, Elizaveta
;
Vinnikov, Dmitri
;
Wang, Huai
;
Blaabjerg, Frede
IEEE transactions on industry applications
2021
/
p. 741−753
https://doi.org/10.1109/TIA.2020.3030568
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Article at WOS
journal article EST
/
journal article ENG
2
book article EST
/
book article ENG
Mission profile-based accelerated testing of DC-link capacitors in photovoltaic inverters
Sangwongwanich, Ariya
;
Shen, Yanfeng
;
Chub, Andrii
;
Liivik, Elizaveta
;
Vinnikov, Dmitri
;
Wang, Huai
;
Blaabjerg, Frede
Thirty-Fourth Annual IEEE Applied Power Electronics Conference and Exposition, March 17 – 21, 2019, Anaheim, California
2019
/
p. 2833-2840 : ill
https://doi.org/10.1109/APEC.2019.8721794
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book article EST
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book article ENG
Number of records 2, displaying
1 - 2
keyword
84
1.
accelerated testing
2.
accelerated carbonation
3.
accelerated shelf-life test
4.
accelerated shelf-life tests
5.
bias corrected and accelerated method
6.
acoustomechanical testing
7.
anaerobic testing
8.
aspect-oriented testing
9.
at-speed testing
10.
benchmark testing
11.
Berridge testing
12.
burst testing
13.
cancer genomic testing
14.
compliance testing
15.
compositional testing
16.
computer aided testing
17.
conformance testing
18.
courses on electronic testing and design
19.
cybersecurity testing
20.
D. non-destructive testing
21.
deformation testing
22.
design field testing
23.
destructive testing
24.
eddy current testing
25.
eddy current testing (ECT)
26.
erosion testing
27.
fatigue testing
28.
fire testing
29.
hierarchical testing
30.
hypotheses testing
31.
Implementation-Independent Testing of Microprocessors
32.
integration testing
33.
laboratory scale testing
34.
load testing
35.
macro mechanical testing and green surface tribology
36.
material testing
37.
materials testing
38.
measurement and testing
39.
mechanical testing
40.
memory testing
41.
metamorphic testing
42.
microprocessor testing
43.
model based testing
44.
model-based mutation testing
45.
model-based testing
46.
mutation testing
47.
network-testing
48.
non destructive testing
49.
nondestructive testing
50.
non-destructive testing
51.
on-site testing
52.
pin on disc wear testing
53.
PMU calibration testing
54.
PMU testing
55.
point-of-care testing
56.
processor core testing
57.
processor testing
58.
real-time HiL testing
59.
regression testing
60.
RISC processor testing
61.
robustness testing
62.
safety and security testing
63.
scenario testing
64.
scratch testing
65.
security testing
66.
small-scale fire testing
67.
software testing
68.
software-in-the-loop (SIL) testing
69.
stand-alone testing
70.
stress-testing
71.
substation testing methods
72.
system testing
73.
tensile testing
74.
testing
75.
testing methods
76.
testing of digital devices
77.
testing of generator
78.
testing of phasor measurement units
79.
two-dimensional array testing
80.
ultrasonic testing
81.
wafer testing
82.
wear testing
83.
vibration testing
84.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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