Toggle navigation
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Publications
Profiles
Research Groups
Indexes
Help and information
Eesti keeles
Intranet
Databases
Publications
Searching
My bookmarks
0
at-speed testing (keyword)
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
—
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
—
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
—
All fields
Source search
Author search
Subject term search
Title search
sõna
starts with
exact match
vabatekst
—
Add criteria
Advanced search
filter
Clear
×
types of item
book
..
journal article
..
newspaper article
..
book article
..
dissertation
..
Open Access
..
Scientific publications
..
year
year of publication
Loading..
author
Loading..
TalTech department
Loading..
subject term
Loading..
series
Loading..
name of the person
Loading..
keyword
Loading..
Clear
Number of records
3
Look more..
(2/148)
Export
export all inquiry results
(3)
Save TXT fail
print
Open for editing with marked entries
my bookmarks
display
Bibliographic view
Short view
sort
author ascending
author descending
year of publication ascending
year of publication descending
title ascending
title descending
1
book article
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
book article
2
journal article EST
/
journal article ENG
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
https://doi.org/10.1016/j.micpro.2014.11.002
Journal metrics at Scopus
Article at Scopus
Journal metrics at WOS
Article at WOS
journal article EST
/
journal article ENG
3
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
Number of records 3, displaying
1 - 3
keyword
147
1.
at-speed testing
2.
absolute convergence with speed
3.
A-statistical convergence with speed
4.
boundedness and summability with speed
5.
boundedness with speed
6.
convergence and absolute convergence with speed
7.
convergence and boundedness with speed
8.
convergence and α-absolute convergence with speed
9.
convergence with speed
10.
Drilling speed
11.
high speed boat
12.
high speed craft (HSC)
13.
high speed machining
14.
high speed measurement
15.
high speed planing craft
16.
high-speed
17.
high-speed camera
18.
high-speed craft
19.
high-speed design
20.
high-speed MAS (magic angle spinning)
21.
high-speed planing crafts
22.
high-speed rail
23.
high-speed railway
24.
high-speed serial link test
25.
high-speed spinning
26.
high-speed temperature scanner
27.
high-speed temperature scanner (HSTS)
28.
high-speed thermogravimetric analysis
29.
low speed
30.
operational speed
31.
paranormal absolute convergence with speed
32.
paranormal boundedness with speed
33.
paranormal convergence with speed
34.
paranormed absolute convergence with speed
35.
paranormed boundedness with speed
36.
paranormed convergence with speed
37.
paranormed zero-convergence with speed
38.
peeling speed
39.
Pollen fall speed
40.
speed
41.
speed and position estimation
42.
speed of convergence
43.
speed of releases
44.
speed tracking setpoints
45.
speed-Maddox spaces
46.
summability and absolute summability with speed
47.
summability and boundedness with speed
48.
zero-convergence with speed
49.
variable speed drive
50.
variable speed drives
51.
variable speed wind turbines
52.
variable-speed drives
53.
variable-speed drives (VSDs)
54.
water speed
55.
wind speed
56.
α-absolute convergence with speed
57.
α-absolute summability with speed
58.
accelerated testing
59.
acoustomechanical testing
60.
anaerobic testing
61.
aspect-oriented testing
62.
assessment and testing
63.
benchmark testing
64.
Berridge testing
65.
burst testing
66.
cancer genomic testing
67.
circuit testing
68.
compliance testing
69.
compositional testing
70.
computer aided testing
71.
cone heater testing
72.
conformance testing
73.
courses on electronic testing and design
74.
cybersecurity testing
75.
D. non-destructive testing
76.
deformation testing
77.
design field testing
78.
destructive testing
79.
eddy current testing
80.
eddy current testing (ECT)
81.
erosion testing
82.
fabric testing
83.
fatigue testing
84.
fire testing
85.
hierarchical testing
86.
hypotheses testing
87.
Implementation-Independent Testing of Microprocessors
88.
integration testing
89.
laboratory scale testing
90.
load testing
91.
macro mechanical testing and green surface tribology
92.
material testing
93.
materials testing
94.
measurement and testing
95.
mechanical testing
96.
memory testing
97.
metamorphic testing
98.
microprocessor testing
99.
model based testing
100.
model-based mutation testing
101.
model-based testing
102.
multi-scenario testing
103.
mutation testing
104.
network-testing
105.
non destructive testing
106.
nondestructive testing
107.
non-destructive testing
108.
non-destructive testing (NDT)
109.
On-site drug testing
110.
on-site testing
111.
pin on disc wear testing
112.
PMU calibration testing
113.
PMU testing
114.
point-of-care testing
115.
processor core testing
116.
processor testing
117.
real-time HiL testing
118.
regression testing
119.
RISC processor testing
120.
robustness testing
121.
safety and security testing
122.
scenario testing
123.
Scenario-Based Testing
124.
scratch testing
125.
secure online testing
126.
security testing
127.
shear testing
128.
small-scale fire testing
129.
software testing
130.
software-in-the-loop (SIL) testing
131.
stand-alone testing
132.
stress-testing
133.
substation testing methods
134.
system testing
135.
tensile testing
136.
testing
137.
testing methods
138.
testing of digital devices
139.
testing of generator
140.
testing of phasor measurement units
141.
two-dimensional array testing
142.
ultrasonic testing
143.
wafer testing
144.
wear testing
145.
well testing
146.
vibration testing
147.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
×
match
starts with
ends with
containes
sort
Relevance
ascending
descending
year of publication
author
TalTech department
subject term
series
name of the person
keyword
Otsing
Valikud
0
year of publication
AND
OR
NOT
author
AND
OR
NOT
TalTech department
AND
OR
NOT
subject term
AND
OR
NOT
series
AND
OR
NOT
name of the person
AND
OR
NOT
keyword
AND
OR
NOT