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at-speed testing (keyword)
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1
book article
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
book article
2
journal article
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
http://dx.doi.org/10.1016/j.micpro.2014.11.002
journal article
3
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
Number of records 3, displaying
1 - 3
keyword
117
1.
at-speed testing
2.
boundedness and summability with speed
3.
boundedness with speed
4.
convergence and absolute convergence with speed
5.
convergence and boundedness with speed
6.
convergence and α-absolute convergence with speed
7.
convergence with speed
8.
Drilling speed
9.
high speed boat
10.
high speed craft (HSC)
11.
high speed machining
12.
high speed measurement
13.
high-speed
14.
high-speed craft
15.
high-speed design
16.
high-speed MAS (magic angle spinning)
17.
high-speed planing crafts
18.
high-speed railway
19.
high-speed serial link test
20.
high-speed temperature scanner
21.
high-speed thermogravimetric analysis
22.
low speed
23.
operational speed
24.
paranormed absolute convergence with speed
25.
paranormed boundedness with speed
26.
paranormed convergence with speed
27.
paranormed zero-convergence with speed
28.
Pollen fall speed
29.
speed
30.
speed and position estimation
31.
speed of convergence
32.
speed tracking setpoints
33.
summability and boundedness with speed
34.
zero-convergence with speed
35.
variable speed drive
36.
variable speed drives
37.
variable speed wind turbines
38.
variable-speed drives
39.
variable-speed drives (VSDs)
40.
wind speed
41.
α-absolute convergence with speed
42.
α-absolute summability with speed
43.
accelerated testing
44.
acoustomechanical testing
45.
anaerobic testing
46.
aspect-oriented testing
47.
benchmark testing
48.
Berridge testing
49.
cancer genomic testing
50.
compliance testing
51.
compositional testing
52.
computer aided testing
53.
conformance testing
54.
courses on electronic testing and design
55.
cybersecurity testing
56.
D. non-destructive testing
57.
design field testing
58.
destructive testing
59.
eddy current testing
60.
eddy current testing (ECT)
61.
erosion testing
62.
fatigue testing
63.
fire testing
64.
hierarchical testing
65.
hypotheses testing
66.
integration testing
67.
laboratory scale testing
68.
load testing
69.
macro mechanical testing and green surface tribology
70.
material testing
71.
materials testing
72.
measurement and testing
73.
mechanical testing
74.
memory testing
75.
metamorphic testing
76.
microprocessor testing
77.
model based testing
78.
model-based mutation testing
79.
model-based testing
80.
mutation testing
81.
network-testing
82.
non destructive testing
83.
nondestructive testing
84.
non-destructive testing
85.
on-site testing
86.
pin on disc wear testing
87.
PMU calibration testing
88.
PMU testing
89.
point-of-care testing
90.
processor core testing
91.
processor testing
92.
real-time HiL testing
93.
regression testing
94.
RISC processor testing
95.
robustness testing
96.
safety and security testing
97.
scenario testing
98.
scratch testing
99.
security testing
100.
small-scale fire testing
101.
software testing
102.
software-in-the-loop (SIL) testing
103.
stand-alone testing
104.
stress-testing
105.
substation testing methods
106.
system testing
107.
tensile testing
108.
testing
109.
testing methods
110.
testing of digital devices
111.
testing of generator
112.
testing of phasor measurement units
113.
two-dimensional array testing
114.
wafer testing
115.
wear testing
116.
vibration testing
117.
virtual testing
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