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at-speed testing (keyword)
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1
book article
At-speed self-testing of high-performance pipe-lined processing architectures [Electronic resource]
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
31st Norchip Conference : Vilnius, Lithuania, 11-12 November 2013 : conference program and papers
2013
/
p. 1-6 : ill [USB]
book article
2
journal article EST
/
journal article ENG
Functional self-test of high-performance pipe-lined signal processing architectures
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
;
Devadze, Sergei
;
Raik, Jaan
;
Min, Mart
Microprocessors and microsystems
2015
/
p. 909-918 : ill
https://doi.org/10.1016/j.micpro.2014.11.002
Journal metrics at Scopus
Article at Scopus
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Article at WOS
journal article EST
/
journal article ENG
3
book article
Self-testing of pipe-lined signal processing architectures at-speed
Gorev, Maksim
;
Ubar, Raimund-Johannes
;
Ellervee, Peeter
Info- ja kommunikatsioonitehnoloogia doktorikooli IKTDK seitsmenda aastakonverentsi artiklite kogumik : 15.-16. novembril 2013, Haapsalu
2013
/
p. 25-28 : ill
book article
Number of records 3, displaying
1 - 3
keyword
129
1.
at-speed testing
2.
absolute convergence with speed
3.
A-statistical convergence with speed
4.
boundedness and summability with speed
5.
boundedness with speed
6.
convergence and absolute convergence with speed
7.
convergence and boundedness with speed
8.
convergence and α-absolute convergence with speed
9.
convergence with speed
10.
Drilling speed
11.
high speed boat
12.
high speed craft (HSC)
13.
high speed machining
14.
high speed measurement
15.
high-speed
16.
high-speed craft
17.
high-speed design
18.
high-speed MAS (magic angle spinning)
19.
high-speed planing crafts
20.
high-speed railway
21.
high-speed serial link test
22.
high-speed temperature scanner
23.
high-speed thermogravimetric analysis
24.
low speed
25.
operational speed
26.
paranormal absolute convergence with speed
27.
paranormal boundedness with speed
28.
paranormal convergence with speed
29.
paranormed absolute convergence with speed
30.
paranormed boundedness with speed
31.
paranormed convergence with speed
32.
paranormed zero-convergence with speed
33.
Pollen fall speed
34.
speed
35.
speed and position estimation
36.
speed of convergence
37.
speed of releases
38.
speed tracking setpoints
39.
speed-Maddox spaces
40.
summability and absolute summability with speed
41.
summability and boundedness with speed
42.
zero-convergence with speed
43.
variable speed drive
44.
variable speed drives
45.
variable speed wind turbines
46.
variable-speed drives
47.
variable-speed drives (VSDs)
48.
water speed
49.
wind speed
50.
α-absolute convergence with speed
51.
α-absolute summability with speed
52.
accelerated testing
53.
acoustomechanical testing
54.
anaerobic testing
55.
aspect-oriented testing
56.
benchmark testing
57.
Berridge testing
58.
burst testing
59.
cancer genomic testing
60.
compliance testing
61.
compositional testing
62.
computer aided testing
63.
conformance testing
64.
courses on electronic testing and design
65.
cybersecurity testing
66.
D. non-destructive testing
67.
deformation testing
68.
design field testing
69.
destructive testing
70.
eddy current testing
71.
eddy current testing (ECT)
72.
erosion testing
73.
fatigue testing
74.
fire testing
75.
hierarchical testing
76.
hypotheses testing
77.
Implementation-Independent Testing of Microprocessors
78.
integration testing
79.
laboratory scale testing
80.
load testing
81.
macro mechanical testing and green surface tribology
82.
material testing
83.
materials testing
84.
measurement and testing
85.
mechanical testing
86.
memory testing
87.
metamorphic testing
88.
microprocessor testing
89.
model based testing
90.
model-based mutation testing
91.
model-based testing
92.
mutation testing
93.
network-testing
94.
non destructive testing
95.
nondestructive testing
96.
non-destructive testing
97.
on-site testing
98.
pin on disc wear testing
99.
PMU calibration testing
100.
PMU testing
101.
point-of-care testing
102.
processor core testing
103.
processor testing
104.
real-time HiL testing
105.
regression testing
106.
RISC processor testing
107.
robustness testing
108.
safety and security testing
109.
scenario testing
110.
scratch testing
111.
security testing
112.
small-scale fire testing
113.
software testing
114.
software-in-the-loop (SIL) testing
115.
stand-alone testing
116.
stress-testing
117.
substation testing methods
118.
system testing
119.
tensile testing
120.
testing
121.
testing methods
122.
testing of digital devices
123.
testing of generator
124.
testing of phasor measurement units
125.
two-dimensional array testing
126.
wafer testing
127.
wear testing
128.
vibration testing
129.
virtual testing
TalTech department
1
1.
Testing and Calibration Centre of TUT
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