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book article
At-speed functional built-in self-test methodology for processors [Electronic resource]
Ubar, Raimund-Johannes
;
Indus, Viljar
;
Kalmend, Oliver
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
2012
/
p. 168-172 : ill [CD-ROM]
book article
2
journal article
High-Level Implementation-Independent Functional Software-Based Self-Test for RISC Processors
Oyeniran, Adeboye Stephen
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Raik, Jaan
Journal of electronic testing : theory and applications
2020
/
p. 87-103
https://doi.org/10.1007/s10836-020-05856-7
journal article
Number of records 2, displaying
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keyword
85
1.
processor testing
2.
RISC processor testing
3.
processor core testing
4.
microprocessor testing
5.
ARM processor
6.
crypto processor
7.
digital signal processor (DSP)
8.
multicore processor
9.
multi-processor
10.
multi-processor system-on-chip
11.
multi-processor system-on-chips (MPSoCs)
12.
Muti-Processor System on Chip (MPSoC)
13.
processor designs
14.
processor-centric board
15.
processor-centric board test
16.
accelerated testing
17.
acoustomechanical testing
18.
anaerobic testing
19.
aspect-oriented testing
20.
at-speed testing
21.
benchmark testing
22.
Berridge testing
23.
cancer genomic testing
24.
compliance testing
25.
compositional testing
26.
computer aided testing
27.
conformance testing
28.
courses on electronic testing and design
29.
cybersecurity testing
30.
D. non-destructive testing
31.
design field testing
32.
destructive testing
33.
eddy current testing
34.
erosion testing
35.
fatigue testing
36.
fire testing
37.
hierarchical testing
38.
hypotheses testing
39.
integration testing
40.
laboratory scale testing
41.
load testing
42.
macro mechanical testing and green surface tribology
43.
material testing
44.
materials testing
45.
measurement and testing
46.
mechanical testing
47.
memory testing
48.
metamorphic testing
49.
model based testing
50.
model-based mutation testing
51.
model-based testing
52.
mutation testing
53.
network-testing
54.
non destructive testing
55.
nondestructive testing
56.
non-destructive testing
57.
on-site testing
58.
pin on disc wear testing
59.
PMU calibration testing
60.
PMU testing
61.
point-of-care testing
62.
real-time HiL testing
63.
regression testing
64.
robustness testing
65.
scenario testing
66.
scratch testing
67.
security testing
68.
small-scale fire testing
69.
software testing
70.
software-in-the-loop (SIL) testing
71.
stand-alone testing
72.
stress-testing
73.
substation testing methods
74.
system testing
75.
tensile testing
76.
testing
77.
testing methods
78.
testing of digital devices
79.
testing of generator
80.
testing of phasor measurement units
81.
two-dimensional array testing
82.
wafer testing
83.
wear testing
84.
vibration testing
85.
virtual testing
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